{"id":"https://openalex.org/W4388262226","doi":"https://doi.org/10.1109/access.2023.3327465","title":"DC Series Arc Failure Diagnosis Using Artificial Machine Learning With Switching Frequency Component Elimination Technique","display_name":"DC Series Arc Failure Diagnosis Using Artificial Machine Learning With Switching Frequency Component Elimination Technique","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4388262226","doi":"https://doi.org/10.1109/access.2023.3327465"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3327465","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3327465","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10295440.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10295440.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006237142","display_name":"Hoang-Long Dang","orcid":"https://orcid.org/0000-0002-1957-7307"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoang-Long Dang","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1957-7307","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, South Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028771646","display_name":"Sangshin Kwak","orcid":"https://orcid.org/0000-0002-2890-906X"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangshin Kwak","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2890-906X","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, South Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054845392","display_name":"Seungdeog Choi","orcid":"https://orcid.org/0000-0002-7549-6093"},"institutions":[{"id":"https://openalex.org/I99041443","display_name":"Mississippi State University","ror":"https://ror.org/0432jq872","country_code":"US","type":"education","lineage":["https://openalex.org/I4210141039","https://openalex.org/I99041443"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seungdeog Choi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Mississipi State University, Starkville, MS, USA"],"raw_orcid":"https://orcid.org/0000-0002-7549-6093","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Mississipi State University, Starkville, MS, USA","institution_ids":["https://openalex.org/I99041443"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7363,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.71148111,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"119584","last_page":"119595"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.9807000160217285,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6904538869857788},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5675609707832336},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5524418354034424},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.329002320766449}],"concepts":[{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6904538869857788},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5675609707832336},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5524418354034424},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.329002320766449},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3327465","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3327465","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10295440.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:e642b659cab94f02bc6358a3492c30c2","is_oa":true,"landing_page_url":"https://doaj.org/article/e642b659cab94f02bc6358a3492c30c2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 119584-119595 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3327465","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3327465","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10295440.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6413462474","display_name":null,"funder_award_id":"R21XO01-3","funder_id":"https://openalex.org/F4320326258","funder_display_name":"Korea Electric Power Corporation"},{"id":"https://openalex.org/G7912793175","display_name":null,"funder_award_id":"2020R1A2C1013413","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G8302083958","display_name":null,"funder_award_id":"2020R1A2C1013413","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320326258","display_name":"Korea Electric Power Corporation","ror":"https://ror.org/04fperw70"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4388262226.pdf","grobid_xml":"https://content.openalex.org/works/W4388262226.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W1594031697","https://openalex.org/W1625504505","https://openalex.org/W2122111042","https://openalex.org/W2296747478","https://openalex.org/W2343133957","https://openalex.org/W2471618076","https://openalex.org/W2579461652","https://openalex.org/W2607235040","https://openalex.org/W2616665904","https://openalex.org/W2805756546","https://openalex.org/W2911964244","https://openalex.org/W2926172260","https://openalex.org/W2957590092","https://openalex.org/W2988054498","https://openalex.org/W2998636431","https://openalex.org/W3090996479","https://openalex.org/W4205584319","https://openalex.org/W4225649950","https://openalex.org/W4285049345","https://openalex.org/W4286372664","https://openalex.org/W4302363008","https://openalex.org/W6636859864"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"The":[0,111,183],"intricate":[1],"spectrum":[2],"of":[3,67,75,84,106,113,134,141,146,178,189,197],"arc":[4,20,25,62,109,115,153],"faults":[5,26,116,154],"elicited":[6],"by":[7],"diverse":[8,82],"load":[9],"types":[10],"introduces":[11],"a":[12,28,68,159,165],"complex":[13],"and":[14,38,72,87,136],"formidable":[15],"challenge":[16],"in":[17,100],"residential":[18],"series":[19,107,152],"fault":[21],"detection.":[22],"Series":[23],"DC":[24,108,156],"pose":[27],"significant":[29],"concern":[30],"as":[31],"they":[32],"can":[33],"potentially":[34],"instigate":[35],"fire":[36],"incidents":[37],"exert":[39],"adverse":[40],"ramifications":[41,112],"on":[42],"power":[43,53,85,128],"systems":[44,54,157],"if":[45],"left":[46],"undetected.":[47],"Nonetheless,":[48],"their":[49],"detection":[50,149],"within":[51,127,155],"practical":[52],"remains":[55],"challenging,":[56],"predominantly":[57],"attributed":[58],"to":[59,168],"the":[60,65,73,81,90,104,120,132,144,170,176,187,190],"meager":[61],"current":[63],"magnitude,":[64],"absence":[66],"discernible":[69],"zero-crossing":[70],"interval,":[71],"manifestation":[74],"multifarious":[76],"aberrant":[77],"behaviors":[78],"contingent":[79],"upon":[80],"array":[83],"loads":[86],"controllers.":[88],"Importantly,":[89],"conventional":[91],"safeguards,":[92],"notably":[93],"encompassing":[94],"protection":[95],"fuses,":[96],"may":[97],"exhibit":[98],"inefficacy":[99],"promptly":[101],"activating":[102],"during":[103],"occurrence":[105],"faults.":[110],"undiscerned":[114],"are":[117],"profound,":[118],"with":[119],"potential":[121],"for":[122,194],"engendering":[123],"erroneous":[124],"operational":[125],"modes":[126],"systems,":[129],"thereby":[130],"amplifying":[131],"risk":[133],"material":[135],"human":[137],"casualties.":[138],"In":[139],"light":[140],"these":[142],"exigencies,":[143],"development":[145],"an":[147],"efficacious":[148],"mechanism":[150],"targeting":[151],"becomes":[158],"paramount":[160],"imperative.":[161],"This":[162],"research":[163],"proposed":[164,191],"preprocessing":[166],"signal":[167],"eliminate":[169],"switching":[171,198],"noises,":[172],"which":[173],"could":[174],"degrade":[175],"performance":[177],"artificial":[179],"machine":[180],"learning":[181],"algorithms.":[182],"diagnosis":[184,192],"results":[185],"valid":[186],"effectiveness":[188],"scheme":[193],"all":[195],"ranges":[196],"frequencies.":[199]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}