{"id":"https://openalex.org/W4383503517","doi":"https://doi.org/10.1109/access.2023.3293191","title":"Research on Threshold Segmentation Method of Two-Dimensional Otsu Image Based on Improved Sparrow Search Algorithm","display_name":"Research on Threshold Segmentation Method of Two-Dimensional Otsu Image Based on Improved Sparrow Search Algorithm","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4383503517","doi":"https://doi.org/10.1109/access.2023.3293191"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3293191","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3293191","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10176126.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10176126.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101810742","display_name":"Yun Du","orcid":"https://orcid.org/0009-0003-2332-5780"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yun Du","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China","institution_ids":["https://openalex.org/I34155123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101826642","display_name":"Haoqin Yuan","orcid":"https://orcid.org/0009-0002-8273-2063"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanliu Yuan","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China","institution_ids":["https://openalex.org/I34155123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072449117","display_name":"Kejin Jia","orcid":"https://orcid.org/0000-0003-1408-0649"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kejin Jia","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China","institution_ids":["https://openalex.org/I34155123"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048908031","display_name":"F. Li","orcid":"https://orcid.org/0000-0003-3950-0662"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feifei Li","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China","institution_ids":["https://openalex.org/I34155123"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101810742"],"corresponding_institution_ids":["https://openalex.org/I34155123"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":4.2383,"has_fulltext":true,"cited_by_count":32,"citation_normalized_percentile":{"value":0.94919802,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"11","issue":null,"first_page":"70459","last_page":"70469"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9585999846458435,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9585999846458435,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9311000108718872,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":0.9232000112533569,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/otsus-method","display_name":"Otsu's method","score":0.9501613974571228},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.6546356081962585},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5655701160430908},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5295223593711853},{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.5116798877716064},{"id":"https://openalex.org/keywords/population","display_name":"Population","score":0.4864506423473358},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.48547104001045227},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.46822425723075867},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4302375912666321}],"concepts":[{"id":"https://openalex.org/C21729346","wikidata":"https://www.wikidata.org/wiki/Q2444417","display_name":"Otsu's method","level":4,"score":0.9501613974571228},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.6546356081962585},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5655701160430908},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5295223593711853},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.5116798877716064},{"id":"https://openalex.org/C2908647359","wikidata":"https://www.wikidata.org/wiki/Q2625603","display_name":"Population","level":2,"score":0.4864506423473358},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.48547104001045227},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.46822425723075867},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4302375912666321},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C149923435","wikidata":"https://www.wikidata.org/wiki/Q37732","display_name":"Demography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3293191","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3293191","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10176126.