{"id":"https://openalex.org/W4386362999","doi":"https://doi.org/10.1109/access.2023.3311259","title":"A Novel Current Limiting Protection Control Strategy by Power MOSFET Thermal Management for Solid-State Power Controller","display_name":"A Novel Current Limiting Protection Control Strategy by Power MOSFET Thermal Management for Solid-State Power Controller","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386362999","doi":"https://doi.org/10.1109/access.2023.3311259"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3311259","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3311259","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10237212.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10237212.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070179032","display_name":"Yufang Lu","orcid":"https://orcid.org/0000-0002-9053-3104"},"institutions":[{"id":"https://openalex.org/I38706770","display_name":"Guilin University of Technology","ror":"https://ror.org/03z391397","country_code":"CN","type":"education","lineage":["https://openalex.org/I38706770"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufang Lu","raw_affiliation_strings":["School of Information Science and Engineering, Guilin University of Technology, Guilin, China","Guangxi Key Laboratory of Embedded Technology and Intelligent System, Guilin University of Technology, Guilin, CO, China","School of Information Science and Engineering, Guilin University of Technology, Guilin, CO, China"],"raw_orcid":"https://orcid.org/0000-0002-9053-3104","affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Guilin University of Technology, Guilin, China","institution_ids":["https://openalex.org/I38706770"]},{"raw_affiliation_string":"Guangxi Key Laboratory of Embedded Technology and Intelligent System, Guilin University of Technology, Guilin, CO, China","institution_ids":["https://openalex.org/I38706770"]},{"raw_affiliation_string":"School of Information Science and Engineering, Guilin University of Technology, Guilin, CO, China","institution_ids":["https://openalex.org/I38706770"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101239988","display_name":"Jiecheng Ai","orcid":null},"institutions":[{"id":"https://openalex.org/I38706770","display_name":"Guilin University of Technology","ror":"https://ror.org/03z391397","country_code":"CN","type":"education","lineage":["https://openalex.org/I38706770"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiecheng Ai","raw_affiliation_strings":["School of Information Science and Engineering, Guilin University of Technology, Guilin, China","School of Information Science and Engineering, Guilin University of Technology, Guilin, CO, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Guilin University of Technology, Guilin, China","institution_ids":["https://openalex.org/I38706770"]},{"raw_affiliation_string":"School of Information Science and Engineering, Guilin University of Technology, Guilin, CO, China","institution_ids":["https://openalex.org/I38706770"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101239989","display_name":"Luyang Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luyang Wei","raw_affiliation_strings":["Research and Development Department, Guilin Xingyun Electronic Technology Company Ltd., Guilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research and Development Department, Guilin Xingyun Electronic Technology Company Ltd., Guilin, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114178937","display_name":"Kai Meng","orcid":"https://orcid.org/0009-0000-4903-6096"},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Meng","raw_affiliation_strings":["Research and Development Department, Guilin Xingyun Electronic Technology Company Ltd., Guilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research and Development Department, Guilin Xingyun Electronic Technology Company Ltd., Guilin, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112992377","display_name":"Chengfu Han","orcid":null},"institutions":[{"id":"https://openalex.org/I38706770","display_name":"Guilin University of Technology","ror":"https://ror.org/03z391397","country_code":"CN","type":"education","lineage":["https://openalex.org/I38706770"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengfu Han","raw_affiliation_strings":["School of Information Science and Engineering, Guilin University of Technology, Guilin, China","School of Information Science and Engineering, Guilin University of Technology, Guilin, CO, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Guilin University of Technology, Guilin, China","institution_ids":["https://openalex.org/I38706770"]},{"raw_affiliation_string":"School of Information Science and Engineering, Guilin University of Technology, Guilin, CO, China","institution_ids":["https://openalex.org/I38706770"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2323,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5120417,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"11","issue":null,"first_page":"104955","last_page":"104965"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overheating","display_name":"Overheating (electricity)","score":0.8376989364624023},{"id":"https://openalex.org/keywords/current-limiting","display_name":"Current