{"id":"https://openalex.org/W4317795275","doi":"https://doi.org/10.1109/access.2023.3238875","title":"Fast and Easy Sensor Adaptation With Self-Training","display_name":"Fast and Easy Sensor Adaptation With Self-Training","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4317795275","doi":"https://doi.org/10.1109/access.2023.3238875"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3238875","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3238875","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024297.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024297.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103206909","display_name":"Jinhyuk Choi","orcid":"https://orcid.org/0000-0001-9597-733X"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jinhyuk Choi","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-9597-733X","affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065259046","display_name":"Byeong\u2010Ju Lee","orcid":"https://orcid.org/0000-0002-7250-8909"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byeongju Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102386234","display_name":"Seho Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seho Shin","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110223580","display_name":"Daehyun Ji","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Daehyun Ji","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103206909"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1266,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.39040461,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"11","issue":null,"first_page":"8870","last_page":"8877"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8376955986022949},{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization (sociology)","score":0.638542115688324},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6305867433547974},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.5279594659805298},{"id":"https://openalex.org/keywords/domain-adaptation","display_name":"Domain adaptation","score":0.5008971691131592},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.473076194524765},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4549597501754761},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.45211493968963623},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4141230285167694},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3403560519218445},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07777851819992065}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8376955986022949},{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.638542115688324},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6305867433547974},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.5279594659805298},{"id":"https://openalex.org/C2776434776","wikidata":"https://www.wikidata.org/wiki/Q19246213","display_name":"Domain adaptation","level":3,"score":0.5008971691131592},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.473076194524765},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4549597501754761},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.45211493968963623},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4141230285167694},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3403560519218445},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07777851819992065},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3238875","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3238875","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024297.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c97f7c5285da4e3aa0828990d6a1df4f","is_oa":true,"landing_page_url":"https://doaj.org/article/c97f7c5285da4e3aa0828990d6a1df4f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 8870-8877 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3238875","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3238875","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10024297.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4317795275.pdf","grobid_xml":"https://content.openalex.org/works/W4317795275.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W1536680647","https://openalex.org/W2150066425","https://openalex.org/W2470642288","https://openalex.org/W2565639579","https://openalex.org/W2615178951","https://openalex.org/W2934198733","https://openalex.org/W2949813473","https://openalex.org/W2963351448","https://openalex.org/W2964115968","https://openalex.org/W3034779842","https://openalex.org/W3034937575","https://openalex.org/W3035175896","https://openalex.org/W3042609801","https://openalex.org/W3173770676","https://openalex.org/W3175466730","https://openalex.org/W3180562345","https://openalex.org/W4300479382","https://openalex.org/W4312775058","https://openalex.org/W4312993742","https://openalex.org/W4313160574","https://openalex.org/W6762818971","https://openalex.org/W6797371478"],"related_works":["https://openalex.org/W4389474468","https://openalex.org/W4300172004","https://openalex.org/W2955455867","https://openalex.org/W4321649381","https://openalex.org/W3180787869","https://openalex.org/W2997645659","https://openalex.org/W3203792196","https://openalex.org/W4295929828","https://openalex.org/W3156096827","https://openalex.org/W4287890001"],"abstract_inverted_index":{"Object":[0],"detectors":[1],"based":[2],"on":[3],"deep":[4],"neural":[5],"networks":[6],"have":[7],"the":[8,17,42,55,58,62,67,73,77,86,91,97,106,115,120,130,134,142],"disadvantage":[9],"that":[10,114,140],"new":[11],"labels":[12,40,103],"should":[13],"be":[14],"acquired":[15],"whenever":[16],"complementary":[18],"metal-oxide":[19],"semiconductor":[20],"(CMOS)":[21],"image":[22],"sensor":[23],"(CIS)":[24],"is":[25,137],"changed.":[26],"In":[27,85],"this":[28],"study,":[29],"we":[30,89],"propose":[31],"a":[32],"fast":[33],"and":[34,48,71,80,110],"easy":[35],"two-step":[36],"sensor-adaptation":[37],"method":[38,117],"without":[39],"for":[41],"target":[43,63,83,135],"domain;":[44],"1)":[45],"simple":[46],"adaptation,":[47],"2)":[49],"self-training.":[50],"The":[51],"simple-adaptation":[52,107],"process":[53],"transfers":[54],"knowledge":[56,121],"of":[57,76,82,133,141],"source":[59,78,143],"model":[60,64,93,125],"to":[61,95,126],"by":[65,105],"updating":[66],"batch":[68],"normalization":[69],"parameters,":[70],"matches":[72],"feature":[74],"distributions":[75],"domain":[79,136],"those":[81],"domain.":[84,145],"self-training":[87],"process,":[88],"employ":[90],"ensemble":[92],"strategy":[94],"mitigate":[96],"over-fitting":[98],"problem":[99],"using":[100],"noisy":[101],"pseudo":[102],"generated":[104],"model.":[108],"Quantitative":[109],"qualitative":[111],"experiments":[112],"show":[113],"proposed":[116],"can":[118],"transfer":[119],"from":[122,139],"one":[123],"CIS":[124,144],"another,":[127],"even":[128],"if":[129],"data":[131],"format":[132],"different":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}