{"id":"https://openalex.org/W4386179295","doi":"https://doi.org/10.1109/access.2023.3308688","title":"Positive Streamer Initiation in SF<sub>6</sub>/CO<sub>2</sub> Based on Zener\u2019s Field Ionization","display_name":"Positive Streamer Initiation in SF<sub>6</sub>/CO<sub>2</sub> Based on Zener\u2019s Field Ionization","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386179295","doi":"https://doi.org/10.1109/access.2023.3308688"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3308688","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3308688","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10230229.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10230229.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050948351","display_name":"Muhammad Farasat Abbas","orcid":"https://orcid.org/0000-0002-2294-0488"},"institutions":[{"id":"https://openalex.org/I929597975","display_name":"National University of Sciences and Technology","ror":"https://ror.org/03w2j5y17","country_code":"PK","type":"education","lineage":["https://openalex.org/I929597975"]}],"countries":["PK"],"is_corresponding":true,"raw_author_name":"Muhammad Farasat Abbas","raw_affiliation_strings":["Department of Electrical Engineering Power, U.S.-Pakistan Center for Advanced Studies in Energy (USPCAS-E), High Voltage Laboratory, National University of Sciences and Technology (NUST), Islamabad, Pakistan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering Power, U.S.-Pakistan Center for Advanced Studies in Energy (USPCAS-E), High Voltage Laboratory, National University of Sciences and Technology (NUST), Islamabad, Pakistan","institution_ids":["https://openalex.org/I929597975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101908581","display_name":"Yanliang He","orcid":"https://orcid.org/0000-0003-1223-1394"},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Liang He","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110572084","display_name":"Guang Sun","orcid":"https://orcid.org/0000-0003-1041-0145"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Guang Yu Sun","raw_affiliation_strings":["Swiss Plasma Center (SPC), Ecole Polytechnique F&#x00E9;d&#x00E9;rale de Lausanne (EPFL), Lausanne, Switzerland"],"affiliations":[{"raw_affiliation_string":"Swiss Plasma Center (SPC), Ecole Polytechnique F&#x00E9;d&#x00E9;rale de Lausanne (EPFL), Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048954805","display_name":"An Bang Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4391768273","display_name":"State Key Laboratory of Electrical Insulation and Power Equipment","ror":"https://ror.org/03kd9rr37","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391768273","https://openalex.org/I87445476"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"An Bang Sun","raw_affiliation_strings":["State Key Laboratory of Electrical Insulation and Power Equipment, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electrical Insulation and Power Equipment, Xi&#x2019;an Jiaotong University, Xi&#x2019;an, China","institution_ids":["https://openalex.org/I87445476","https://openalex.org/I4391768273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077423502","display_name":"Sayed M. Eldin","orcid":"https://orcid.org/0000-0003-3151-9967"},"institutions":[{"id":"https://openalex.org/I186217134","display_name":"Future University in Egypt","ror":"https://ror.org/03s8c2x09","country_code":"EG","type":"education","lineage":["https://openalex.org/I186217134"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Elsayed Tag Eldin","raw_affiliation_strings":["Faculty of Engineering and Technology, Future University in Egypt, New Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering and Technology, Future University in Egypt, New Cairo, Egypt","institution_ids":["https://openalex.org/I186217134"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045071979","display_name":"Sherif S. M. Ghoneim","orcid":"https://orcid.org/0000-0002-9387-1950"},"institutions":[{"id":"https://openalex.org/I179331831","display_name":"Taif University","ror":"https://ror.org/014g1a453","country_code":"SA","type":"education","lineage":["https://openalex.org/I179331831"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Sherif S. M. Ghoneim","raw_affiliation_strings":["Department of Electrical Engineering, College of Engineering, Taif University, Taif, Saudi Arabia","Department of Electrical Engineering, College of Engineering, Taif University, P.O. BOX 11099, Taif, Saudi Arabia"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, College of Engineering, Taif University, Taif, Saudi Arabia","institution_ids":["https://openalex.org/I179331831"]},{"raw_affiliation_string":"Department of Electrical Engineering, College of Engineering, Taif University, P.O. BOX 11099, Taif, Saudi Arabia","institution_ids":["https://openalex.org/I179331831"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5050948351"],"corresponding_institution_ids":["https://openalex.org/I929597975"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.9209,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.74389901,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"91767","last_page":"91776"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10642","display_name":"Plasma Applications and Diagnostics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ionization","display_name":"Ionization","score":0.4945990741252899},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4064866900444031},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3532763123512268},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2357023060321808},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.10095381736755371},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.09412240982055664},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.08232846856117249}],"concepts":[{"id":"https://openalex.org/C198291218","wikidata":"https://www.wikidata.org/wiki/Q190382","display_name":"Ionization","level":3,"score":0.4945990741252899},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4064866900444031},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3532763123512268},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2357023060321808},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.10095381736755371},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.09412240982055664},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.08232846856117249}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2023.3308688","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3308688","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10230229.