{"id":"https://openalex.org/W4383220050","doi":"https://doi.org/10.1109/access.2023.3292542","title":"Detection of Irregular Sheath Current Distribution for Diagnosis of Faults in Grounding Systems of Cross-Bonded Cables","display_name":"Detection of Irregular Sheath Current Distribution for Diagnosis of Faults in Grounding Systems of Cross-Bonded Cables","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4383220050","doi":"https://doi.org/10.1109/access.2023.3292542"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3292542","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3292542","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10173528.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10173528.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100357054","display_name":"Gen Li","orcid":"https://orcid.org/0000-0003-2648-9281"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gen Li","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-2648-9281","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100640365","display_name":"Jie Chen","orcid":"https://orcid.org/0000-0001-9259-8270"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jie Chen","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Electric Power Research Institute, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Electric Power Research Institute, Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101461242","display_name":"Hongze Li","orcid":"https://orcid.org/0000-0003-4121-3785"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hongze Li","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company, Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102153521","display_name":"Libin Hu","orcid":"https://orcid.org/0000-0002-6035-5941"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Libin Hu","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Electric Power Research Institute, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Electric Power Research Institute, Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013637226","display_name":"Wenjun Zhou","orcid":"https://orcid.org/0000-0002-7532-9092"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjun Zhou","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-7532-9092","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101493272","display_name":"Chengke Zhou","orcid":"https://orcid.org/0000-0002-5749-1221"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengke Zhou","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0002-5749-1221","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.3921,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.81028804,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"68453","last_page":"68461"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ground","display_name":"Ground","score":0.7838548421859741},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5615428686141968},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5100563168525696},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4713577330112457},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.468097448348999},{"id":"https://openalex.org/keywords/earthing-system","display_name":"Earthing system","score":0.4530101716518402},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4172670841217041},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3960284888744354},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3597772717475891},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.32906678318977356},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3254663348197937},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.26646649837493896},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25723394751548767},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20432734489440918}],"concepts":[{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.7838548421859741},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5615428686141968},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5100563168525696},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4713577330112457},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.468097448348999},{"id":"https://openalex.org/C78779171","wikidata":"https://www.wikidata.org/wiki/Q432571","display_name":"Earthing system","level":3,"score":0.4530101716518402},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4172670841217041},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3960284888744354},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3597772717475891},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.32906678318977356},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3254663348197937},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.26646649837493896},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25723394751548767},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20432734489440918},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3292542","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3292542","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10173528.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1fdf03362f26490496b2ead0e5b43568","is_oa":true,"landing_page_url":"https://doaj.org/article/1fdf03362f26490496b2ead0e5b43568","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 68453-68461 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3292542","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3292542","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10173528.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8217168021","display_name":null,"funder_award_id":"5700-202118195A-0-0-00","funder_id":"https://openalex.org/F4320326707","funder_display_name":"State Grid Corporation of China"}],"funders":[{"id":"https://openalex.org/F4320326707","display_name":"State Grid Corporation of China","ror":"https://ror.org/05twwhs70"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4383220050.pdf","grobid_xml":"https://content.openalex.org/works/W4383220050.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W2026237687","https://openalex.org/W2044943974","https://openalex.org/W2062193930","https://openalex.org/W2079730059","https://openalex.org/W2088710413","https://openalex.org/W2149468396","https://openalex.org/W2154540401","https://openalex.org/W2587187677","https://openalex.org/W2727295975","https://openalex.org/W2756175914","https://openalex.org/W2768750515","https://openalex.org/W2921785066","https://openalex.org/W2945295406","https://openalex.org/W2964547918","https://openalex.org/W2969453281","https://openalex.org/W3023493468","https://openalex.org/W3157404375","https://openalex.org/W3160060689","https://openalex.org/W4214887379","https://openalex.org/W4313452915","https://openalex.org/W4313555230","https://openalex.org/W4318148675"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2378322660","https://openalex.org/W4385725068","https://openalex.org/W2791418361","https://openalex.org/W2389897298","https://openalex.org/W2586827281","https://openalex.org/W2056200293","https://openalex.org/W2989957204","https://openalex.org/W4383738205","https://openalex.org/W4327774109"],"abstract_inverted_index":{"Sheath":[0],"currents":[1,23,94,101,111],"in":[2,29,102,130,162],"high":[3],"voltage":[4],"cable":[5,19,52],"circuits":[6],"have":[7],"proven":[8],"to":[9,88,120,150,186],"be":[10,140,187],"one":[11],"of":[12,39,50,62,68,92,99,104,112,127,146,180],"the":[13,37,46,51,59,73,97,105,109,122,125,137,144,147,151,181,193],"most":[14],"convenient":[15],"indicators":[16],"for":[17,158,169],"assessing":[18],"health.":[20],"The":[21,133,178],"sheath":[22,80,93,100,114,175],"are":[24,118],"regularly":[25],"distributed":[26],"with":[27,192],"fluctuation":[28],"a":[30,159,170],"certain":[31],"range":[32],"under":[33],"normal":[34],"conditions,":[35],"while":[36],"principle":[38],"distribution":[40,91],"characteristics":[41],"is":[42,54,86,154,183],"still":[43],"unclear":[44],"when":[45,143],"cross-bonded":[47],"grounding":[48,63,76],"system":[49,64,77],"circuit":[53,69],"abnormal.":[55],"This":[56],"paper":[57],"classifies":[58],"common":[60],"defects":[61],"into":[65],"three":[66],"types":[67],"topologies":[70],"and":[71,79,108,176],"analyzes":[72],"correspondence":[74],"between":[75,173],"conditions":[78],"currents.":[81],"A":[82],"fault":[83,128,148],"diagnosis":[84],"method":[85,138,182],"proposed":[87],"detect":[89],"irregular":[90],"by":[95,190],"quantifying":[96],"difference":[98],"each":[103,113,131],"minor":[106],"sections":[107],"average":[110],"loop.":[115],"Sensitive":[116],"analyses":[117],"provided":[119],"evaluate":[121],"criteria,":[123],"clarifying":[124],"influence":[126],"resistance":[129,149,153],"defect.":[132],"results":[134],"show":[135],"that":[136],"can":[139],"very":[141,188],"effective":[142],"ratio":[145],"earth":[152],"less":[155,166],"than":[156,167],"7.6":[157],"short-circuit":[160,171],"defect":[161,172],"metallic":[163,174],"sheath,":[164],"or":[165],"1.2":[168],"ground.":[177],"performance":[179],"also":[184],"shown":[185],"efficient":[189],"evaluation":[191],"data":[194],"collected":[195],"on":[196],"site.":[197]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-14T08:27:34.040176","created_date":"2025-10-10T00:00:00"}