limiting","score":0.6870641708374023},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5696144104003906},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4474942684173584},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40896329283714294},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3847265839576721},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35628634691238403},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3367592990398407},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2223682999610901},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11354333162307739},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.11132344603538513}],"concepts":[{"id":"https://openalex.org/C2778284599","wikidata":"https://www.wikidata.org/wiki/Q25340000","display_name":"Overheating (electricity)","level":2,"score":0.8376989364624023},{"id":"https://openalex.org/C204106720","wikidata":"https://www.wikidata.org/wiki/Q15856134","display_name":"Current limiting","level":3,"score":0.6870641708374023},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5696144104003906},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4474942684173584},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40896329283714294},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3847265839576721},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35628634691238403},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3367592990398407},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2223682999610901},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11354333162307739},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.11132344603538513},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3311259","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3311259","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10237212.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:19fc5d9d21224420ae1b107e0287804b","is_oa":true,"landing_page_url":"https://doaj.org/article/19fc5d9d21224420ae1b107e0287804b","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 104955-104965 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3311259","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3311259","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10237212.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[{"id":"https://openalex.org/G8485513447","display_name":null,"funder_award_id":"2020-2-7","funder_id":"https://openalex.org/F4320329885","funder_display_name":"Guangxi Key Laboratory of Embedded Technology and Intelligent System"}],"funders":[{"id":"https://openalex.org/F4320329885","display_name":"Guangxi Key Laboratory of Embedded Technology and Intelligent System","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386362999.pdf","grobid_xml":"https://content.openalex.org/works/W4386362999.grobid-xml"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W2020753074","https://openalex.org/W2150763729","https://openalex.org/W2155549441","https://openalex.org/W2156356180","https://openalex.org/W2547114906","https://openalex.org/W2564577786","https://openalex.org/W2568648754","https://openalex.org/W2889273550","https://openalex.org/W2895849490","https://openalex.org/W3036507074","https://openalex.org/W3185130329","https://openalex.org/W3197887195","https://openalex.org/W3204227003","https://openalex.org/W4220905424","https://openalex.org/W4308345800"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2380377017","https://openalex.org/W1811598931","https://openalex.org/W1523184867","https://openalex.org/W2391203258","https://openalex.org/W2354827036","https://openalex.org/W2364370795","https://openalex.org/W840046878","https://openalex.org/W4242356429","https://openalex.org/W2187952154"],"abstract_inverted_index":{"This":[0,31,170],"paper":[1,171],"combines":[2],"real-time":[3,26],"temperature":[4,13,138,146,156,165],"detection":[5],"of":[6,29,38,55,74,93,112,128,141,147,157,176,185,216],"MOSFETs":[7],"inside":[8],"solid-state":[9,44,75,79,83,95,162,178],"switches":[10,45,76],"with":[11,181],"a":[12,18,121,174,177,182],"field":[14,139],"model,":[15],"and":[16,53,57,72,82,98,106,132,135,190],"proposes":[17],"current":[19,39,184,193],"limiting":[20,40,194],"protection":[21,41,70,195],"control":[22,114,208],"strategy":[23,32,115,209],"based":[24],"on":[25,108],"heat":[27,122],"management":[28],"MOSFETs.":[30],"can":[33,210],"avoid":[34],"the":[35,69,90,94,99,109,126,137,142,145,148,155,158,161,200,213,217],"unreasonable":[36],"setting":[37],"time":[42],"in":[43,61,116],"during":[46],"short":[47],"circuit":[48,84,91],"faults,":[49],"leading":[50],"to":[51],"overheating":[52,214],"failure":[54,215],"MOSFET,":[56],"thus":[58],"causing":[59],"faults":[60],"HVDC":[62],"power":[63,80,96,163,179],"distribution":[64,140],"system.":[65],"Firstly,":[66],"we":[67,88,119],"analyzed":[68],"characteristics":[71],"shortcomings":[73],"such":[77],"as":[78],"controller(SSPC)":[81],"breakers":[85],"(SSCB).":[86],"Secondly,":[87],"optimized":[89],"design":[92],"controller":[97,164,180],"conversion":[100],"relationship":[101],"under":[102],"different":[103],"operating":[104],"conditions,":[105],"elaborate":[107],"implementation":[110],"method":[111],"this":[113,207],"detail.":[117],"Thirdly,":[118],"established":[120],"dissipation":[123],"model":[124],"for":[125],"MOSFET":[127,149],"SSPC,":[129],"conduct":[130],"theoretical":[131],"simulation":[133],"analysis,":[134],"obtain":[136],"MOSFET;":[143],"Finally,":[144],"core":[150],"is":[151],"calculated":[152],"by":[153],"collecting":[154],"position":[159],"through":[160],"sensor,":[166],"achieving":[167],"accurate":[168],"measurement.":[169],"also":[172],"developed":[173],"prototype":[175],"rated":[183,201],"20A":[186],"at":[187,197],"270V":[188],"DC,":[189],"conducted":[191],"short-circuit":[192],"tests":[196],"5":[198],"times":[199],"current;":[202],"Experiments":[203],"have":[204],"shown":[205],"that":[206],"effectively":[211],"prevent":[212],"MOSFET.":[218]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}