{"id":"https://openalex.org/W4388854531","doi":"https://doi.org/10.1109/access.2023.3335377","title":"Synchrophasor-Based DTR and SIPS Cyber-Physical Network Reliability Effects Considering Communication Network Topology and Total Network Ageing","display_name":"Synchrophasor-Based DTR and SIPS Cyber-Physical Network Reliability Effects Considering Communication Network Topology and Total Network Ageing","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4388854531","doi":"https://doi.org/10.1109/access.2023.3335377"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3335377","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3335377","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10325492.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10325492.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025406913","display_name":"Bilkisu Jimada-Ojuolape","orcid":"https://orcid.org/0000-0001-8592-8438"},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]},{"id":"https://openalex.org/I98243723","display_name":"Kwara State University","ror":"https://ror.org/05np2xn95","country_code":"NG","type":"education","lineage":["https://openalex.org/I98243723"]}],"countries":["MY","NG"],"is_corresponding":false,"raw_author_name":"Bilkisu Jimada-Ojuolape","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Penang, Malaysia","Department of Electrical and Computer Engineering, Kwara State University, Nigeria"],"raw_orcid":"https://orcid.org/0000-0001-8592-8438","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Penang, Malaysia","institution_ids":["https://openalex.org/I139322472"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Kwara State University, Nigeria","institution_ids":["https://openalex.org/I98243723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042023563","display_name":"Jiashen Teh","orcid":"https://orcid.org/0000-0001-9741-6245"},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Jiashen Teh","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Penang, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-9741-6245","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM), Nibong Tebal, Penang, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062957261","display_name":"Bader Alharbi","orcid":"https://orcid.org/0000-0002-6662-8103"},"institutions":[{"id":"https://openalex.org/I195631090","display_name":"Majmaah University","ror":"https://ror.org/01mcrnj60","country_code":"SA","type":"education","lineage":["https://openalex.org/I195631090"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Bader Alharbi","raw_affiliation_strings":["Department of Electrical Engineering, College of Engineering, Majmaah University, Al Majma'ah, Saudi Arabia"],"raw_orcid":"https://orcid.org/0000-0002-6662-8103","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, College of Engineering, Majmaah University, Al Majma'ah, Saudi Arabia","institution_ids":["https://openalex.org/I195631090"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.5814,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.89842196,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"132590","last_page":"132603"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.8043943643569946},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6200255155563354},{"id":"https://openalex.org/keywords/physical-layer","display_name":"Physical layer","score":0.6047404408454895},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4992825984954834},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.47304171323776245},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.4519321024417877},{"id":"https://openalex.org/keywords/cyber-physical-system","display_name":"Cyber-physical system","score":0.42996805906295776},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3925624191761017},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.387053906917572},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3767380118370056},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34947681427001953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2410261034965515},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17873698472976685},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.10801300406455994},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08670294284820557},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08526843786239624}],"concepts":[{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.8043943643569946},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6200255155563354},{"id":"https://openalex.org/C19247436","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"Physical layer","level":3,"score":0.6047404408454895},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4992825984954834},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.47304171323776245},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.4519321024417877},{"id":"https://openalex.org/C179768478","wikidata":"https://www.wikidata.org/wiki/Q1120057","display_name":"Cyber-physical system","level":2,"score":0.42996805906295776},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3925624191761017},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.387053906917572},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3767380118370056},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34947681427001953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2410261034965515},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17873698472976685},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.10801300406455994},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08670294284820557},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08526843786239624},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3335377","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3335377","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10325492.