{"id":"https://openalex.org/W4385627597","doi":"https://doi.org/10.1109/access.2023.3303207","title":"High-Frequency Planar Transformer Based on Interleaved Serpentine Winding Method With Low Parasitic Capacitance for High-Current Input LLC Resonant Converter","display_name":"High-Frequency Planar Transformer Based on Interleaved Serpentine Winding Method With Low Parasitic Capacitance for High-Current Input LLC Resonant Converter","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4385627597","doi":"https://doi.org/10.1109/access.2023.3303207"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3303207","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3303207","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10210576.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10210576.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046001853","display_name":"Su-Seong Park","orcid":"https://orcid.org/0000-0003-3028-895X"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Su-Seong Park","raw_affiliation_strings":["Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-3028-895X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066991503","display_name":"Myeong-Seok Jeon","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myeong-Seok Jeon","raw_affiliation_strings":["Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022299968","display_name":"Sung-Soo Min","orcid":"https://orcid.org/0000-0003-4275-4049"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung-Soo Min","raw_affiliation_strings":["Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4275-4049","affiliations":[{"raw_affiliation_string":"Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010131318","display_name":"Rae-Young Kim","orcid":"https://orcid.org/0000-0002-3753-7720"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Rae-Young Kim","raw_affiliation_strings":["Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3753-7720","affiliations":[{"raw_affiliation_string":"Department of Electrical and Biomedical Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.1704,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.78249192,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"84900","last_page":"84911"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11249","display_name":"Wireless Power Transfer Systems","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9675999879837036,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.7639086842536926},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6932346820831299},{"id":"https://openalex.org/keywords/copper-loss","display_name":"Copper loss","score":0.5677956938743591},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5554801821708679},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.5150017738342285},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4817966818809509},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.47813618183135986},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.4357723295688629},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4185778498649597},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3957148790359497},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3523769676685333},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3355262577533722},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3003140091896057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2407425343990326},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1770414412021637},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.13219499588012695}],"concepts":[{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.7639086842536926},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6932346820831299},{"id":"https://openalex.org/C61906436","wikidata":"https://www.wikidata.org/wiki/Q1225223","display_name":"Copper loss","level":3,"score":0.5677956938743591},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5554801821708679},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.5150017738342285},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4817966818809509},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.47813618183135986},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.4357723295688629},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4185778498649597},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3957148790359497},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3523769676685333},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3355262577533722},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3003140091896057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2407425343990326},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1770414412021637},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.13219499588012695},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3303207","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3303207","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10210576.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:edce2bc67f6247d6863eeb006fe355a6","is_oa":true,"landing_page_url":"https://doaj.org/article/edce2bc67f6247d6863eeb006fe355a6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 84900-84911 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3303207","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3303207","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10210576.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9100000262260437,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4660249753","display_name":null,"funder_award_id":"20212020800020","funder_id":"https://openalex.org/F4320335199","funder_display_name":"Korea Institute of Energy Technology Evaluation and Planning"},{"id":"https://openalex.org/G6459358331","display_name":null,"funder_award_id":"2018201010650A","funder_id":"https://openalex.org/F4320335199","funder_display_name":"Korea Institute of Energy Technology Evaluation and Planning"},{"id":"https://openalex.org/G6563811562","display_name":null,"funder_award_id":"2018201010650A","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G7268428592","display_name":null,"funder_award_id":"20212020800020","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320335199","display_name":"Korea Institute of Energy Technology Evaluation and Planning","ror":"https://ror.org/02zq38y32"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4385627597.pdf","grobid_xml":"https://content.openalex.org/works/W4385627597.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W1136058488","https://openalex.org/W1680500694","https://openalex.org/W1976386466","https://openalex.org/W2039086823","https://openalex.org/W2041804496","https://openalex.org/W2063720837","https://openalex.org/W2109904040","https://openalex.org/W2129205236","https://openalex.org/W2139976606","https://openalex.org/W2169859991","https://openalex.org/W2295001729","https://openalex.org/W2398698368","https://openalex.org/W2511320707","https://openalex.org/W2538283185","https://openalex.org/W2543610453","https://openalex.org/W2783337029","https://openalex.org/W2891487349","https://openalex.org/W2904054009","https://openalex.org/W2915084239","https://openalex.org/W2921712749","https://openalex.org/W3000333040","https://openalex.org/W3092359799","https://openalex.org/W3107986299","https://openalex.org/W3116671093"],"related_works":["https://openalex.org/W2348740411","https://openalex.org/W1966596465","https://openalex.org/W2051563071","https://openalex.org/W4386858602","https://openalex.org/W2337947459","https://openalex.org/W2118205267","https://openalex.org/W4200544700","https://openalex.org/W2126912594","https://openalex.org/W1988444705","https://openalex.org/W4292622326"],"abstract_inverted_index":{"An":[0],"LLC":[1],"resonant":[2],"converter":[3],"should":[4],"have":[5],"high":[6,43,91],"efficiency":[7,227],"and":[8,19,27,33,52,102,109,128,206,215,217,224],"power":[9,44],"density.":[10],"Further,":[11],"it":[12,129,218],"is":[13,39,73,112,157],"important":[14],"to":[15,41,89,122,140,167],"reduce":[16,123],"the":[17,22,31,46,49,53,59,63,69,85,90,95,99,124,136,144,153,162,169,175,183,195,199,202,225],"volume":[18],"loss":[20,55,87],"of":[21,48,98,105,152,161,174,186,201,221],"transformer,":[23],"which":[24],"provides":[25],"insulation":[26],"voltage":[28],"conversion":[29],"between":[30],"input":[32],"output.":[34],"When":[35],"a":[36,119],"planar":[37,100],"core":[38,101],"used":[40],"achieve":[42],"density,":[45],"magnitude":[47],"parasitic":[50,107,170,196],"components":[51],"transformer":[54],"considerably":[56],"depend":[57],"on":[58],"winding":[60,71,81,86,116,137,146,155,165,177,188],"arrangement":[61,138],"within":[62],"limited":[64],"window":[65,96],"area.":[66],"Therefore,":[67],"analyzing":[68],"various":[70],"arrangements":[72],"necessary.":[74],"To":[75],"this":[76],"end,":[77],"an":[78],"interleaved":[79],"serpentine":[80],"method":[82,117,156,166,189,205],"that":[83,141,160],"reduces":[84],"attributed":[88],"current":[92,222],"by":[93,143],"maximizing":[94],"area":[97],"has":[103],"advantages":[104],"low":[106],"capacitance":[108,171,185],"excellent":[110],"assembly":[111],"proposed.":[113],"The":[114,148,179],"proposed":[115,154,176,203],"uses":[118],"Litz":[120],"wire":[121],"DC":[125],"copper":[126],"loss,":[127],"does":[130],"not":[131],"require":[132],"additional":[133],"space":[134],"for":[135,181,192],"compared":[139,158],"required":[142],"U-type":[145,164],"method.":[147,178],"capacitive":[149],"energy":[150],"distribution":[151],"with":[159],"existing":[163],"confirm":[168],"reduction":[172],"effect":[173],"formulae":[180],"calculating":[182],"effective":[184],"each":[187],"are":[190,208],"derived":[191],"accurately":[193],"estimating":[194],"capacitance.":[197],"Finally,":[198],"effectiveness":[200],"analysis":[204,213],"prototype":[207],"verified":[209],"through":[210],"finite":[211],"element":[212],"simulation":[214],"experiments":[216],"shows":[219],"improvement":[220],"waveforms":[223],"overall":[226],"increases":[228],"about":[229],"0.5%.":[230]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}