{"id":"https://openalex.org/W4386824957","doi":"https://doi.org/10.1109/access.2023.3316511","title":"A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips","display_name":"A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386824957","doi":"https://doi.org/10.1109/access.2023.3316511"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3316511","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3316511","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10254201.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10254201.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060364710","display_name":"Francesco Angione","orcid":"https://orcid.org/0000-0003-2978-1130"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Francesco Angione","raw_affiliation_strings":["Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024226992","display_name":"D. Appello","orcid":"https://orcid.org/0000-0001-8178-2785"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Davide Appello","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy","STMicroelectronics, Via Camillo Olivetti 2, 20864 Agrate Brianza (MB), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Via Camillo Olivetti 2, 20864 Agrate Brianza (MB), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Bernardi","raw_affiliation_strings":["Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032411827","display_name":"Andrea Calabrese","orcid":"https://orcid.org/0000-0002-8854-8171"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Calabrese","raw_affiliation_strings":["Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023997315","display_name":"Stefano Quer","orcid":"https://orcid.org/0000-0001-6835-8277"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Quer","raw_affiliation_strings":["Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Sonza Reorda","raw_affiliation_strings":["Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering (DAUIN), Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043908290","display_name":"Vincenzo Tancorre","orcid":"https://orcid.org/0000-0001-7959-0784"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Vincenzo Tancorre","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy","STMicroelectronics, Via Camillo Olivetti 2, 20864 Agrate Brianza (MB), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Via Camillo Olivetti 2, 20864 Agrate Brianza (MB), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091628822","display_name":"R. Ugioli","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Ugioli","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, Italy","STMicroelectronics, Via Camillo Olivetti 2, 20864 Agrate Brianza (MB), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Via Camillo Olivetti 2, 20864 Agrate Brianza (MB), Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5060364710"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.019,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.91816519,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"105655","last_page":"105676"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/toolchain","display_name":"Toolchain","score":0.9932126402854919},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7611196041107178},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.536180317401886},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.5339112877845764},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4758695960044861},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.45768940448760986},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.4402727782726288},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.4159356951713562},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10189196467399597}],"concepts":[{"id":"https://openalex.org/C2777062904","wikidata":"https://www.wikidata.org/wiki/Q545406","display_name":"Toolchain","level":3,"score":0.9932126402854919},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7611196041107178},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.536180317401886},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.5339112877845764},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4758695960044861},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.45768940448760986},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.4402727782726288},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.4159356951713562},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10189196467399597},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3316511","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3316511","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10254201.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9244e0d26ba34deb87305d31412fe007","is_oa":true,"landing_page_url":"https://doaj.org/article/9244e0d26ba34deb87305d31412fe007","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 105655-105676 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3316511","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3316511","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10254201.