{"id":"https://openalex.org/W4385338735","doi":"https://doi.org/10.1109/access.2023.3299852","title":"Fault Diagnosis of Cascaded Multilevel Inverter Using Multiscale Kernel Convolutional Neural Network","display_name":"Fault Diagnosis of Cascaded Multilevel Inverter Using Multiscale Kernel Convolutional Neural Network","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4385338735","doi":"https://doi.org/10.1109/access.2023.3299852"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3299852","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3299852","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10196384.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10196384.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035409427","display_name":"A. Sivapriya","orcid":null},"institutions":[{"id":"https://openalex.org/I145286018","display_name":"SRM Institute of Science and Technology","ror":"https://ror.org/050113w36","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"A. Sivapriya","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur, Chennai, Tamil Nadu, India"],"raw_orcid":"https://orcid.org/0000-0002-0845-5013","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur, Chennai, Tamil Nadu, India","institution_ids":["https://openalex.org/I145286018"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028756340","display_name":"N. Kalaiarasi","orcid":null},"institutions":[{"id":"https://openalex.org/I145286018","display_name":"SRM Institute of Science and Technology","ror":"https://ror.org/050113w36","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"N. Kalaiarasi","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur, Chennai, Tamil Nadu, India"],"raw_orcid":"https://orcid.org/0000-0002-6277-8809","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur, Chennai, Tamil Nadu, India","institution_ids":["https://openalex.org/I145286018"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078906878","display_name":"Rajesh Verma","orcid":"https://orcid.org/0000-0002-7024-0216"},"institutions":[{"id":"https://openalex.org/I82952536","display_name":"King Khalid University","ror":"https://ror.org/052kwzs30","country_code":"SA","type":"education","lineage":["https://openalex.org/I82952536"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Rajesh Verma","raw_affiliation_strings":["Electrical Engineering Department, College of Engineering, King Khalid University, Abha, Saudi Arabia","Electrical Engineering Department, College of Engineering, King Khalid University, Abha, Asir, Kingdom of Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, College of Engineering, King Khalid University, Abha, Saudi Arabia","institution_ids":["https://openalex.org/I82952536"]},{"raw_affiliation_string":"Electrical Engineering Department, College of Engineering, King Khalid University, Abha, Asir, Kingdom of Saudi Arabia","institution_ids":["https://openalex.org/I82952536"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045084329","display_name":"C. Bharatiraja","orcid":"https://orcid.org/0000-0003-2517-2119"},"institutions":[{"id":"https://openalex.org/I145286018","display_name":"SRM Institute of Science and Technology","ror":"https://ror.org/050113w36","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bharatiraja Chokkalingam","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur, Chennai, Tamil Nadu, India"],"raw_orcid":"https://orcid.org/0000-0003-2517-2119","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur, Chennai, Tamil Nadu, India","institution_ids":["https://openalex.org/I145286018"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014845226","display_name":"Josiah L. Munda","orcid":"https://orcid.org/0000-0002-6418-0624"},"institutions":[{"id":"https://openalex.org/I137616099","display_name":"Tshwane University of Technology","ror":"https://ror.org/037mrss42","country_code":"ZA","type":"education","lineage":["https://openalex.org/I137616099"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Josiah Lange Munda","raw_affiliation_strings":["Department of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa"],"raw_orcid":"https://orcid.org/0000-0002-6418-0624","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tshwane University of Technology, Pretoria, South Africa","institution_ids":["https://openalex.org/I137616099"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5035409427"],"corresponding_institution_ids":["https://openalex.org/I145286018"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":4.651,"has_fulltext":true,"cited_by_count":26,"citation_normalized_percentile":{"value":0.95459729,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"11","issue":null,"first_page":"79513","last_page":"79530"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7477739453315735},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6417361497879028},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5554783344268799},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5371893644332886},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5209309458732605},{"id":"https://openalex.org/keywords/softmax-function","display_name":"Softmax function","score":0.4395041763782501},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.43902286887168884},{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.4204397201538086},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3844297528266907},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35685259103775024},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35133105516433716},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3293028473854065},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14305201172828674},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07136446237564087}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7477739453315735},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6417361497879028},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5554783344268799},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5371893644332886},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5209309458732605},{"id":"https://openalex.org/C188441871","wikidata":"https://www.wikidata.org/wiki/Q7554146","display_name":"Softmax function","level":3,"score":0.4395041763782501},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.43902286887168884},{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.4204397201538086},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3844297528266907},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35685259103775024},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35133105516433716},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3293028473854065},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14305201172828674},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07136446237564087},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3299852","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3299852","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10196384.