{"id":"https://openalex.org/W4377861933","doi":"https://doi.org/10.1109/access.2023.3279109","title":"Using Modified Diffusion Models for Reliability Estimation of Open Source Software","display_name":"Using Modified Diffusion Models for Reliability Estimation of Open Source Software","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4377861933","doi":"https://doi.org/10.1109/access.2023.3279109"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3279109","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3279109","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10131930.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10131930.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004948564","display_name":"Kuan\u2010Ju Chen","orcid":"https://orcid.org/0000-0002-6918-7497"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kuan-Ju Chen","raw_affiliation_strings":["Garmin, Taoyuan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Garmin, Taoyuan, Taiwan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018423117","display_name":"Chin\u2010Yu Huang","orcid":"https://orcid.org/0000-0003-4931-4572"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chin-Yu Huang","raw_affiliation_strings":["Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-4931-4572","affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6115,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.7421024,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"11","issue":null,"first_page":"51631","last_page":"51646"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7827659845352173},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.761645495891571},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7601258754730225},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.551066517829895},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5493559241294861},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5446932911872864},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5135433673858643},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.5075191259384155},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5064257383346558},{"id":"https://openalex.org/keywords/goal-driven-software-development-process","display_name":"Goal-Driven Software Development Process","score":0.4910297393798828},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48750707507133484},{"id":"https://openalex.org/keywords/software-metric","display_name":"Software metric","score":0.47410163283348083},{"id":"https://openalex.org/keywords/source-code","display_name":"Source code","score":0.4627665579319},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4464940130710602},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.44532978534698486},{"id":"https://openalex.org/keywords/code-reuse","display_name":"Code reuse","score":0.43244630098342896},{"id":"https://openalex.org/keywords/software-sizing","display_name":"Software sizing","score":0.42555534839630127},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.4210456609725952},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.37819287180900574},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.36777353286743164},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2282690405845642},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08710575103759766}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7827659845352173},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.761645495891571},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7601258754730225},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.551066517829895},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5493559241294861},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5446932911872864},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5135433673858643},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.5075191259384155},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5064257383346558},{"id":"https://openalex.org/C42669973","wikidata":"https://www.wikidata.org/wiki/Q5575145","display_name":"Goal-Driven Software Development Process","level":5,"score":0.4910297393798828},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48750707507133484},{"id":"https://openalex.org/C82214349","wikidata":"https://www.wikidata.org/wiki/Q657339","display_name":"Software metric","level":5,"score":0.47410163283348083},{"id":"https://openalex.org/C43126263","wikidata":"https://www.wikidata.org/wiki/Q128751","display_name":"Source code","level":2,"score":0.4627665579319},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4464940130710602},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.44532978534698486},{"id":"https://openalex.org/C2778583558","wikidata":"https://www.wikidata.org/wiki/Q771245","display_name":"Code reuse","level":3,"score":0.43244630098342896},{"id":"https://openalex.org/C201515116","wikidata":"https://www.wikidata.org/wiki/Q7554363","display_name":"Software sizing","level":5,"score":0.42555534839630127},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.4210456609725952},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.37819287180900574},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.36777353286743164},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2282690405845642},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08710575103759766},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3279109","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3279109","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10131930.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9a49cbf145e24dd9b651f1cc6b0d25d3","is_oa":true,"landing_page_url":"https://doaj.org/article/9a49cbf145e24dd9b651f1cc6b0d25d3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 51631-51646 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3279109","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3279109","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10131930.