{"id":"https://openalex.org/W4317384998","doi":"https://doi.org/10.1109/access.2023.3237913","title":"High-Powered RF SOI Switch With Fast Switching Time for TDD Mobile Applications","display_name":"High-Powered RF SOI Switch With Fast Switching Time for TDD Mobile Applications","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4317384998","doi":"https://doi.org/10.1109/access.2023.3237913"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3237913","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3237913","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10019273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10019273.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060861310","display_name":"Wonwoo Seo","orcid":"https://orcid.org/0000-0003-4727-9881"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wonwoo Seo","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4727-9881","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074661321","display_name":"Sung-Hyuk Kim","orcid":"https://orcid.org/0000-0002-7071-8128"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sunghyuk Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061774958","display_name":"Byunghun Ko","orcid":"https://orcid.org/0000-0002-8236-6596"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byunghun Ko","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064581596","display_name":"Hee\u2010Sauk Jhon","orcid":"https://orcid.org/0000-0003-0126-5230"},"institutions":[{"id":"https://openalex.org/I11893660","display_name":"Mokpo National University","ror":"https://ror.org/00v81k483","country_code":"KR","type":"education","lineage":["https://openalex.org/I11893660"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Heesauk Jhon","raw_affiliation_strings":["Department of Electrical, Information and Communication Engineering, Mokpo National University, Mokpo, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical, Information and Communication Engineering, Mokpo National University, Mokpo, South Korea","institution_ids":["https://openalex.org/I11893660"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100349755","display_name":"Junghyun Kim","orcid":"https://orcid.org/0000-0001-9424-3377"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junghyun Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-9424-3377","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Hanyang University, Ansan, South Korea","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":1.0053,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.72055249,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"7277","last_page":"7282"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rf-switch","display_name":"RF switch","score":0.7191438674926758},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.6353541016578674},{"id":"https://openalex.org/keywords/handset","display_name":"Handset","score":0.5994727611541748},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5462815165519714},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4890168607234955},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.48228171467781067},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42794156074523926},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3689783811569214},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.36610957980155945},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33395108580589294},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22778907418251038},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14126309752464294}],"concepts":[{"id":"https://openalex.org/C2781283035","wikidata":"https://www.wikidata.org/wiki/Q571939","display_name":"RF switch","level":3,"score":0.7191438674926758},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.6353541016578674},{"id":"https://openalex.org/C2779971919","wikidata":"https://www.wikidata.org/wiki/Q1378949","display_name":"Handset","level":2,"score":0.5994727611541748},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5462815165519714},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4890168607234955},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.48228171467781067},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42794156074523926},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3689783811569214},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.36610957980155945},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33395108580589294},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22778907418251038},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14126309752464294}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3237913","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3237913","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10019273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:53294a1826214981b71c59978fc4df04","is_oa":true,"landing_page_url":"https://doaj.org/article/53294a1826214981b71c59978fc4df04","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 7277-7282 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3237913","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3237913","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10019273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2348673776","display_name":null,"funder_award_id":"2021R1F1A1063002","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3079695151","display_name":null,"funder_award_id":"2021R1F1A1063002","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321142","display_name":"Hanyang University","ror":"https://ror.org/046865y68"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4317384998.pdf","grobid_xml":"https://content.openalex.org/works/W4317384998.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W1623170747","https://openalex.org/W1971709738","https://openalex.org/W2010372982","https://openalex.org/W2065668635","https://openalex.org/W2110931343","https://openalex.org/W2580916421","https://openalex.org/W2944096857","https://openalex.org/W4206243943"],"related_works":["https://openalex.org/W2621122406","https://openalex.org/W2365912011","https://openalex.org/W2743147755","https://openalex.org/W4312352150","https://openalex.org/W2123031391","https://openalex.org/W2359032066","https://openalex.org/W1510209644","https://openalex.org/W4252105747","https://openalex.org/W2146937285","https://openalex.org/W2784319604"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,45,55,190],"fast":[4,34,77],"switching":[5,35,78,121],"and":[6,21,37,80,98,108,136,147,152,167],"high-powered":[7],"single-pole":[8],"double-throw":[9],"(SPDT)":[10],"switch":[11,14,66,103,127,186],"for":[12,76,112],"RF":[13,41],"circuits,":[15],"such":[16],"as":[17],"TRx":[18],"antenna":[19],"switches":[20,28],"frequency":[22],"band":[23],"(or":[24],"operation":[25],"mode)":[26],"selection":[27],"in":[29,189],"mobile":[30],"handset":[31],"applications.":[32],"For":[33],"time":[36,79,122],"performances":[38],"of":[39,54,71,85,94,123,177],"the":[40,52,68,72,82,86,92,95,119,124],"switch,":[42],"we":[43],"proposed":[44,64,101,125],"novel":[46],"method":[47],"that":[48],"can":[49],"\u201cselectively\u201d":[50],"control":[51],"impedance":[53,70,84],"gate":[56,73,87],"biasing":[57,74,88],"circuit":[58,75,89],"(\u201chigh\u201d":[59],"or":[60],"\u201clow\u201d":[61],"impedance).":[62],"The":[63,100,132,183],"SPDT":[65,102,126,185],"use":[67,81],"low":[69],"high":[83],"to":[90,116],"avoid":[91],"degradation":[93],"insertion":[96,133],"loss":[97,138],"harmonics.":[99],"has":[104],"no":[105,109],"additional":[106],"bias":[107],"large":[110],"payment":[111],"size":[113],"consumption.":[114],"According":[115],"measurement":[117],"results,":[118],"turn-on":[120],"was$0.35~\\mu":[128],"\\text{s}$(at":[129],"2":[130,140,162,181],"GHz).":[131],"loss,":[134],"isolation,":[135],"return":[137],"at":[139,156,161,180],"GHz":[141,163],"were":[142,164],"0.16":[143],"dB,":[144,146],"47.1":[145],"24":[148],"dB":[149],"respectively.":[150,170],"2nd":[151],"3rd":[153],"harmonic":[154],"levels":[155],"25":[157],"dBm":[158,166,176],"input":[159,178],"power":[160,179],"\u221288.7":[165],"\u221278.9":[168],"dBm,":[169],"Power":[171],"handling":[172],"capability":[173],"was":[174,187],"39.5":[175],"GHz.":[182],"designed":[184],"implemented":[188],"0.13-$\\mu":[191],"\\text{m}$partially":[192],"depleted":[193],"silicon-on-insulator":[194],"(PD-SOI)":[195],"process.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}