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:95704d70ec2445b3b4d60719515abd7c","is_oa":true,"landing_page_url":"https://doaj.org/article/95704d70ec2445b3b4d60719515abd7c","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 79513-79530 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3299852","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3299852","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10196384.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.6200000047683716}],"awards":[{"id":"https://openalex.org/G4644478828","display_name":null,"funder_award_id":"RGP 2/177/44","funder_id":"https://openalex.org/F4320324433","funder_display_name":"King Khalid University"}],"funders":[{"id":"https://openalex.org/F4320324433","display_name":"King Khalid University","ror":"https://ror.org/052kwzs30"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4385338735.pdf","grobid_xml":"https://content.openalex.org/works/W4385338735.grobid-xml"},"referenced_works_count":44,"referenced_works":["https://openalex.org/W1980558747","https://openalex.org/W2051044060","https://openalex.org/W2460418407","https://openalex.org/W2763503476","https://openalex.org/W2768753204","https://openalex.org/W2804964124","https://openalex.org/W2808496542","https://openalex.org/W2887671388","https://openalex.org/W2892779307","https://openalex.org/W2920611841","https://openalex.org/W2940491215","https://openalex.org/W2947583263","https://openalex.org/W2962907896","https://openalex.org/W2973424371","https://openalex.org/W2989424303","https://openalex.org/W2994887188","https://openalex.org/W2996237764","https://openalex.org/W3004464175","https://openalex.org/W3008819860","https://openalex.org/W3011878459","https://openalex.org/W3016548657","https://openalex.org/W3033043953","https://openalex.org/W3033236487","https://openalex.org/W3033928040","https://openalex.org/W3039910281","https://openalex.org/W3045469349","https://openalex.org/W3046192825","https://openalex.org/W3127499906","https://openalex.org/W3132225782","https://openalex.org/W3139511541","https://openalex.org/W3172920580","https://openalex.org/W3183874811","https://openalex.org/W3212445966","https://openalex.org/W3215184780","https://openalex.org/W4200533033","https://openalex.org/W4205608352","https://openalex.org/W4281712141","https://openalex.org/W4282916371","https://openalex.org/W4285245107","https://openalex.org/W4287887998","https://openalex.org/W4296794447","https://openalex.org/W4303710087","https://openalex.org/W4361792086","https://openalex.org/W4363649292"],"related_works":["https://openalex.org/W3107204728","https://openalex.org/W4287591324","https://openalex.org/W4226420367","https://openalex.org/W2980176872","https://openalex.org/W2962876041","https://openalex.org/W3095152779","https://openalex.org/W3119773509","https://openalex.org/W3128220219","https://openalex.org/W3006353185","https://openalex.org/W2899027234"],"abstract_inverted_index":{"Over":[0],"the":[1,23,29,39,42,48,53,112,127,140,149,169,202,206,209,216,219,255,258],"last":[2],"decade,":[3],"multilevel":[4,20],"inverter":[5],"(MLI)":[6],"has":[7],"gained":[8],"a":[9,96,130,143,223],"global":[10],"research":[11],"paradigm":[12],"in":[13,234],"power":[14,128],"electronics.":[15],"The":[16,44,230],"high-power":[17],"application":[18],"of":[19,28,33,41,52,108,121,129,181,208,218,228,245,257],"inverters":[21],"necessitates":[22,115],"safe":[24],"and":[25,62,77,159,193,197,237],"reliable":[26],"operation":[27],"inverter.":[30,43],"Fault":[31],"diagnosis":[32,107,189,211,225],"MLI":[34,54],"is":[35,71,155],"inevitable":[36],"to":[37,74,135,157,162],"enhance":[38],"reliability":[40],"real-time":[45],"applications":[46],"monitor":[47],"intricate":[49],"switching":[50],"process":[51],"using":[55,116],"data":[56],"from":[57,139],"sensors":[58],"like":[59],"voltage,":[60],"current,":[61],"temperature.":[63],"Obtaining":[64],"complementary":[65],"fault":[66,106,164,175,210,243],"features":[67,138],"through":[68,142,177],"conventional":[69],"methods":[70,82],"difficult":[72],"due":[73],"operating":[75],"complexity":[76],"limited":[78],"switch-fault":[79],"samples.":[80],"These":[81],"heavily":[83],"depend":[84],"on":[85],"prior":[86],"knowledge.":[87],"To":[88],"deal":[89],"with":[90,184,249],"this":[91,93],"problem,":[92],"paper":[94],"proposes":[95],"new":[97],"multiscale":[98,150],"kernel":[99,151],"convolution":[100,131,152,179],"neural":[101,132],"network":[102,133,153],"(MKCNN)":[103],"for":[104],"fast":[105],"cascaded":[109],"MLI.":[110,247],"Firstly,":[111],"proposed":[113,220,259],"method":[114,167],"frequency":[117],"domain":[118],"samples":[119],"instead":[120],"raw":[122],"signals,":[123],"which":[124],"can":[125],"leverage":[126],"(CNN)":[134],"obtain":[136],"hierarchical":[137],"images":[141],"short-time":[144],"Fourier":[145],"transform":[146],"(STFT).":[147],"Secondly,":[148],"model":[154,231],"constructed":[156],"capture":[158],"analyze":[160],"low-":[161],"high-level":[163],"features.":[165],"This":[166],"improves":[168],"traditional":[170],"CNN":[171],"by":[172],"extracting":[173],"discriminative":[174],"information":[176],"multiple":[178,194,238],"kernels":[180],"different":[182,242],"scales":[183],"varying":[185],"resolutions":[186],"obtaining":[187],"high":[188,224],"accuracy":[190,226],"under":[191],"single":[192,236],"open":[195],"circuit":[196,199],"short":[198],"faults.":[200],"Finally,":[201],"softmax":[203],"layer":[204],"generates":[205],"output":[207],"results.":[212],"Simulation":[213],"results":[214],"validate":[215],"effectiveness":[217],"model,":[221],"demonstrating":[222],"rate":[227],"98.3%.":[229],"exhibits":[232],"robustness":[233],"diagnosing":[235],"switch":[239],"faults":[240],"across":[241],"cases":[244],"an":[246],"Comparison":[248],"other":[250],"intelligent":[251],"models":[252],"further":[253],"emphasizes":[254],"superiority":[256],"method.":[260]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":12}],"updated_date":"2026-04-28T14:05:53.105641","created_date":"2025-10-10T00:00:00"}