{"id":"https://openalex.org/W4386559594","doi":"https://doi.org/10.1109/access.2023.3313504","title":"Time-Variant Reliability Optimization for Stress Balance in Press-Pack Insulated Gate Bipolar Transistors","display_name":"Time-Variant Reliability Optimization for Stress Balance in Press-Pack Insulated Gate Bipolar Transistors","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386559594","doi":"https://doi.org/10.1109/access.2023.3313504"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3313504","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3313504","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10244169.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10244169.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017726038","display_name":"Hangyang Li","orcid":"https://orcid.org/0000-0001-5532-4297"},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hangyang Li","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":"https://orcid.org/0000-0001-5532-4297","affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049047503","display_name":"Tongguang Yang","orcid":"https://orcid.org/0000-0003-3880-8980"},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tongguang Yang","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":"https://orcid.org/0000-0003-3880-8980","affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041878332","display_name":"Xinglin Liu","orcid":"https://orcid.org/0000-0001-7939-8944"},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinglin Liu","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100584992","display_name":"Jingyi Zhong","orcid":null},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyi Zhong","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112997260","display_name":"Jiaxin Mo","orcid":null},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaxin Mo","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104166793","display_name":"Han Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Han Zhou","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108841870","display_name":"Zhongkun Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I39521962","display_name":"Hunan City University","ror":"https://ror.org/01vd7vb53","country_code":"CN","type":"education","lineage":["https://openalex.org/I39521962"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongkun Xiao","raw_affiliation_strings":["Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Provincial Key Laboratory of Energy Monitoring and Edge Computing for Smart City, Hunan City University, Yiyang, China","institution_ids":["https://openalex.org/I39521962"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I39521962"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2323,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.51370349,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"11","issue":null,"first_page":"98059","last_page":"98069"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6788933277130127},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.6396178007125854},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6147012114524841},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4444423317909241},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4192134737968445},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.35723504424095154},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34272125363349915},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.32524025440216064},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2705479860305786},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19276142120361328},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12650004029273987}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6788933277130127},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.6396178007125854},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6147012114524841},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4444423317909241},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4192134737968445},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.35723504424095154},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34272125363349915},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32524025440216064},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2705479860305786},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19276142120361328},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12650004029273987},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3313504","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3313504","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10244169.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:04777bb3169340d5a2b922d0d93cab7d","is_oa":true,"landing_page_url":"https://doaj.org/article/04777bb3169340d5a2b922d0d93cab7d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 98059-98069 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3313504","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3313504","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10244169.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G7319570514","display_name":null,"funder_award_id":"2023JJ50343","funder_id":"https://openalex.org/F4320322843","funder_display_name":"Natural Science Foundation of\u00a0Hunan Province"}],"funders":[{"id":"https://openalex.org/F4320322843","display_name":"Natural Science Foundation of\u00a0Hunan Province","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386559594.pdf","grobid_xml":"https://content.openalex.org/works/W4386559594.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W1506153585","https://openalex.org/W1964400041","https://openalex.org/W2015928941","https://openalex.org/W2023034439","https://openalex.org/W2049046773","https://openalex.org/W2055145877","https://openalex.org/W2055896144","https://openalex.org/W2060589885","https://openalex.org/W2061750459","https://openalex.org/W2067251611","https://openalex.org/W2085691969","https://openalex.org/W2139867200","https://openalex.org/W2202500241","https://openalex.org/W2222868738","https://openalex.org/W2603330283","https://openalex.org/W2613925154","https://openalex.org/W2617150676","https://openalex.org/W2742590201","https://openalex.org/W2753549586","https://openalex.org/W2790559435","https://openalex.org/W2795870476","https://openalex.org/W2801888775","https://openalex.org/W2807249632","https://openalex.org/W2906131229","https://openalex.org/W2914116022","https://openalex.org/W2925351056","https://openalex.org/W2949687910","https://openalex.org/W2972404681","https://openalex.org/W3040243420","https://openalex.org/W3046667168","https://openalex.org/W3082569056","https://openalex.org/W3121009264","https://openalex.org/W3160335000","https://openalex.org/W3187996717","https://openalex.org/W3197381489","https://openalex.org/W4206151211","https://openalex.org/W4225080926","https://openalex.org/W4297200885","https://openalex.org/W4322201893"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1840261322","https://openalex.org/W2508166434","https://openalex.org/W2599154556","https://openalex.org/W1989252915","https://openalex.org/W2542337556","https://openalex.org/W1926336129","https://openalex.org/W2318942137","https://openalex.org/W4324123959","https://openalex.org/W2168852484"],"abstract_inverted_index":{"Stress":[0],"imbalance":[1],"significantly":[2],"affects":[3],"the":[4,20,24,35,58,62,70,78,91,97,107,126,131,136,139,155,158,169,173,181,185,190,194,197,200,204,210,217,228],"performance":[5,67,127,161,170,176,221],"of":[6,61,69,114,157,199,216,231],"a":[7,46,111],"press-pack":[8,52],"insulated":[9],"gate":[10],"bipolar":[11],"transistor":[12],"(IGBT).":[13],"Time-variant":[14],"loads":[15],"and":[16,40,72,81,118,147,179,209,225],"conditions":[17],"lead":[18],"to":[19,34,56,105,134],"stress":[21,92,159,174],"fluctuations,":[22],"exacerbating":[23],"impacts.":[25],"The":[26,66,122,163,220],"conventional":[27,191],"reliability":[28,38,48,64,85,94,116,120,123,165,182],"optimization":[29,49,79,86,109,117,166],"faces":[30],"efficiency":[31,59,211,226],"barriers":[32],"due":[33],"nested":[36,108],"time-variant":[37,47,84,119,164],"analysis":[39,124],"design":[41],"optimization.":[42,65],"In":[43],"this":[44,232],"paper,":[45],"approach":[50,202],"for":[51,138],"IGBTs":[53],"is":[54,88,103,207,212],"proposed":[55,104,201],"address":[57],"issue":[60],"IGBT":[63,153],"functions":[68,171],"maximum":[71],"typical":[73],"stresses":[74],"are":[75],"formulated":[76,89],"as":[77],"objective":[80],"constraint.":[82],"A":[83,100],"model":[87],"considering":[90],"balance":[93,160,175],"degradation":[95],"within":[96,184],"service":[98,186],"cycle.":[99,187],"decoupling":[101],"algorithm":[102],"transform":[106],"into":[110],"sequential":[112],"iteration":[113],"static":[115],"analysis.":[121,162],"utilizes":[125],"function":[128],"continuity":[129],"in":[130,223],"time":[132],"domain":[133],"reduce":[135],"evaluations":[137],"most":[140],"likelihood":[141],"points,":[142],"thereby":[143],"enhancing":[144],"efficiency.":[145],"Numerical":[146],"experimental":[148],"results":[149],"on":[150,168],"an":[151],"actual":[152],"demonstrate":[154],"accuracy":[156,224],"based":[167],"improves":[172],"by":[177],"16.3%":[178],"meets":[180],"requirements":[183],"Compared":[188],"with":[189,203],"double-loop":[192,218],"approach,":[193],"difference":[195],"between":[196],"solution":[198,206],"reference":[205],"0.4%,":[208],"334":[213],"times":[214],"that":[215],"approach.":[219,233],"advantages":[222],"exhibit":[227],"application":[229],"potential":[230]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}