{"id":"https://openalex.org/W4388019104","doi":"https://doi.org/10.1109/access.2023.3328534","title":"Low-Artifact and Fast Backlit Image Enhancement Method Based on Suppression of Lightness Order Error","display_name":"Low-Artifact and Fast Backlit Image Enhancement Method Based on Suppression of Lightness Order Error","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4388019104","doi":"https://doi.org/10.1109/access.2023.3328534"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3328534","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3328534","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2023.3328534","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047142257","display_name":"Masato Akai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106587","display_name":"Nikon (Japan)","ror":"https://ror.org/01bvqg661","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210106587"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masato Akai","raw_affiliation_strings":["Imaging Solution Development Department, Nikon Corporation, Minato-ku, Tokyo, Japan","Imaging Solution Development Department, Nikon Corporation, Shinagawa Intercity Tower C, 2-15-3, Konan Minato-ku, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imaging Solution Development Department, Nikon Corporation, Minato-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I4210106587"]},{"raw_affiliation_string":"Imaging Solution Development Department, Nikon Corporation, Shinagawa Intercity Tower C, 2-15-3, Konan Minato-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I4210106587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101552731","display_name":"Yoshiaki Ueda","orcid":"https://orcid.org/0000-0003-4851-2964"},"institutions":[{"id":"https://openalex.org/I103390050","display_name":"Ryukoku University","ror":"https://ror.org/012tqgb57","country_code":"JP","type":"education","lineage":["https://openalex.org/I103390050"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiaki Ueda","raw_affiliation_strings":["Faculty of Advanced Science and Technology, Ryukoku University, Otsu-shi, Shiga, Japan","Faculty of Advanced Science and Technology, Ryukoku University, 1-5 Yokotani, Seta Oe-cho, Otsu-shi, Shiga, Japan"],"raw_orcid":"https://orcid.org/0000-0003-4851-2964","affiliations":[{"raw_affiliation_string":"Faculty of Advanced Science and Technology, Ryukoku University, Otsu-shi, Shiga, Japan","institution_ids":["https://openalex.org/I103390050"]},{"raw_affiliation_string":"Faculty of Advanced Science and Technology, Ryukoku University, 1-5 Yokotani, Seta Oe-cho, Otsu-shi, Shiga, Japan","institution_ids":["https://openalex.org/I103390050"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109790694","display_name":"Takanori Koga","orcid":null},"institutions":[{"id":"https://openalex.org/I186442907","display_name":"Universidad de Oriente","ror":"https://ror.org/03xygw105","country_code":"VE","type":"education","lineage":["https://openalex.org/I186442907"]},{"id":"https://openalex.org/I916559398","display_name":"Kindai University","ror":"https://ror.org/05kt9ap64","country_code":"JP","type":"education","lineage":["https://openalex.org/I916559398"]}],"countries":["JP","VE"],"is_corresponding":false,"raw_author_name":"Takanori Koga","raw_affiliation_strings":["Faculty of Humanity-Oriented Science and Engineering, Kindai University, Iizuka-shi, Fukuoka, Japan","Faculty of Humanity-Oriented Science and Engineering, Kindai University, 11-6 Kayanomori, Iizuka-shi, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Humanity-Oriented Science and Engineering, Kindai University, Iizuka-shi, Fukuoka, Japan","institution_ids":["https://openalex.org/I186442907"]},{"raw_affiliation_string":"Faculty of Humanity-Oriented Science and Engineering, Kindai University, 11-6 Kayanomori, Iizuka-shi, Fukuoka, Japan","institution_ids":["https://openalex.org/I916559398"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089155400","display_name":"Noriaki Suetake","orcid":"https://orcid.org/0000-0003-3673-9539"},"institutions":[{"id":"https://openalex.org/I173915773","display_name":"Yamaguchi University","ror":"https://ror.org/03cxys317","country_code":"JP","type":"education","lineage":["https://openalex.org/I173915773"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriaki Suetake","raw_affiliation_strings":["Graduate School of Science and Technology for Innovation, Yamaguchi University, Yamaguchi-shi, Yamaguchi, Japan","Graduate School of Science and Technology for Innovation, Yamaguchi University, 1677-1 Yoshida, Yamaguchi-shi, Yamaguchi, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3673-9539","affiliations":[{"raw_affiliation_string":"Graduate School of Science and Technology for Innovation, Yamaguchi University, Yamaguchi-shi, Yamaguchi, Japan","institution_ids":["https://openalex.org/I173915773"]},{"raw_affiliation_string":"Graduate School of Science and Technology for Innovation, Yamaguchi University, 1677-1 Yoshida, Yamaguchi-shi, Yamaguchi, Japan","institution_ids":["https://openalex.org/I173915773"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":0.8563,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.71857055,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"121231","last_page":"121245"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visibility","display_name":"Visibility","score":0.8023536801338196},{"id":"https://openalex.org/keywords/backlight","display_name":"Backlight","score":0.7959048748016357},{"id":"https://openalex.org/keywords/lightness","display_name":"Lightness","score":0.7948383688926697},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7669622898101807},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7651934623718262},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6674487590789795},{"id":"https://openalex.org/keywords/artifact","display_name":"Artifact (error)","score":0.5861592292785645},{"id":"https://openalex.org/keywords/luminance","display_name":"Luminance","score":0.5753251910209656},{"id":"https://openalex.org/keywords/image-restoration","display_name":"Image