{"id":"https://openalex.org/W4317795314","doi":"https://doi.org/10.1109/access.2023.3239397","title":"Reduction of Surface Reflection on Dielectric Lens Antenna by Matching Periodic Square-Pillars in 300-GHz Band","display_name":"Reduction of Surface Reflection on Dielectric Lens Antenna by Matching Periodic Square-Pillars in 300-GHz Band","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4317795314","doi":"https://doi.org/10.1109/access.2023.3239397"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3239397","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3239397","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024932.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024932.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027648665","display_name":"Bazilah Baharom","orcid":"https://orcid.org/0000-0003-3193-6197"},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Bazilah Baharom","raw_affiliation_strings":["Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3193-6197","affiliations":[{"raw_affiliation_string":"Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110762023","display_name":"Ryota Ishihara","orcid":null},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryota Ishihara","raw_affiliation_strings":["Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015507672","display_name":"Yoshiki Sugimoto","orcid":"https://orcid.org/0000-0002-3906-3207"},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiki Sugimoto","raw_affiliation_strings":["Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan"],"raw_orcid":"https://orcid.org/0000-0002-3906-3207","affiliations":[{"raw_affiliation_string":"Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062598488","display_name":"Kunio Sakakibara","orcid":"https://orcid.org/0000-0003-1106-0378"},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunio Sakakibara","raw_affiliation_strings":["Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan"],"raw_orcid":"https://orcid.org/0000-0003-1106-0378","affiliations":[{"raw_affiliation_string":"Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061424972","display_name":"Nobuyoshi Kikuma","orcid":"https://orcid.org/0000-0002-9759-8760"},"institutions":[{"id":"https://openalex.org/I197274945","display_name":"Nagoya Institute of Technology","ror":"https://ror.org/055yf1005","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuyoshi Kikuma","raw_affiliation_strings":["Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan"],"raw_orcid":"https://orcid.org/0000-0002-9759-8760","affiliations":[{"raw_affiliation_string":"Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I197274945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074513804","display_name":"Takayuki Arai","orcid":"https://orcid.org/0000-0002-3888-9576"},"institutions":[{"id":"https://openalex.org/I4210157432","display_name":"Enplas (Japan)","ror":"https://ror.org/05f9vxd34","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210157432"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Arai","raw_affiliation_strings":["Enplas Corporation, Kawaguchi, Saitama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Enplas Corporation, Kawaguchi, Saitama, Japan","institution_ids":["https://openalex.org/I4210157432"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044690148","display_name":"Takayoshi Suganuma","orcid":null},"institutions":[{"id":"https://openalex.org/I4210157432","display_name":"Enplas (Japan)","ror":"https://ror.org/05f9vxd34","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210157432"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayoshi Suganuma","raw_affiliation_strings":["Enplas Corporation, Kawaguchi, Saitama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Enplas Corporation, Kawaguchi, Saitama, Japan","institution_ids":["https://openalex.org/I4210157432"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038848973","display_name":"Tomohiro Saito","orcid":"https://orcid.org/0000-0002-9916-4640"},"institutions":[{"id":"https://openalex.org/I4210157432","display_name":"Enplas (Japan)","ror":"https://ror.org/05f9vxd34","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210157432"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomohiro Saito","raw_affiliation_strings":["Enplas Corporation, Kawaguchi, Saitama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Enplas Corporation, Kawaguchi, Saitama, Japan","institution_ids":["https://openalex.org/I4210157432"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":8.5913,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.96774831,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"8481","last_page":"8491"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7527751326560974},{"id":"https://openalex.org/keywords/lens","display_name":"Lens (geology)","score":0.6926326155662537},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6709595322608948},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5915269255638123},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.4849679470062256},{"id":"https://openalex.org/keywords/impedance-matching","display_name":"Impedance