{"id":"https://openalex.org/W4321780078","doi":"https://doi.org/10.1109/access.2023.3248238","title":"Interactive Visual Inspection of a Rough-Alignment Plastic Part Based on HLAC Features and One-Class SVM","display_name":"Interactive Visual Inspection of a Rough-Alignment Plastic Part Based on HLAC Features and One-Class SVM","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4321780078","doi":"https://doi.org/10.1109/access.2023.3248238"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3248238","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3248238","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2023.3248238","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089342152","display_name":"Taiga Eguchi","orcid":"https://orcid.org/0000-0002-3248-6418"},"institutions":[{"id":"https://openalex.org/I177136067","display_name":"Saga University","ror":"https://ror.org/04f4wg107","country_code":"JP","type":"education","lineage":["https://openalex.org/I177136067"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taiga Eguchi","raw_affiliation_strings":["Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan"],"raw_orcid":"https://orcid.org/0000-0002-3248-6418","affiliations":[{"raw_affiliation_string":"Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan","institution_ids":["https://openalex.org/I177136067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040208746","display_name":"Wen Liang Yeoh","orcid":"https://orcid.org/0000-0003-1272-9010"},"institutions":[{"id":"https://openalex.org/I177136067","display_name":"Saga University","ror":"https://ror.org/04f4wg107","country_code":"JP","type":"education","lineage":["https://openalex.org/I177136067"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wen Liang Yeoh","raw_affiliation_strings":["Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan"],"raw_orcid":"https://orcid.org/0000-0003-1272-9010","affiliations":[{"raw_affiliation_string":"Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan","institution_ids":["https://openalex.org/I177136067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112676396","display_name":"Hiroshi Okumura","orcid":null},"institutions":[{"id":"https://openalex.org/I177136067","display_name":"Saga University","ror":"https://ror.org/04f4wg107","country_code":"JP","type":"education","lineage":["https://openalex.org/I177136067"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Okumura","raw_affiliation_strings":["Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan","institution_ids":["https://openalex.org/I177136067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038267059","display_name":"Nobuhiko Yamaguchi","orcid":"https://orcid.org/0000-0001-6172-4238"},"institutions":[{"id":"https://openalex.org/I177136067","display_name":"Saga University","ror":"https://ror.org/04f4wg107","country_code":"JP","type":"education","lineage":["https://openalex.org/I177136067"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuhiko Yamaguchi","raw_affiliation_strings":["Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan"],"raw_orcid":"https://orcid.org/0000-0001-6172-4238","affiliations":[{"raw_affiliation_string":"Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan","institution_ids":["https://openalex.org/I177136067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055282364","display_name":"Osamu Fukuda","orcid":"https://orcid.org/0000-0002-8022-7314"},"institutions":[{"id":"https://openalex.org/I177136067","display_name":"Saga University","ror":"https://ror.org/04f4wg107","country_code":"JP","type":"education","lineage":["https://openalex.org/I177136067"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Osamu Fukuda","raw_affiliation_strings":["Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan"],"raw_orcid":"https://orcid.org/0000-0002-8022-7314","affiliations":[{"raw_affiliation_string":"Department of Information Science, Graduate School of Science and Engineering, Saga University, Saga, Japan","institution_ids":["https://openalex.org/I177136067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7524,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.75173812,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"11","issue":null,"first_page":"19579","last_page":"19590"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9796000123023987,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9631999731063843,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7406137585639954},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6862659454345703},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6118728518486023},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.5811106562614441},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5783035159111023},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5216865539550781},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.4578506052494049},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.44188469648361206},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.4145738482475281},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14569711685180664},