{"id":"https://openalex.org/W4388953079","doi":"https://doi.org/10.1109/access.2023.3336568","title":"Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis","display_name":"Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4388953079","doi":"https://doi.org/10.1109/access.2023.3336568"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3336568","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3336568","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10328602.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10328602.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100695871","display_name":"Junyong Park","orcid":"https://orcid.org/0000-0002-5446-1799"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Junyong Park","raw_affiliation_strings":["Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":"https://orcid.org/0000-0002-5446-1799","affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100696056","display_name":"Youngwoo Kim","orcid":"https://orcid.org/0000-0003-0096-2296"},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngwoo Kim","raw_affiliation_strings":["Sejong University, Seoul, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-0096-2296","affiliations":[{"raw_affiliation_string":"Sejong University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100454695","display_name":"DongHyun Kim","orcid":"https://orcid.org/0000-0003-2738-9549"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Donghyun Kim","raw_affiliation_strings":["Missouri University of Science and Technology, Rolla, MO, USA"],"raw_orcid":"https://orcid.org/0000-0003-2738-9549","affiliations":[{"raw_affiliation_string":"Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3484,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58835823,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":"11","issue":null,"first_page":"132699","last_page":"132707"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6224290728569031},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6133550405502319},{"id":"https://openalex.org/keywords/diagram","display_name":"Diagram","score":0.6071421504020691},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4250423014163971},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4063987731933594},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3236105442047119},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11690196394920349},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07297280430793762}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6224290728569031},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6133550405502319},{"id":"https://openalex.org/C186399060","wikidata":"https://www.wikidata.org/wiki/Q959962","display_name":"Diagram","level":2,"score":0.6071421504020691},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4250423014163971},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4063987731933594},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3236105442047119},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11690196394920349},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07297280430793762},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3336568","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3336568","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10328602.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:d8f9cca21daa4f3b8183d24903172733","is_oa":true,"landing_page_url":"https://doaj.org/article/d8f9cca21daa4f3b8183d24903172733","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 132699-132707 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3336568","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3336568","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10328602.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1265942123","display_name":"Phase III IUCRC at Missouri University of Science and Technology:  Center for Electromagnetic Compatibility","funder_award_id":"1916535","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G1510614258","display_name":null,"funder_award_id":"IIP-1916535","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4388953079.pdf","grobid_xml":"https://content.openalex.org/works/W4388953079.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1537187978","https://openalex.org/W1971966678","https://openalex.org/W1995220828","https://openalex.org/W2001870828","https://openalex.org/W2019264127","https://openalex.org/W2023264348","https://openalex.org/W2069756028","https://openalex.org/W2077018692","https://openalex.org/W2095892633","https://openalex.org/W2099571807","https://openalex.org/W2103244535","https://openalex.org/W2112774177","https://openalex.org/W2117766083","https://openalex.org/W2117945740","https://openalex.org/W2129153627","https://openalex.org/W2130868223","https://openalex.org/W2133040214","https://openalex.org/W2133137966","https://openalex.org/W2153186550","https://openalex.org/W2156408736","https://openalex.org/W2171347752","https://openalex.org/W2221779175","https://openalex.org/W2767048941","https://openalex.org/W2810095688","https://openalex.org/W2902598753","https://openalex.org/W2921101359","https://openalex.org/W3009425635","https://openalex.org/W3171032819","https://openalex.org/W4252365207","https://openalex.org/W4312852161"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2053286651","https://openalex.org/W2181743346","https://openalex.org/W2187401768","https://openalex.org/W2181413294","https://openalex.org/W2989452537","https://openalex.org/W2052122378","https://openalex.org/W2544423928","https://openalex.org/W2062023542"],"abstract_inverted_index":{"This":[0],"article":[1],"proposes":[2],"an":[3,29,104],"accelerated":[4],"statistical":[5,239],"eye":[6,17,30,50,61,70,240],"diagram":[7,18,31,51,62,71],"estimation":[8,63,149],"method":[9,95,132,150,223],"for":[10,200],"efficient":[11],"signal":[12],"integrity":[13],"(SI)":[14],"analysis.":[15],"An":[16],"is":[19,32,52,133,185],"a":[20,41,78,83,113,143,201,238],"critical":[21],"metric":[22],"in":[23,34,108,190],"the":[24,46,49,57,69,93,109,130,137,168,182,193,211,221,226,231],"SI":[25],"analysis,":[26],"however":[27,74],"obtaining":[28],"time-consuming":[33],"simulation.":[35,146,203],"The":[36,127,147],"required":[37,169,183,199,227,232],"time":[38,170,184,195,229],"might":[39],"be":[40],"few":[42],"weeks":[43],"depending":[44],"on":[45],"complexity.":[47],"Because":[48],"obtained":[53],"by":[54,135],"superposition":[55],"of":[56,86,129,142,196,213,234],"received":[58],"waveforms.":[59],"Statistical":[60],"methods":[64],"were":[65],"proposed":[66,94,131,222],"to":[67,82,171,187,192,218,236],"make":[68],"acquisition":[72],"efficient,":[73],"it":[75],"still":[76],"has":[77],"limited":[79],"improvement":[80],"due":[81],"large":[84],"number":[85,212,233],"convolution":[87,125,214],"operations.":[88,126],"To":[89],"address":[90],"this":[91],"limitation,":[92],"includes":[96],"two":[97],"approaches:":[98],"(":[99,117,156,162,205],"<italic":[100,118,157,163,206],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[101,119,158,164,207],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">i</i>":[102,159],")":[103,121,160,166,209],"increased":[105],"voltage":[106],"step":[107],"amplitude":[110],"PDF":[111],"with":[112,140],"compensation":[114],"factor":[115],"and":[116,123,161,173,230],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">ii</i>":[120,165,208],"skippable":[122],"replaceable":[124],"efficiency":[128],"verified":[134],"comparing":[136],"derived":[138],"result":[139],"that":[141],"conventional":[144],"transient":[145,202],"previous":[148],"requires":[151],"1,065":[152],"s":[153,189,198],"while":[154],"approaches":[155,179],"reduce":[167],"88":[172],"510":[174],"s,":[175],"respectively.":[176],"When":[177],"both":[178],"are":[180],"applied,":[181],"reduced":[186],"17":[188],"comparison":[191],"simulation":[194,228],"259,200":[197],"Approach":[204],"reduces":[210,225],"operations":[215],"from":[216],"768,000":[217],"103,000.":[219],"Therefore,":[220],"successfully":[224],"convolutions":[235],"obtain":[237],"diagram.":[241]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}