restoration","score":0.5122255682945251},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4624142646789551},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.43456465005874634},{"id":"https://openalex.org/keywords/brightness","display_name":"Brightness","score":0.43003469705581665},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.42396849393844604},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.41800886392593384},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23162269592285156},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.10803642868995667},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07860106229782104}],"concepts":[{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.8023536801338196},{"id":"https://openalex.org/C171107226","wikidata":"https://www.wikidata.org/wiki/Q574291","display_name":"Backlight","level":3,"score":0.7959048748016357},{"id":"https://openalex.org/C193601281","wikidata":"https://www.wikidata.org/wiki/Q19426","display_name":"Lightness","level":2,"score":0.7948383688926697},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7669622898101807},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7651934623718262},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6674487590789795},{"id":"https://openalex.org/C2779010991","wikidata":"https://www.wikidata.org/wiki/Q2720909","display_name":"Artifact (error)","level":2,"score":0.5861592292785645},{"id":"https://openalex.org/C73313986","wikidata":"https://www.wikidata.org/wiki/Q355386","display_name":"Luminance","level":2,"score":0.5753251910209656},{"id":"https://openalex.org/C106430172","wikidata":"https://www.wikidata.org/wiki/Q6002272","display_name":"Image restoration","level":4,"score":0.5122255682945251},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4624142646789551},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.43456465005874634},{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.43003469705581665},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.42396849393844604},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.41800886392593384},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23162269592285156},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.10803642868995667},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07860106229782104},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3328534","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3328534","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:18022238e18c412780255159bb1182e1","is_oa":true,"landing_page_url":"https://doaj.org/article/18022238e18c412780255159bb1182e1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 121231-121245 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3328534","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3328534","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1981156008","https://openalex.org/W2001412060","https://openalex.org/W2054814429","https://openalex.org/W2102584639","https://openalex.org/W2103504761","https://openalex.org/W2113350594","https://openalex.org/W2121900453","https://openalex.org/W2125188192","https://openalex.org/W2133059825","https://openalex.org/W2150721269","https://openalex.org/W2185234220","https://openalex.org/W2254039850","https://openalex.org/W2412926690","https://openalex.org/W2487750332","https://openalex.org/W2564997479","https://openalex.org/W2566376500","https://openalex.org/W2581223187","https://openalex.org/W2594112328","https://openalex.org/W2766802800","https://openalex.org/W2767269772","https://openalex.org/W2791710889","https://openalex.org/W2909945132","https://openalex.org/W2935842779","https://openalex.org/W2949187370","https://openalex.org/W2964111897","https://openalex.org/W2981319079","https://openalex.org/W2981847167","https://openalex.org/W3015485056","https://openalex.org/W3035731588","https://openalex.org/W3097096317","https://openalex.org/W3097595678","https://openalex.org/W3117326213","https://openalex.org/W3162331038","https://openalex.org/W3207478457","https://openalex.org/W3214264009","https://openalex.org/W4205498520","https://openalex.org/W4220759273","https://openalex.org/W4281718770","https://openalex.org/W4283837736","https://openalex.org/W4312156328","https://openalex.org/W4312560884","https://openalex.org/W4312757619","https://openalex.org/W4317987763","https://openalex.org/W6722983033","https://openalex.org/W6754146604"],"related_works":["https://openalex.org/W2055578002","https://openalex.org/W2412259248","https://openalex.org/W1783584302","https://openalex.org/W2129563144","https://openalex.org/W2027911464","https://openalex.org/W2020582692","https://openalex.org/W1976471863","https://openalex.org/W2063347406","https://openalex.org/W4238414286","https://openalex.org/W4230303793"],"abstract_inverted_index":{"Many":[0],"image":[1,30,37,79,131,151,162],"enhancement":[2,31,80],"methods":[3,16],"have":[4],"been":[5],"proposed":[6,94,176],"to":[7,28,41,82,100,124,163],"improve":[8,19,84],"the":[9,20,23,56,62,85,91,105,111,126,129,140,148,153,156,160,164,172,175],"visibility":[10,21,86],"of":[11,22,87,104,110,128,155,159,174,180],"backlit":[12,78,112],"images.":[13,66],"Although":[14],"these":[15],"can":[17],"effectively":[18,83],"subject":[24],"and":[25,64,76,107,185],"background":[26],"compared":[27],"standard":[29],"methods,":[32],"they":[33],"may":[34],"result":[35],"in":[36,55,178],"quality":[38],"degradation":[39],"owing":[40],"non-negligible":[42],"artifacts.":[43],"In":[44],"many":[45],"cases,":[46],"such":[47],"artifacts":[48],"are":[49,116],"caused":[50],"by":[51,89,146,152],"a":[52,74,121,133],"significant":[53],"change":[54],"Lightness":[57],"Order":[58],"Error":[59],"(LOE)":[60],"between":[61],"original":[63],"processed":[65],"To":[67],"address":[68],"this":[69,71],"problem,":[70],"paper":[72],"proposes":[73],"low-artifact":[75],"fast":[77],"method":[81,95,177],"images":[88,103,115],"suppressing":[90],"LOE.":[92,135],"The":[93,136,168],"uses":[96],"adaptive":[97],"luminance":[98],"correction":[99],"generate":[101],"lightness-enhanced":[102],"dark":[106],"bright":[108],"areas":[109],"image.":[113],"These":[114],"then":[117],"fused":[118],"based":[119,189],"on":[120,190],"weight":[122],"map":[123],"calculate":[125],"lightness":[127,157,166],"output":[130],"with":[132],"lower":[134],"final":[137],"output,":[138],"i.e.,":[139],"enhanced":[141,165],"color":[142,150],"image,":[143],"is":[144],"obtained":[145],"multiplying":[147],"input":[149,161],"ratio":[154],"component":[158],"component.":[167],"experimental":[169],"results":[170],"demonstrate":[171],"superiority":[173],"terms":[179],"low":[181],"artifacts,":[182],"natural":[183],"enhancement,":[184],"high":[186],"processing":[187],"speed":[188],"straightforward":[191],"processing.":[192]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}