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4099999964237213,"display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G1791495138","display_name":null,"funder_award_id":"MOST 111-2221-E-007-079-MY3","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G2258473804","display_name":null,"funder_award_id":"MOST 110-2221-E-007-035-MY3","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G2314742645","display_name":null,"funder_award_id":"MOST 110-2221-E-007-035-MY3","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G3133749433","display_name":null,"funder_award_id":"MOST 111-2221-E-007-079-MY3","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"}],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"},{"id":"https://openalex.org/F4320331164","display_name":"National Science and Technology Council","ror":"https://ror.org/00wnb9798"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4377861933.pdf","grobid_xml":"https://content.openalex.org/works/W4377861933.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W4233994","https://openalex.org/W130666128","https://openalex.org/W1505037116","https://openalex.org/W1975035677","https://openalex.org/W1980539682","https://openalex.org/W1985084886","https://openalex.org/W1998064952","https://openalex.org/W2063161197","https://openalex.org/W2104301886","https://openalex.org/W2106493978","https://openalex.org/W2106624542","https://openalex.org/W2109942136","https://openalex.org/W2109943392","https://openalex.org/W2116537371","https://openalex.org/W2120079909","https://openalex.org/W2126494702","https://openalex.org/W2141619592","https://openalex.org/W2153242493","https://openalex.org/W2169813250","https://openalex.org/W2338874947","https://openalex.org/W2566269897","https://openalex.org/W2769494974","https://openalex.org/W2791892807","https://openalex.org/W2808446790","https://openalex.org/W2913040896","https://openalex.org/W2965321968","https://openalex.org/W3016157747","https://openalex.org/W3022734214","https://openalex.org/W3046414663","https://openalex.org/W3121539207","https://openalex.org/W3200406765","https://openalex.org/W4214844639","https://openalex.org/W4226013350","https://openalex.org/W4253543067","https://openalex.org/W4291316485","https://openalex.org/W4302564868","https://openalex.org/W4312762512","https://openalex.org/W6600169813","https://openalex.org/W6781595738"],"related_works":["https://openalex.org/W2133647383","https://openalex.org/W2140677443","https://openalex.org/W1827121353","https://openalex.org/W2162125807","https://openalex.org/W1783181642","https://openalex.org/W2439389792","https://openalex.org/W2739365324","https://openalex.org/W2908350684","https://openalex.org/W2546654343","https://openalex.org/W2014920811"],"abstract_inverted_index":{"Software":[0],"development":[1,28],"is":[2,19,29,50,66,120,209],"a":[3,48,67,115],"highly":[4],"unpredictable":[5],"process,":[6],"and":[7,11,42,84,98,170,211,234,238],"ensuring":[8],"software":[9,27,90,181,206,260],"quality":[10],"reliability":[12,91],"before":[13],"releasing":[14],"it":[15,119],"to":[16,122,165,173,257,261],"the":[17,23,30,80,101,124,159,176,191,197,221,227,229,239,245,254,259,262],"market":[18,242],"crucial.":[20],"One":[21],"of":[22,32,74,126,178,201,224,241],"common":[24],"practices":[25],"during":[26],"reuse":[31],"code.":[33],"It":[34],"can":[35,194,252],"be":[36,147],"achieved":[37],"by":[38],"utilizing":[39],"libraries,":[40],"frameworks,":[41],"other":[43,62],"reusable":[44],"components.":[45],"Practically,":[46],"when":[47],"fault":[49,83,113,198],"detected":[51],"in":[52,61,100,226],"replicated":[53],"code,":[54],"developers":[55,77,108,251],"must":[56,78],"check":[57],"for":[58,244],"similar":[59],"faults":[60,129,225],"copies,":[63],"as":[64,150],"there":[65],"dependency":[68],"between":[69],"faults.":[70,88],"To":[71],"prevent":[72],"recurrence":[73],"observed":[75],"failures,":[76],"remove":[79],"corresponding":[81],"leading":[82],"any":[85],"related":[86],"dependent":[87],"Many":[89],"growth":[92],"models":[93,162,193],"(SRGMs)":[94],"have":[95],"been":[96],"proposed":[97,164,192,210],"studied":[99],"past,":[102],"but":[103],"most":[104],"SRGMs":[105,138],"assume":[106],"that":[107,130,143,190],"usually":[109],"detect":[110],"only":[111],"one":[112],"causing":[114],"failure.":[116],"In":[117,156],"actuality,":[118],"necessary":[121],"consider":[123],"possibility":[125],"detecting":[127],"multiple":[128],"may":[131,144],"share":[132],"similarities":[133],"or":[134],"dependencies.":[135],"Additionally,":[136],"some":[137,218],"rely":[139],"on":[140],"specific":[141],"assumptions":[142],"not":[145],"always":[146],"valid,":[148],"such":[149],"perfect":[151],"debugging":[152],"and/or":[153],"immediate":[154],"debugging.":[155],"this":[157],"study,":[158],"modified":[160],"diffusion":[161],"are":[163,171],"handle":[166],"these":[167,249],"unrealistic":[168],"situations,":[169],"expected":[172],"better":[174],"capture":[175],"dynamics":[177],"open":[179],"source":[180],"(OSS)":[182],"development.":[183],"Experiments":[184],"using":[185],"real":[186],"OSS":[187],"data":[188],"show":[189],"accurately":[195],"describe":[196],"correction":[199],"process":[200],"OSS.":[202],"Finally,":[203],"an":[204],"optimal":[205,255],"release":[207,258],"policy":[208,214],"studied.":[212],"This":[213],"takes":[215],"into":[216],"account":[217],"factors,":[219,250],"including":[220],"remaining":[222],"number":[223],"software,":[228],"expenses":[230],"associated":[231],"with":[232],"identifying":[233],"rectifying":[235],"those":[236],"faults,":[237],"level":[240],"demand":[243],"software.":[246],"By":[247],"considering":[248],"determine":[253],"time":[256],"market.":[263]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}