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:infoscience.epfl.ch:305905","is_oa":true,"landing_page_url":"https://infoscience.epfl.ch/handle/20.500.14299/201496","pdf_url":"https://infoscience.epfl.ch/bitstreams/e9f9be68-5e34-4347-8dce-3788d3d73223/download","source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"WoS","raw_type":"research article"},{"id":"pmh:oai:doaj.org/article:0ed23c6f96d042a0914982d0cb7134a3","is_oa":true,"landing_page_url":"https://doaj.org/article/0ed23c6f96d042a0914982d0cb7134a3","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 91767-91776 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3308688","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3308688","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10230229.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4386179295.pdf","grobid_xml":"https://content.openalex.org/works/W4386179295.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1560048393","https://openalex.org/W1660260728","https://openalex.org/W1964017951","https://openalex.org/W1966870896","https://openalex.org/W1969138767","https://openalex.org/W1987973512","https://openalex.org/W1993050849","https://openalex.org/W2006405770","https://openalex.org/W2015649833","https://openalex.org/W2026705953","https://openalex.org/W2027554358","https://openalex.org/W2030149280","https://openalex.org/W2031241840","https://openalex.org/W2042589483","https://openalex.org/W2063026379","https://openalex.org/W2065700733","https://openalex.org/W2093397381","https://openalex.org/W2130307293","https://openalex.org/W2130599802","https://openalex.org/W2427418943","https://openalex.org/W2554015731","https://openalex.org/W2725055913","https://openalex.org/W2729788155","https://openalex.org/W2791826041","https://openalex.org/W2912875478","https://openalex.org/W3010626635","https://openalex.org/W3021153767","https://openalex.org/W3090822793","https://openalex.org/W3104374351","https://openalex.org/W3112133222","https://openalex.org/W3172818579","https://openalex.org/W4296778149","https://openalex.org/W6749214004"],"related_works":["https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W2043495370","https://openalex.org/W1980516703"],"abstract_inverted_index":{"In":[0],"this":[1],"study,":[2],"experiments":[3],"were":[4],"performed":[5],"to":[6,50,74,77,134],"measure":[7],"the":[8,37,42,78,95,135,149,167,170,174,187,192,199,243,253],"inception":[9,97,121,136,150],"and":[10,33,109,151,189,204],"breakdown":[11,152],"voltages":[12,153],"of":[13,123,138,148,169,173,186,191,245,256],"SF":[14,56,140,216,234],"<sub":[15,19,57,61,102,113,125,129,141,211,217,235,239],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[16,20,58,62,90,103,114,126,130,142,158,212,218,236,240],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">6</sub>":[17,59,131,143,219,237],"/CO":[18,60,238],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[21,63,104,115,127,213,241],"mixed":[22,193],"gases":[23,262],"with":[24,64,208],"varying":[25],"mixing":[26],"ratios":[27],"at":[28,88,156,220],"two":[29],"different":[30],"pressures":[31],"(1":[32],"2":[34,161],"bar).":[35],"Using":[36],"preliminary":[38],"data":[39],"obtained":[40],"from":[41],"experiments,":[43],"a":[44,229,265],"3D":[45],"particle":[46],"model":[47,71],"was":[48,72,132,154,183],"used":[49],"investigate":[51],"positive":[52],"streamer":[53,175,181,205],"initiation":[54],"in":[55,81,215,242],"field":[65,224,258],"ionization.":[66],"Field":[67],"ionization":[68,225,231,259],"using":[69],"Zener\u2019s":[70,223,257],"assumed":[73],"be":[75,227],"similar":[76,146,184],"electron":[79,202],"detachment":[80],"air.":[82],"The":[83,120,163,180],"experimental":[84,254],"results":[85,165],"showed":[86],"that":[87],"<italic":[89,157],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">P</i>":[91,159],"=":[92,160],"1":[93],"bar,":[94],"discharge":[96],"voltage":[98,122,137],"increased":[99,207],"for":[100,111,233,260],"CO":[101,112,210],"concentrations":[105,116],"lower":[106],"than":[107,118],"50%":[108],"decreased":[110],"higher":[117],"50%.":[119],"80%CO":[124],"/20%SF":[128],"close":[133],"pure":[139],".":[144],"A":[145],"trend":[147],"observed":[155],"bar.":[162],"simulation":[164],"show":[166],"evolution":[168],"thin":[171],"filaments":[172],"into":[176],"three":[177],"distinct":[178],"stages.":[179],"morphology":[182],"irrespective":[185],"type":[188],"concentration":[190,214],"gas.":[194],"Other":[195],"parameters":[196],"such":[197],"as":[198],"electric":[200,249],"field,":[201],"density,":[203],"length":[206],"increasing":[209],"both":[221],"pressures.":[222],"could":[226],"considered":[228],"primary":[230],"mechanism":[232],"case":[244],"very":[246],"high":[247],"non-uniform":[248],"fields;":[250],"however,":[251],"finding":[252],"validation":[255],"electronegative":[261],"is":[263],"still":[264],"challenging":[266],"task.":[267]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2023-08-26T00:00:00"}