{"id":"https://openalex.org/W4382138777","doi":"https://doi.org/10.1109/access.2023.3289536","title":"3D-AmplifAI: An Ensemble Machine Learning Approach to Digital Twin Fault Monitoring for Additive Manufacturing in Smart Factories","display_name":"3D-AmplifAI: An Ensemble Machine Learning Approach to Digital Twin Fault Monitoring for Additive Manufacturing in Smart Factories","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4382138777","doi":"https://doi.org/10.1109/access.2023.3289536"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3289536","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3289536","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10163806.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10163806.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022474498","display_name":"Gabriel Avelino Sampedro","orcid":"https://orcid.org/0000-0003-2354-4409"},"institutions":[{"id":"https://openalex.org/I97002122","display_name":"University of the Philippines Open University","ror":"https://ror.org/00k27aj44","country_code":"PH","type":"education","lineage":["https://openalex.org/I103911934","https://openalex.org/I97002122"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Gabriel Avelino R. Sampedro","raw_affiliation_strings":["Faculty of Information and Communication Studies, University of the Philippines Open University, Los Baños, Philippines","Center for Computational Imaging and Visual Innovations, 2401 Taft Ave, Malate, Manila, Philippines"],"raw_orcid":"https://orcid.org/0000-0003-2354-4409","affiliations":[{"raw_affiliation_string":"Faculty of Information and Communication Studies, University of the Philippines Open University, Los Baños, Philippines","institution_ids":["https://openalex.org/I97002122"]},{"raw_affiliation_string":"Center for Computational Imaging and Visual Innovations, 2401 Taft Ave, Malate, Manila, Philippines","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088661374","display_name":"Made Adi Paramartha Putra","orcid":"https://orcid.org/0000-0002-6024-941X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Made Adi Paramartha Putra","raw_affiliation_strings":["Informatic Engineering, STMIK Primakara, Denpasar, Bali, Indonesia"],"raw_orcid":"https://orcid.org/0000-0002-6024-941X","affiliations":[{"raw_affiliation_string":"Informatic Engineering, STMIK Primakara, Denpasar, Bali, Indonesia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005359226","display_name":"Mideth Abisado","orcid":"https://orcid.org/0000-0003-4215-7260"},"institutions":[{"id":"https://openalex.org/I4210090490","display_name":"National University","ror":"https://ror.org/000a8qk84","country_code":"PH","type":"education","lineage":["https://openalex.org/I4210090490"]}],"countries":["PH"],"is_corresponding":false,"raw_author_name":"Mideth Abisado","raw_affiliation_strings":["College of Computing and Information Technologies, National University, Manila, Philippines"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computing and Information Technologies, National University, Manila, Philippines","institution_ids":["https://openalex.org/I4210090490"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":4.235,"has_fulltext":true,"cited_by_count":24,"citation_normalized_percentile":{"value":0.94161088,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"11","issue":null,"first_page":"64128","last_page":"64140"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9736999869346619,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.662602424621582},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4860568344593048},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.48603636026382446},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4599780738353729},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3346917927265167}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.662602424621582},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4860568344593048},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.48603636026382446},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4599780738353729},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3346917927265167},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3289536","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3289536","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10163806.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:487744e341cb4fe2849ec0ba6eb8b761","is_oa":true,"landing_page_url":"https://doaj.org/article/487744e341cb4fe2849ec0ba6eb8b761","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 64128-64140 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3289536","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3289536","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10163806.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4382138777.pdf","grobid_xml":"https://content.openalex.org/works/W4382138777.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W2563851806","https://openalex.org/W2688991736","https://openalex.org/W2763360799","https://openalex.org/W2792444131","https://openalex.org/W2884884892","https://openalex.org/W2913961714","https://openalex.org/W2921177911","https://openalex.org/W2941045572","https://openalex.org/W2948689530","https://openalex.org/W2965371380","https://openalex.org/W2971126969","https://openalex.org/W2982090245","https://openalex.org/W3042091195","https://openalex.org/W3043532440","https://openalex.org/W3049618663","https://openalex.org/W3108357941","https://openalex.org/W3109763490","https://openalex.org/W3110860842","https://openalex.org/W3111672935","https://openalex.org/W3124069985","https://openalex.org/W3132706216","https://openalex.org/W3155365748","https://openalex.org/W3159340044","https://openalex.org/W3159781293","https://openalex.org/W3166337110","https://openalex.org/W3179393873","https://openalex.org/W3195402235","https://openalex.org/W4205789773","https://openalex.org/W4212788917","https://openalex.org/W4213201928","https://openalex.org/W4214941433","https://openalex.org/W4281612093","https://openalex.org/W4311253042","https://openalex.org/W4311628379","https://openalex.org/W4312844218","https://openalex.org/W4313378983","https://openalex.org/W4317888767","https://openalex.org/W4319067334","https://openalex.org/W6789086193","https://openalex.org/W6849575058"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W3046775127","https://openalex.org/W3107602296","https://openalex.org/W3170094116","https://openalex.org/W4386462264","https://openalex.org/W4313488044","https://openalex.org/W3209574120","https://openalex.org/W4312192474","https://openalex.org/W4210805261"],"abstract_inverted_index":{"In":[0,21],"the":[1,4,22,47,73,79,103,106,110,139,143],"digital":[2,5,42,95],"age,":[3],"twin":[6,96],"eliminates":[7],"physical":[8,107],"barriers":[9],"and":[10,18,33,65,134,152],"risks,":[11],"facilitating":[12],"seamless":[13],"activities":[14],"in":[15,55,91,146],"both":[16],"real":[17],"virtual":[19,111],"worlds.":[20],"context":[23],"of":[24,142,148],"additive":[25],"manufacturing,":[26],"testing":[27],"3D":[28,56,92],"printers":[29],"can":[30],"be":[31],"resource-intensive":[32],"prone":[34],"to":[35,68,72,87,109],"printing":[36],"issues.":[37],"This":[38],"research":[39],"introduces":[40],"a":[41],"twin-based":[43],"system":[44,59],"that":[45],"employs":[46],"innovative":[48],"ensemble":[49,77],"3D-AmplifAI":[50,80,144],"algorithm":[51,81,145],"for":[52],"fault":[53,89],"monitoring":[54],"printers.":[57,93],"The":[58,94],"continuously":[60],"monitors":[61],"real-time":[62],"temperature":[63],"values":[64],"detects":[66],"faults":[67],"prevent":[69],"potential":[70],"damage":[71],"printer.":[74],"Through":[75],"an":[76],"method,":[78],"combines":[82],"multiple":[83],"machine":[84],"learning":[85],"models":[86],"enhance":[88],"detection":[90],"environment,":[97],"developed":[98],"using":[99],"Unity,":[100],"serves":[101],"as":[102],"bridge":[104],"connecting":[105],"printer":[108],"world.":[112],"Comparative":[113],"evaluations":[114],"against":[115],"state-of-the-art":[116],"algorithms,":[117],"including":[118],"Ridge":[119,136],"Regression,":[120,130,137],"XGBoost,":[121,132],"InceptionTime,":[122],"Time":[123],"Series":[124],"Transformer":[125],"(TST),":[126],"Rocket":[127,131,135],"Ridge,":[128],"Logistic":[129],"ResNet,":[133],"demonstrate":[138],"superior":[140],"performance":[141],"terms":[147],"accuracy,":[149],"precision,":[150],"recall,":[151],"F1-score.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":10}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}