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.49000000953674316,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386824957.pdf","grobid_xml":"https://content.openalex.org/works/W4386824957.grobid-xml"},"referenced_works_count":34,"referenced_works":["https://openalex.org/W1496925300","https://openalex.org/W1923882808","https://openalex.org/W1974836518","https://openalex.org/W2003202688","https://openalex.org/W2019483755","https://openalex.org/W2068771685","https://openalex.org/W2075943092","https://openalex.org/W2106290576","https://openalex.org/W2108852347","https://openalex.org/W2119800152","https://openalex.org/W2121331887","https://openalex.org/W2127913861","https://openalex.org/W2129346788","https://openalex.org/W2137656581","https://openalex.org/W2163620213","https://openalex.org/W2542038790","https://openalex.org/W2613613142","https://openalex.org/W2751307479","https://openalex.org/W2790410977","https://openalex.org/W2806909220","https://openalex.org/W2947039574","https://openalex.org/W2982437619","https://openalex.org/W3026412660","https://openalex.org/W3114094139","https://openalex.org/W3124406777","https://openalex.org/W3160934116","https://openalex.org/W3183351902","https://openalex.org/W3188239650","https://openalex.org/W4232310948","https://openalex.org/W4232332415","https://openalex.org/W4283775106","https://openalex.org/W4283781063","https://openalex.org/W4285308465","https://openalex.org/W4293198489"],"related_works":["https://openalex.org/W2013037783","https://openalex.org/W2909413202","https://openalex.org/W1999008563","https://openalex.org/W4385243142","https://openalex.org/W2561644314","https://openalex.org/W2794118724","https://openalex.org/W2912135124","https://openalex.org/W4206450104","https://openalex.org/W3214257365","https://openalex.org/W2117241246"],"abstract_inverted_index":{"Complexity":[0],"and":[1,22,79,114,145,171,187,216,252,260],"performance":[2],"of":[3,36,57,74,86,93,234],"Automotive":[4],"System-on-Chips":[5],"have":[6],"exponentially":[7],"grown":[8],"in":[9,45,83,232],"the":[10,55,61,64,72,84,126,175,197,203,210,220,250],"last":[11],"decade,":[12],"also":[13],"according":[14],"to":[15,50,59,71,104,124,136,157,193,208,229,249],"technology":[16],"advancements.":[17],"Unfortunately,":[18],"this":[19,153],"trend":[20],"directly":[21],"profoundly":[23],"impacts":[24],"modern":[25],"Electronic":[26,96],"Design":[27,97],"Automation":[28,98],"tools,":[29],"which":[30,255],"must":[31],"handle":[32],"very":[33],"large":[34],"amounts":[35],"logic":[37],"gates.":[38],"The":[39],"consequence":[40],"is":[41,67],"an":[42],"exponential":[43],"increase":[44],"computation":[46,180],"times,":[47],"potentially":[48],"leading":[49],"significant":[51],"production":[52],"delays.":[53],"In":[54,201],"context":[56],"Burn-In,":[58],"reduce":[60],"computing":[62],"time,":[63],"stress":[65,107,117,139,185,199,212],"specification":[66],"often":[68],"relaxed":[69],"due":[70],"difficulty":[73],"grading":[75],"extensive":[76],"pattern":[77],"sets,":[78],"it":[80,188,218],"may":[81],"result":[82],"insurgence":[85],"unstressed":[87],"circuit":[88],"zones.":[89],"As":[90],"a":[91,122,132,224],"matter":[92],"fact,":[94],"current":[95],"software":[99,134],"tools":[100],"provide":[101],"limited":[102],"capabilities":[103],"effectively":[105],"quantify":[106],"effectiveness,":[108],"investigate":[109],"per-pattern":[110],"set":[111],"coverage":[112,144,164],"loss,":[113],"compute":[115],"layout-aware":[116,162],"metrics.":[118,165],"This":[119],"article":[120,154],"proposes":[121],"toolchain":[123,177,204,241],"overcome":[125],"limitations":[127],"mentioned":[128],"above.":[129],"We":[130,238],"propose":[131],"complete":[133],"flow":[135],"evaluate":[137],"Burn-In":[138,236],"patterns":[140,215],"through":[141,223],"standard":[142,151],"toggle":[143,163],"activity":[146],"effectively.":[147],"Together":[148],"with":[149,161],"these":[150],"metrics,":[152,186],"illustrates":[155],"how":[156],"complement":[158],"traditional":[159,184],"measurement":[160],"By":[166],"exploiting":[167],"parallel":[168],"programming":[169],"paradigms":[170],"machine":[172],"learning":[173],"algorithms,":[174],"proposed":[176],"drastically":[178],"reduces":[179],"time":[181],"for":[182],"evaluating":[183],"offers":[189,205],"new":[190],"analysis":[191],"metrics":[192],"test":[194,230],"engineers":[195,231],"conceiving":[196],"Burn-in":[198],"patterns.":[200],"addition,":[202],"some":[206],"commodities":[207],"superimpose":[209],"generated":[211],"from":[213,246],"different":[214],"visualize":[217],"over":[219],"SoC":[221],"layout":[222],"heatmap,":[225],"providing":[226],"great":[227],"benefits":[228],"charge":[233],"composing":[235],"recipes.":[237],"validated":[239],"our":[240],"on":[242],"two":[243],"industrial":[244],"devices":[245],"STMicroelectronics":[247],"belonging":[248],"SPC58":[251],"SPC56":[253],"families,":[254],"include":[256],"around":[257],"20":[258],"million":[259,262],"2.7":[261],"gates,":[263],"respectively.":[264]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":3}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}