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1426488161087036},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.07388189435005188}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7406137585639954},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6862659454345703},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6118728518486023},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.5811106562614441},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5783035159111023},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5216865539550781},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.4578506052494049},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.44188469648361206},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.4145738482475281},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14569711685180664},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1426488161087036},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.07388189435005188},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3248238","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3248238","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9da4f2694dc348f19a251ea36db3f4a2","is_oa":true,"landing_page_url":"https://doaj.org/article/9da4f2694dc348f19a251ea36db3f4a2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 19579-19590 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3248238","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3248238","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320334789","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W56743589","https://openalex.org/W1980262437","https://openalex.org/W1995443851","https://openalex.org/W2004313226","https://openalex.org/W2020801541","https://openalex.org/W2026445526","https://openalex.org/W2064353911","https://openalex.org/W2093440842","https://openalex.org/W2108598243","https://openalex.org/W2132870739","https://openalex.org/W2294798173","https://openalex.org/W2296719434","https://openalex.org/W2309754896","https://openalex.org/W2622826443","https://openalex.org/W2963037989","https://openalex.org/W2964154897","https://openalex.org/W2997591727","https://openalex.org/W4206696821","https://openalex.org/W4225164818","https://openalex.org/W4238856144","https://openalex.org/W4254182148","https://openalex.org/W6602288617","https://openalex.org/W6604815279"],"related_works":["https://openalex.org/W1975632186","https://openalex.org/W3027745756","https://openalex.org/W3205213561","https://openalex.org/W2531880140","https://openalex.org/W2036609560","https://openalex.org/W346861917","https://openalex.org/W3024018414","https://openalex.org/W2126145365","https://openalex.org/W2549539969","https://openalex.org/W146464311"],"abstract_inverted_index":{"Modern":[0],"production":[1,51,71],"lines":[2],"for":[3,76],"molded":[4],"plastic":[5,122],"parts":[6,15,45,174],"often":[7],"have":[8,24],"automated":[9],"inspection":[10,22,88,140,144],"systems":[11,23],"to":[12,30,109,190],"detect":[13],"defective":[14],"reliably":[16],"and":[17,27,64,79,104,112,120,128,135,142,155],"efficiently.":[18],"However,":[19],"these":[20],"conventional":[21],"low":[25],"flexibility":[26],"versatility,":[28],"leading":[29],"difficulties":[31],"when":[32,39,83],"dealing":[33],"with":[34,97,163],"complicated":[35],"requests":[36],"such":[37],"as":[38],"small":[40],"quantities":[41],"of":[42,70,172],"many":[43],"different":[44],"are":[46],"manufactured":[47],"on":[48],"the":[49,74,114,138],"same":[50],"line.":[52],"The":[53,87],"proposed":[54],"system":[55,141],"can":[56,186],"be":[57,187],"implemented":[58],"quickly":[59],"using":[60],"low-cost":[61],"off-the-shelf":[62],"components":[63],"does":[65],"not":[66],"require":[67],"accurate":[68],"alignment":[69],"parts,":[72],"reducing":[73],"need":[75],"manual":[77,143,191],"inspections":[78,158],"increasing":[80],"work":[81],"efficiency":[82],"handling":[84],"complex":[85],"workloads.":[86],"algorithm":[89],"combines":[90],"Higher-order":[91],"Local":[92],"Auto":[93],"Correlation":[94],"(HLAC)":[95],"features":[96],"One-class":[98],"Support":[99],"Vector":[100],"Machine":[101],"(One-class":[102],"SVM)":[103],"Principal":[105],"Component":[106],"Analysis":[107],"(PCA)":[108],"extract,":[110],"transform,":[111],"classify":[113],"differential":[115],"feature":[116],"vector":[117],"between":[118,137],"conforming":[119,167],"nonconforming":[121,170],"parts.":[123],"To":[124],"verify":[125],"its":[126],"validity":[127],"effectiveness,":[129],"we":[130],"compared":[131],"defect":[132],"detection":[133],"accuracy":[134,148],"speed":[136,156,185],"developed":[139],"experimentally.":[145],"Extremely":[146],"high":[147],"(Recall":[149],"=":[150,153],"0.93,":[151],"Specificity":[152],"1.00)":[154],"(10":[157],"in":[159,184],"30[sec])":[160],"was":[161],"obtained":[162],"7":[164],"types":[165],"(1":[166],"type,":[168],"6":[169],"types)":[171],"sample":[173],"(30":[175],"samples":[176],"each).":[177],"We":[178],"demonstrated":[179],"a":[180],"400":[181],"%":[182],"increase":[183],"gained":[188],"relative":[189],"inspection.":[192]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}