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:abf367a458d140afa43c84d54c5550f8","is_oa":true,"landing_page_url":"https://doaj.org/article/abf367a458d140afa43c84d54c5550f8","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 70459-70469 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3293191","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3293191","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10176126.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4383503517.pdf","grobid_xml":"https://content.openalex.org/works/W4383503517.grobid-xml"},"referenced_works_count":42,"referenced_works":["https://openalex.org/W34751889","https://openalex.org/W1614535104","https://openalex.org/W1978038771","https://openalex.org/W2011007549","https://openalex.org/W2084038305","https://openalex.org/W2093408761","https://openalex.org/W2108044931","https://openalex.org/W2112373205","https://openalex.org/W2151163134","https://openalex.org/W2212329603","https://openalex.org/W2395535539","https://openalex.org/W2548390709","https://openalex.org/W2757003988","https://openalex.org/W2776864952","https://openalex.org/W2883304180","https://openalex.org/W2998553334","https://openalex.org/W2998661753","https://openalex.org/W3010611330","https://openalex.org/W3092687578","https://openalex.org/W3096135038","https://openalex.org/W3108235076","https://openalex.org/W3113125273","https://openalex.org/W3128049501","https://openalex.org/W3134034025","https://openalex.org/W3147232249","https://openalex.org/W3156862473","https://openalex.org/W3193813840","https://openalex.org/W3217621440","https://openalex.org/W4205970187","https://openalex.org/W4224257379","https://openalex.org/W4281844295","https://openalex.org/W4285174150","https://openalex.org/W4288732313","https://openalex.org/W4292635991","https://openalex.org/W4293104858","https://openalex.org/W4303022576","https://openalex.org/W4309801447","https://openalex.org/W4310748417","https://openalex.org/W4328030428","https://openalex.org/W6671830270","https://openalex.org/W6673678004","https://openalex.org/W6688328430"],"related_works":["https://openalex.org/W2071534821","https://openalex.org/W2015185374","https://openalex.org/W2981960317","https://openalex.org/W3162267746","https://openalex.org/W2360695088","https://openalex.org/W2377426844","https://openalex.org/W1614535104","https://openalex.org/W2541611006","https://openalex.org/W4306937392","https://openalex.org/W2371320458"],"abstract_inverted_index":{"Aiming":[0],"at":[1],"the":[2,35,38,46,49,52,60,63,68,72,81,86,94,105,112,119,148,163,180,184,190,198,213],"issues":[3],"of":[4,10,21,48,62,88,114,183,215],"complex":[5],"calculation":[6],"and":[7,51,104,141,159,162,176,207,210],"low":[8],"accuracy":[9,113],"two-dimensional":[11],"(2D)":[12],"Otsu":[13,23,103,122,125,130,136,143],"segmentation":[14,19],"images,":[15],"an":[16],"image":[17,106,115,216],"threshold":[18,107,182],"means":[20],"2D":[22,102,121,124,129,135,142],"ground":[24],"on":[25],"a":[26],"modified":[27,95],"sparrow":[28,82,96,144],"search":[29,70,97,145],"algorithm":[30,98,127,133,139,146,186,199],"is":[31,42,56,77,99,108,154,169,187,195],"proposed.":[32],"Firstly,":[33],"in":[34,67,200],"initialization":[36],"stage,":[37,71],"tent":[39],"chaos":[40],"mapping":[41],"added":[43],"to":[44,58,79,84,110],"enhance":[45,59,111],"multiformity":[47],"population,":[50],"population":[53],"elite":[54,73],"strategy":[55,76],"introduced":[57],"quality":[61,214],"initial":[64],"solution.":[65],"Secondly,":[66],"local":[69,91],"reverse":[74],"learning":[75],"applied":[78],"renewal":[80],"location":[83],"solve":[85],"issue":[87],"getting":[89],"into":[90],"optimality.":[92],"Eventually,":[93],"fused":[100],"with":[101,118],"segmented":[109],"segmentation.":[116,217],"Compared":[117],"traditional":[120],"algorithm,":[123],"genetic":[126],"(GA-Otsu),":[128],"seagull":[131],"optimization":[132],"(SOA-Otsu),":[134],"particle":[137],"swarm":[138],"(PSO-Otsu)":[140],"(SSA-Otsu),":[147],"mean":[149],"square":[150],"error":[151],"(MSE)":[152],"value":[153,168],"reduced":[155],"by":[156,171],"40.84%,2.68%,":[157],"1.57%,0.77%":[158],"1.04%,":[160],"respectively,":[161],"peak":[164],"signal-to-noise":[165],"ratio":[166],"(PSNR)":[167],"increased":[170],"24.48%,":[172],"1.24%,":[173],"0.83%,":[174],"0.40%":[175],"0.45%,":[177],"respectively.":[178],"Moreover,":[179],"optimal":[181],"proposed":[185],"better":[188],"than":[189],"other":[191],"five":[192],"algorithms.":[193],"It":[194],"verified":[196],"that":[197],"this":[201],"paper":[202],"has":[203],"faster":[204],"convergence":[205],"speed":[206],"higher":[208],"accuracy,":[209],"effectively":[211],"improves":[212]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":15},{"year":2024,"cited_by_count":16}],"updated_date":"2026-03-14T08:43:22.919905","created_date":"2025-10-10T00:00:00"}