{"id":"https://openalex.org/W4386524755","doi":"https://doi.org/10.1109/access.2023.3313001","title":"Heterogeneous Defect Prediction Based on Federated Prototype Learning","display_name":"Heterogeneous Defect Prediction Based on Federated Prototype Learning","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386524755","doi":"https://doi.org/10.1109/access.2023.3313001"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3313001","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3313001","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10243025.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10243025.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100693070","display_name":"Aili Wang","orcid":"https://orcid.org/0000-0002-9118-230X"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aili Wang","raw_affiliation_strings":["Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-9118-230X","affiliations":[{"raw_affiliation_string":"Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019289884","display_name":"Linlin Yang","orcid":"https://orcid.org/0009-0003-9823-1295"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linlin Yang","raw_affiliation_strings":["Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0009-0003-9823-1295","affiliations":[{"raw_affiliation_string":"Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082226990","display_name":"Haibin Wu","orcid":"https://orcid.org/0000-0002-2453-3691"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haibin Wu","raw_affiliation_strings":["Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-2453-3691","affiliations":[{"raw_affiliation_string":"Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin, China","institution_ids":["https://openalex.org/I100188998"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078778432","display_name":"Yuji Iwahori","orcid":"https://orcid.org/0000-0002-6421-8186"},"institutions":[{"id":"https://openalex.org/I184937672","display_name":"Chubu University","ror":"https://ror.org/02sps0775","country_code":"JP","type":"education","lineage":["https://openalex.org/I184937672"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuji Iwahori","raw_affiliation_strings":["Department of Computer Science, Chubu University, Kasugai, Aichi, Japan"],"raw_orcid":"https://orcid.org/0000-0002-6421-8186","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Chubu University, Kasugai, Aichi, Japan","institution_ids":["https://openalex.org/I184937672"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7058,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.7555162,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"11","issue":null,"first_page":"98618","last_page":"98632"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8533398509025574},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5570943355560303},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.528226375579834},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5021882057189941},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4996602535247803},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.44782862067222595},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.44251275062561035},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42409706115722656},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.38301077485084534},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10598552227020264}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8533398509025574},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5570943355560303},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.528226375579834},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5021882057189941},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4996602535247803},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.44782862067222595},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.44251275062561035},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42409706115722656},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.38301077485084534},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10598552227020264}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3313001","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3313001","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10243025.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:0c34a816dbdd453e9e17ca1ea79b2595","is_oa":true,"landing_page_url":"https://doaj.org/article/0c34a816dbdd453e9e17ca1ea79b2595","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 98618-98632 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3313001","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3313001","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10243025.