{"id":"https://openalex.org/W4322707012","doi":"https://doi.org/10.1109/access.2023.3247449","title":"Reliability Analysis for k-out-of-N: F Load Sharing Systems Operating in a Shock Environment","display_name":"Reliability Analysis for k-out-of-N: F Load Sharing Systems Operating in a Shock Environment","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4322707012","doi":"https://doi.org/10.1109/access.2023.3247449"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3247449","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3247449","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10049564.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10049564.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057001246","display_name":"Xinqian Huang","orcid":"https://orcid.org/0000-0002-4297-5215"},"institutions":[{"id":"https://openalex.org/I4210136246","display_name":"China Telecom (China)","ror":"https://ror.org/03jgnzt20","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210136246"]},{"id":"https://openalex.org/I4387153335","display_name":"China Telecom","ror":"https://ror.org/05p67dv18","country_code":null,"type":"company","lineage":["https://openalex.org/I4387153335"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinqian Huang","raw_affiliation_strings":["Research Institute of China Telecom Corporation Ltd., Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4297-5215","affiliations":[{"raw_affiliation_string":"Research Institute of China Telecom Corporation Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210136246","https://openalex.org/I4387153335"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047954827","display_name":"Liang Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136246","display_name":"China Telecom (China)","ror":"https://ror.org/03jgnzt20","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210136246"]},{"id":"https://openalex.org/I4387153335","display_name":"China Telecom","ror":"https://ror.org/05p67dv18","country_code":null,"type":"company","lineage":["https://openalex.org/I4387153335"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Xu","raw_affiliation_strings":["Research Institute of China Telecom Corporation Ltd., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of China Telecom Corporation Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210136246","https://openalex.org/I4387153335"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100328946","display_name":"Ying Huang","orcid":"https://orcid.org/0000-0003-4246-1895"},"institutions":[{"id":"https://openalex.org/I4210136246","display_name":"China Telecom (China)","ror":"https://ror.org/03jgnzt20","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210136246"]},{"id":"https://openalex.org/I4387153335","display_name":"China Telecom","ror":"https://ror.org/05p67dv18","country_code":null,"type":"company","lineage":["https://openalex.org/I4387153335"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Huang","raw_affiliation_strings":["Research Institute of China Telecom Corporation Ltd., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of China Telecom Corporation Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210136246","https://openalex.org/I4387153335"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065285170","display_name":"Yisong Fang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136246","display_name":"China Telecom (China)","ror":"https://ror.org/03jgnzt20","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210136246"]},{"id":"https://openalex.org/I4387153335","display_name":"China Telecom","ror":"https://ror.org/05p67dv18","country_code":null,"type":"company","lineage":["https://openalex.org/I4387153335"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yisong Fang","raw_affiliation_strings":["Research Institute of China Telecom Corporation Ltd., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of China Telecom Corporation Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210136246","https://openalex.org/I4387153335"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.1157,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.85239024,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"18227","last_page":"18233"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.7419706583023071},{"id":"https://openalex.org/keywords/shock","display_name":"Shock (circulatory)","score":0.47265636920928955},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45112672448158264},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.419908344745636},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38270679116249084},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3720996081829071},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.3576464056968689},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.1370105743408203},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13615214824676514}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.7419706583023071},{"id":"https://openalex.org/C2781300812","wikidata":"https://www.wikidata.org/wiki/Q178061","display_name":"Shock (circulatory)","level":2,"score":0.47265636920928955},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45112672448158264},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.419908344745636},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38270679116249084},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3720996081829071},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.3576464056968689},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.1370105743408203},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13615214824676514},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3247449","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3247449","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10049564.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:42c295fd19064c73aaafae5033f6a4f1","is_oa":true,"landing_page_url":"https://doaj.org/article/42c295fd19064c73aaafae5033f6a4f1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 18227-18233 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3247449","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3247449","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10049564.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4322707012.pdf","grobid_xml":"https://content.openalex.org/works/W4322707012.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W2013016201","https://openalex.org/W2068801593","https://openalex.org/W2152141945","https://openalex.org/W2402208654","https://openalex.org/W2764312179","https://openalex.org/W2766163420","https://openalex.org/W2776759394","https://openalex.org/W2884441493","https://openalex.org/W2963171190","https://openalex.org/W2968402075","https://openalex.org/W3002986213","https://openalex.org/W3009975361","https://openalex.org/W3111040263","https://openalex.org/W3134398084","https://openalex.org/W3139209805","https://openalex.org/W3157418237","https://openalex.org/W3176595721","https://openalex.org/W3196997366","https://openalex.org/W3203870289","https://openalex.org/W4283784526","https://openalex.org/W4284990188","https://openalex.org/W4292820483","https://openalex.org/W4297182578"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2051487156","https://openalex.org/W2504004674","https://openalex.org/W1987679298","https://openalex.org/W2073681303","https://openalex.org/W2963177394","https://openalex.org/W4313359513","https://openalex.org/W2498744856","https://openalex.org/W4390482104","https://openalex.org/W322408318"],"abstract_inverted_index":{"This":[0],"paper":[1],"studies":[2],"a":[3,13,17,21,69],"reliability":[4,112],"modeling":[5],"for":[6],"a$k$-out-of-$n$:$F$load":[7],"sharing":[8,35],"system":[9,18,36,67,79,91,111,119],"that":[10],"operates":[11],"in":[12,113],"shock":[14,55,61,71],"environment.":[15],"Such":[16],"consists":[19],"of":[20,32,84,125],"protective":[22,44,98],"device":[23,99],"and$n$components":[24],"with":[25],"load":[26],"sharing.":[27],"The":[28,78],"base":[29,74],"hazard":[30,75],"rate":[31,76],"the":[33,43,66,73,82,90,97,126],"loading":[34],"is":[37,87,107,120],"affected":[38],"by":[39],"random":[40],"shocks":[41,47,95],"and":[42,56],"device.":[45],"Random":[46],"can":[48],"be":[49],"classified":[50],"into":[51],"two":[52],"types:":[53],"invalid":[54,60],"valid":[57,70],"shock.":[58],"An":[59],"has":[62],"no":[63],"influence":[64],"on":[65],"whereas":[68],"makes":[72],"larger.":[77],"fails,":[80,100],"if":[81],"number":[83],"failed":[85],"components":[86],"at":[88,93],"least$k$,":[89],"suffers":[92],"least$M$random":[94],"or":[96],"whichever":[101],"occurs":[102],"first.":[103],"A":[104,116],"Markov":[105],"process":[106],"used":[108],"to":[109,122],"evaluate":[110],"this":[114],"paper.":[115],"distributed":[117],"computer":[118],"given":[121],"show":[123],"application":[124],"proposed":[127],"model.":[128]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":4}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}