{"id":"https://openalex.org/W4386432209","doi":"https://doi.org/10.1109/access.2023.3312016","title":"Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory","display_name":"Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386432209","doi":"https://doi.org/10.1109/access.2023.3312016"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3312016","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3312016","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10239131.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10239131.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089228201","display_name":"Jonghyeon Ha","orcid":"https://orcid.org/0000-0001-7830-9321"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jonghyeon Ha","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-7830-9321","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051360047","display_name":"Minji Bang","orcid":"https://orcid.org/0009-0005-3198-6743"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minji Bang","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0005-3198-6743","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016865940","display_name":"Gyeongyeop Lee","orcid":"https://orcid.org/0000-0001-9926-0125"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyeongyeop Lee","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-9926-0125","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029499561","display_name":"Minki Suh","orcid":"https://orcid.org/0009-0004-9256-4627"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minki Suh","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0004-9256-4627","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009695503","display_name":"Chong-Eun Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chong-Eun Kim","raw_affiliation_strings":["Department of Railroad Electrical and Electronic Engineering, Korea National University of Transportation, Uiwang, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-5230-1567","affiliations":[{"raw_affiliation_string":"Department of Railroad Electrical and Electronic Engineering, Korea National University of Transportation, Uiwang, Republic of Korea","institution_ids":["https://openalex.org/I119575151"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037911372","display_name":"Jungsik Kim","orcid":"https://orcid.org/0000-0001-7798-3381"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungsik Kim","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-7798-3381","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5089228201"],"corresponding_institution_ids":["https://openalex.org/I189442560"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.633,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.68037591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"97682","last_page":"97688"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8810840249061584},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.710211992263794},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5841537117958069},{"id":"https://openalex.org/keywords/nanosheet","display_name":"Nanosheet","score":0.5673149228096008},{"id":"https://openalex.org/keywords/cluster","display_name":"Cluster (spacecraft)","score":0.47658273577690125},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.46734103560447693},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40042853355407715},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.370297908782959},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3245677351951599},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22306963801383972},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.21923723816871643},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.19818323850631714},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.12861457467079163},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0982116162776947}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8810840249061584},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.710211992263794},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5841537117958069},{"id":"https://openalex.org/C51967427","wikidata":"https://www.wikidata.org/wiki/Q17148232","display_name":"Nanosheet","level":2,"score":0.5673149228096008},{"id":"https://openalex.org/C164866538","wikidata":"https://www.wikidata.org/wiki/Q367351","display_name":"Cluster (spacecraft)","level":2,"score":0.47658273577690125},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.46734103560447693},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40042853355407715},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.370297908782959},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3245677351951599},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22306963801383972},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21923723816871643},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.19818323850631714},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.12861457467079163},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0982116162776947},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3312016","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3312016","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10239131.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:4cefa3d3bcba4d04bbd2f873e88403cf","is_oa":true,"landing_page_url":"https://doaj.org/article/4cefa3d3bcba4d04bbd2f873e88403cf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 97682-97688 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3312016","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3312016","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10239131.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[{"id":"https://openalex.org/G3142871628","display_name":null,"funder_award_id":"2020R1Gs1A1099554","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386432209.pdf","grobid_xml":"https://content.openalex.org/works/W4386432209.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1616071226","https://openalex.org/W1628829778","https://openalex.org/W2027568818","https://openalex.org/W2052557456","https://openalex.org/W2058574391","https://openalex.org/W2072585943","https://openalex.org/W2078585780","https://openalex.org/W2085559938","https://openalex.org/W2090635851","https://openalex.org/W2129562830","https://openalex.org/W2141449756","https://openalex.org/W2141741891","https://openalex.org/W2142494558","https://openalex.org/W2144970115","https://openalex.org/W2157646834","https://openalex.org/W2408354206","https://openalex.org/W2467652741","https://openalex.org/W2611605980","https://openalex.org/W2744406216","https://openalex.org/W2782293701","https://openalex.org/W2787310733","https://openalex.org/W2806280421","https://openalex.org/W2898167007","https://openalex.org/W2912350987","https://openalex.org/W2915257715","https://openalex.org/W2951786666","https://openalex.org/W3088667213","https://openalex.org/W3152842136","https://openalex.org/W4210597301","https://openalex.org/W6636682225"],"related_works":["https://openalex.org/W3119082211","https://openalex.org/W4396734720","https://openalex.org/W3091852196","https://openalex.org/W4400260568","https://openalex.org/W2084951691","https://openalex.org/W4388294765","https://openalex.org/W3206721946","https://openalex.org/W798086848","https://openalex.org/W2338175038","https://openalex.org/W2957838220"],"abstract_inverted_index":{"In":[0,38],"this":[1],"work,":[2],"the":[3,43,46,52,55,60,64,80,83,87,95,101,107,110,115,119,142,152,163],"effect":[4],"of":[5,45,48,54,86],"displacement":[6],"defect":[7],"(DD)":[8],"owing":[9],"to":[10,40],"cosmic":[11],"rays":[12],"on":[13,114],"six-transistor":[14],"(6T)":[15],"static":[16,72],"random":[17],"access":[18],"memory":[19],"(SRAM)":[20],"with":[21,138],"a":[22],"3":[23],"nm":[24],"node":[25],"nanosheet":[26],"field-effect":[27],"transistor":[28,61,146],"(NSFET)":[29],"is":[30,79,92],"investigated":[31],"using":[32],"technology":[33],"computer-aided":[34],"design":[35],"(TCAD)":[36],"simulation.":[37],"order":[39],"comprehensively":[41],"study":[42],"uncertainty":[44],"radiation":[47],"NSFET":[49],"6T":[50,67],"SRAM,":[51],"shape":[53,117,127],"DD":[56,65,88,111],"cluster":[57,89,103,112],"cross-section":[58,85],"and":[59,118],"damaged":[62,147],"by":[63],"in":[66,94,109,129,135],"SRAM":[68],"are":[69],"considered.":[70],"Read":[71],"noise":[73],"margin":[74],"(RSNM)":[75],"degradation":[76,134,161],"(19":[77],"%)":[78],"highest":[81],"when":[82],"rectangular":[84],"(rectangular-DD":[90],"cluster)":[91],"located":[93],"pull-down1":[96],"(PD1)":[97],"transistor.":[98],"To":[99],"mitigate":[100],"rectangular-DD":[102,148],"damage,":[104],"we":[105],"studied":[106],"variation":[108],"influence":[113],"sheet":[116,126],"source/drain":[120],"(S/D)":[121],"overlap":[122,165],"length":[123],"fluctuation.":[124],"The":[125],"resulted":[128],"2.3":[130],"%":[131,158],"lower":[132,159],"RSNM":[133,160],"NS":[136],"compared":[137],"nanowire":[139],"(NW).":[140],"Under":[141],"worst":[143],"conditions":[144],"(PD1":[145],"cluster,":[149],"NW":[150],"structure),":[151],"S/D":[153,164],"underlap":[154],"structure":[155],"showed":[156],"3.7":[157],"than":[162],"structure.":[166]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}