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3214353145","display_name":"Development of Detection and Classification System for Supporting Medical Diagnosis of Endoscope Image, Cell Image and CT images","funder_award_id":"20K11873","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386524755.pdf","grobid_xml":"https://content.openalex.org/works/W4386524755.grobid-xml"},"referenced_works_count":62,"referenced_works":["https://openalex.org/W1966872876","https://openalex.org/W1978859404","https://openalex.org/W1993220166","https://openalex.org/W2010398592","https://openalex.org/W2021688474","https://openalex.org/W2055949897","https://openalex.org/W2061945428","https://openalex.org/W2107024044","https://openalex.org/W2111615301","https://openalex.org/W2115403315","https://openalex.org/W2120457925","https://openalex.org/W2146338950","https://openalex.org/W2344428106","https://openalex.org/W2476464413","https://openalex.org/W2560646185","https://openalex.org/W2731935965","https://openalex.org/W2735995639","https://openalex.org/W2737319015","https://openalex.org/W2741092914","https://openalex.org/W2766521509","https://openalex.org/W2767434420","https://openalex.org/W2771362265","https://openalex.org/W2778591805","https://openalex.org/W2790397506","https://openalex.org/W2793681838","https://openalex.org/W2809980389","https://openalex.org/W2906264889","https://openalex.org/W2908454557","https://openalex.org/W2913405424","https://openalex.org/W2916894978","https://openalex.org/W2921551200","https://openalex.org/W2963314614","https://openalex.org/W2981073616","https://openalex.org/W2994817145","https://openalex.org/W2995471277","https://openalex.org/W3007149882","https://openalex.org/W3021654819","https://openalex.org/W3037871107","https://openalex.org/W3038022836","https://openalex.org/W3052272642","https://openalex.org/W3129603732","https://openalex.org/W3131804997","https://openalex.org/W3141989311","https://openalex.org/W3155499466","https://openalex.org/W3172836181","https://openalex.org/W3195547649","https://openalex.org/W3199079404","https://openalex.org/W3199152169","https://openalex.org/W3215194618","https://openalex.org/W4226075082","https://openalex.org/W4226142397","https://openalex.org/W4226374017","https://openalex.org/W4226435603","https://openalex.org/W4236586490","https://openalex.org/W4238859253","https://openalex.org/W4283796083","https://openalex.org/W4288775957","https://openalex.org/W4300672433","https://openalex.org/W4318619660","https://openalex.org/W6728757088","https://openalex.org/W6759238902","https://openalex.org/W6789305514"],"related_works":["https://openalex.org/W4293226380","https://openalex.org/W4313906399","https://openalex.org/W4321487865","https://openalex.org/W2811106690","https://openalex.org/W4239306820","https://openalex.org/W2947043951","https://openalex.org/W2318112981","https://openalex.org/W4312417841","https://openalex.org/W4225147082","https://openalex.org/W2778653980"],"abstract_inverted_index":{"Software":[0],"defect":[1,23,30,92],"prediction":[2,24],"is":[3,43,53,161,177,200,235],"used":[4,97,162],"to":[5,34,55,60,102,114,130,140,237],"identify":[6],"modules":[7],"in":[8,67,156,179,191,219],"software":[9,29,157],"projects":[10,218],"that":[11,233],"may":[12],"have":[13,214],"defects.":[14],"Heterogeneous":[15],"Defect":[16],"Prediction":[17],"(HDP)":[18],"establishes":[19],"a":[20,73,186],"cross":[21],"project":[22,50],"model":[25,41],"based":[26,77],"on":[27,78,216],"different":[28],"datasets.":[31],"However,":[32],"due":[33,59],"the":[35,40,49,57,95,116,122,125,150,164,168,171,174,192,196,203,229],"heterogeneity":[36],"of":[37,119,153,188,205],"multi-source":[38],"data,":[39,108],"performance":[42],"usually":[44],"not":[45],"ideal.":[46],"In":[47],"addition,":[48],"data":[51,58,68,142,222],"holder":[52],"unwilling":[54],"disclose":[56],"privacy":[61,189],"regulations":[62],"and":[63,109,170,208,226,228],"other":[64,238],"reasons,":[65],"resulting":[66],"islands.":[69],"This":[70],"paper":[71],"presents":[72],"federal":[74],"prototype":[75,79,88,127,160,176,207,210],"learning":[76,85,89],"averaging":[80],"(FPLPA),":[81],"which":[82],"combines":[83],"federated":[84],"(FL)":[86],"with":[87,202],"for":[90],"heterogeneous":[91,141],"prediction.":[93],"Firstly,":[94],"client":[96,123],"one-sided":[98],"selection":[99],"(OSS)":[100],"algorithm":[101,113],"remove":[103],"noise":[104],"from":[105],"local":[106,134,175,197,206],"training":[107],"applied":[110],"Chi-Squares":[111],"Test":[112],"select":[115],"optimal":[117],"subset":[118],"features.":[120],"Secondly,":[121],"constructed":[124],"convolution":[126],"network":[128,199],"(CPN)":[129],"generate":[131],"their":[132],"own":[133],"prototypes.":[135],"CPN":[136,198],"are":[137],"more":[138],"robust":[139],"than":[143],"convolutional":[144],"neural":[145],"networks":[146],"(CNN),":[147],"while":[148],"avoiding":[149],"deviation":[151],"effect":[152],"class":[154],"imbalances":[155],"data.":[158],"The":[159],"as":[163,211],"communication":[165,193],"subject":[166],"between":[167],"clients":[169],"server.":[172],"Because":[173],"generated":[178],"an":[180],"irreversible":[181],"way,":[182],"it":[183],"can":[184],"play":[185],"role":[187],"protection":[190],"process.":[194],"Finally,":[195],"updated":[201],"loss":[204],"global":[209],"regularization.":[212],"We":[213],"verified":[215],"10":[217],"three":[220],"public":[221],"sets":[223],"(AEEEM,":[224],"NASA":[225],"Relink),":[227],"experimental":[230],"results":[231],"show":[232],"FPLPA":[234],"superior":[236],"HDP":[239],"solutions.":[240]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}