matching","score":0.4795075058937073},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.4513789415359497},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.44039711356163025},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4120174050331116},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.2522750496864319},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12154555320739746},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11492606997489929},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.11375501751899719},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11101198196411133},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09125363826751709}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7527751326560974},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.6926326155662537},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6709595322608948},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5915269255638123},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4849679470062256},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.4795075058937073},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.4513789415359497},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.44039711356163025},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4120174050331116},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.2522750496864319},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12154555320739746},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11492606997489929},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.11375501751899719},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11101198196411133},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09125363826751709},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3239397","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3239397","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024932.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:74ecc409c8c548f6831287da0f20fc22","is_oa":true,"landing_page_url":"https://doaj.org/article/74ecc409c8c548f6831287da0f20fc22","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 8481-8491 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3239397","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3239397","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024932.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5899999737739563}],"awards":[{"id":"https://openalex.org/G3723536152","display_name":null,"funder_award_id":"JPJ000254","funder_id":"https://openalex.org/F4320325628","funder_display_name":"Ministry of Internal Affairs and Communications"}],"funders":[{"id":"https://openalex.org/F4320325628","display_name":"Ministry of Internal Affairs and Communications","ror":"https://ror.org/00vs1pz50"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4317795314.pdf","grobid_xml":"https://content.openalex.org/works/W4317795314.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W151857299","https://openalex.org/W1657821752","https://openalex.org/W1774120803","https://openalex.org/W1968175153","https://openalex.org/W1983647929","https://openalex.org/W1987934231","https://openalex.org/W1992396195","https://openalex.org/W2015166141","https://openalex.org/W2015245798","https://openalex.org/W2087348897","https://openalex.org/W2093339305","https://openalex.org/W2141144756","https://openalex.org/W2328065906","https://openalex.org/W2621397492","https://openalex.org/W2742239197","https://openalex.org/W2750799886","https://openalex.org/W2890557857","https://openalex.org/W2965266769","https://openalex.org/W3027579593","https://openalex.org/W3045275502","https://openalex.org/W3126686235","https://openalex.org/W3156209060","https://openalex.org/W3176056045","https://openalex.org/W4212795796","https://openalex.org/W4313412886","https://openalex.org/W6606093201","https://openalex.org/W6742024773"],"related_works":["https://openalex.org/W2068858291","https://openalex.org/W1997532743","https://openalex.org/W2158156095","https://openalex.org/W2087970663","https://openalex.org/W2077718091","https://openalex.org/W1825698535","https://openalex.org/W1979677325","https://openalex.org/W2044094047","https://openalex.org/W1554834242","https://openalex.org/W2359137076"],"abstract_inverted_index":{"This":[0],"study":[1],"proposes":[2],"a":[3,31,113,121],"dielectric":[4,33,54,58],"lens":[5,19,29,47,59,114,134,138],"antenna":[6],"that":[7],"implements":[8],"an":[9],"impedance":[10],"matching":[11,41],"layer":[12],"comprising":[13],"square-pillar":[14,67,102,109],"periodic":[15,68,83,103,110],"structures":[16,42],"on":[17,45],"the":[18,23,28,37,40,46,52,57,66,87,97,100,108,129,133,137,143],"surface":[20,24,48,130],"to":[21,95,112,152],"reduce":[22],"reflection":[25,131],"formed":[26],"in":[27,127],"from":[30,150],"high-permittivity":[32],"material.":[34],"To":[35],"ease":[36],"fabrication":[38],"process,":[39],"(MS)":[43],"implemented":[44],"are":[49,72],"made":[50],"of":[51,65,99,116,124],"same":[53],"material":[55],"as":[56],"through":[60],"microfabrication":[61],"structure.":[62],"The":[63],"dimensions":[64],"MS":[69,104,111],"unit":[70],"cell":[71],"optimized":[73,101],"for":[74],"its":[75],"period,":[76],"space":[77],"occupancy":[78],"ratio,":[79],"and":[80,93,141],"height":[81],"using":[82],"boundary":[84],"simulation,":[85],"considering":[86],"plane":[88],"wave":[89],"incident.":[90],"Electromagnetic":[91],"simulations":[92],"experiments":[94],"evaluate":[96],"effectiveness":[98],"were":[105],"conducted.":[106],"Implementing":[107],"composed":[115],"modified-polyphenylene":[117],"ether":[118],"(modified-PPE)":[119],"with":[120,136],"relative":[122],"permittivity":[123],"5.34":[125],"assists":[126],"reducing":[128],"inside":[132],"compared":[135],"without":[139],"anti-reflection":[140],"improves":[142],"peak":[144],"gain":[145],"by":[146],"approximately":[147],"2":[148],"dB":[149],"250":[151],"290":[153],"GHz.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}