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:4a7cf92f517a4e99a5a07e0c93a94cd4","is_oa":true,"landing_page_url":"https://doaj.org/article/4a7cf92f517a4e99a5a07e0c93a94cd4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 132590-132603 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3335377","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3335377","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10325492.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4120479045","display_name":null,"funder_award_id":"R-2023-832","funder_id":"https://openalex.org/F4320324553","funder_display_name":"Majmaah University"}],"funders":[{"id":"https://openalex.org/F4320324553","display_name":"Majmaah University","ror":"https://ror.org/01mcrnj60"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4388854531.pdf","grobid_xml":"https://content.openalex.org/works/W4388854531.grobid-xml"},"referenced_works_count":43,"referenced_works":["https://openalex.org/W1486460655","https://openalex.org/W1828314293","https://openalex.org/W2008283137","https://openalex.org/W2020786402","https://openalex.org/W2030614060","https://openalex.org/W2032535610","https://openalex.org/W2033225140","https://openalex.org/W2063725349","https://openalex.org/W2088889553","https://openalex.org/W2124588089","https://openalex.org/W2144734347","https://openalex.org/W2150441580","https://openalex.org/W2554152365","https://openalex.org/W2739462569","https://openalex.org/W2739956853","https://openalex.org/W2763834107","https://openalex.org/W2795678459","https://openalex.org/W2884663192","https://openalex.org/W2922198256","https://openalex.org/W2927922269","https://openalex.org/W2955002187","https://openalex.org/W2990654095","https://openalex.org/W3003724466","https://openalex.org/W3021487061","https://openalex.org/W3026928397","https://openalex.org/W3039302968","https://openalex.org/W3041849698","https://openalex.org/W3088797026","https://openalex.org/W3089061528","https://openalex.org/W3097008880","https://openalex.org/W3125669433","https://openalex.org/W3131672847","https://openalex.org/W3172488583","https://openalex.org/W3208100143","https://openalex.org/W3209463749","https://openalex.org/W3213246151","https://openalex.org/W4206033477","https://openalex.org/W4210954402","https://openalex.org/W4214494993","https://openalex.org/W4241989157","https://openalex.org/W4283070358","https://openalex.org/W4312553021","https://openalex.org/W4318483955"],"related_works":["https://openalex.org/W3004173571","https://openalex.org/W2546638913","https://openalex.org/W2209816623","https://openalex.org/W2086397253","https://openalex.org/W2968885840","https://openalex.org/W3135700974","https://openalex.org/W4313307484","https://openalex.org/W2791379413","https://openalex.org/W2086962923","https://openalex.org/W1983617143"],"abstract_inverted_index":{"The":[0,33,150,166],"lifespan":[1],"of":[2,76,121,243],"overhead":[3],"transmission":[4,30,204],"conductors":[5],"is":[6],"influenced":[7],"by":[8,222],"various":[9],"factors,":[10],"including":[11],"design,":[12],"maintenance,":[13],"and":[14,59,82,106,141,174,184],"operating":[15],"conditions.":[16,51],"Prolonged":[17],"exposure":[18],"to":[19,48,113,145,182,224],"high":[20],"temperatures,":[21],"particularly":[22],"near":[23],"maximum":[24],"design":[25],"values,":[26],"can":[27,46,213,218,229,238],"significantly":[28],"age":[29],"lines":[31],"(TLs).":[32],"dynamic":[34],"thermal":[35],"rating":[36],"(DTR)":[37],"system,":[38],"an":[39,240],"advanced":[40],"technology":[41],"that":[42,99,169],"increases":[43],"TL":[44,77,110],"capacities,":[45],"contribute":[47],"these":[49],"stringent":[50],"DTR":[52,114,135,147],"overlays":[53],"a":[54,69,88,96,153,161,197,235],"cyber":[55,84,102],"layer":[56],"with":[57,80],"communication":[58],"control":[60],"systems":[61],"onto":[62],"the":[63,73,83,101,119,128,193,231],"physical":[64],"network,":[65],"transforming":[66],"it":[67],"into":[68],"cyber-physical":[70,163],"network.":[71],"Currently,":[72],"increased":[74],"risk":[75],"ageing":[78,111,179,221],"associated":[79],"DTR,":[81],"layer\u2019s":[85,103],"functionality":[86],"lack":[87],"unified":[89],"framework":[90,98],"for":[91],"quantification.":[92],"This":[93],"study":[94,151,167],"introduces":[95],"novel":[97],"considers":[100],"network":[104,194,220],"topology":[105],"its":[107],"impact":[108,202],"on":[109,160,203],"due":[112],"implementation.":[115],"It":[116],"also":[117],"proposes":[118],"implementation":[120],"system":[122],"integrity":[123],"protection":[124],"schemes":[125],"(SIPS)":[126],"within":[127,196],"framework.":[129],"SIPS":[130,217,237],"detects":[131],"abnormal":[132],"conditions":[133],"from":[134],"deployment,":[136],"like":[137,171],"excessive":[138],"line":[139,178,183,205],"loading,":[140],"takes":[142],"corrective":[143],"actions":[144],"optimize":[146],"system\u2019s":[148],"performance.":[149],"employs":[152],"Sequential":[154],"Monte":[155],"Carlo":[156],"Simulation":[157],"(SMCS)":[158],"technique":[159],"modified":[162],"IEEE":[164],"RTS-79.":[165],"reveals":[168],"topologies":[170,195],"double":[172],"ring":[173],"mesh,":[175],"cause":[176,230],"higher":[177],"indices":[180],"compared":[181],"star":[185],"topologies.":[186],"ETNA":[187,241],"values":[188],"remain":[189],"relatively":[190],"stable":[191],"across":[192],"year,":[198],"suggesting":[199],"minimal":[200],"short-term":[201],"ageing.":[206],"However,":[207],"cumulative":[208],"effects":[209],"over":[210],"several":[211],"years":[212],"potentially":[214],"reduce":[215],"lifespan.":[216],"slow":[219],"up":[223],"5hr/yr,":[225],"but":[226],"their":[227],"contingencies":[228],"opposite":[232],"effect.":[233],"Nonetheless,":[234],"reliable":[236],"maintain":[239],"value":[242],"101hr/yr":[244],"without":[245],"increasing":[246],"load":[247],"curtailment.":[248]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}