{"id":"https://openalex.org/W4313527271","doi":"https://doi.org/10.1109/access.2022.3233812","title":"Rule-Based Design for Low-Cost Double-Node Upset Tolerant Self-Recoverable D-Latch","display_name":"Rule-Based Design for Low-Cost Double-Node Upset Tolerant Self-Recoverable D-Latch","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4313527271","doi":"https://doi.org/10.1109/access.2022.3233812"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3233812","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3233812","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10005109.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10005109.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041353543","display_name":"Seyedehsomayeh Hatefinasab","orcid":"https://orcid.org/0000-0001-7839-6939"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Seyedehsomayeh Hatefinasab","raw_affiliation_strings":["Department of Electronics and Computer Technology, University of Granada, Granada, Spain"],"raw_orcid":"https://orcid.org/0000-0001-7839-6939","affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Technology, University of Granada, Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063346077","display_name":"Alfredo Medina-Garcia","orcid":"https://orcid.org/0000-0002-9729-7052"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alfredo Medina-Garcia","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":"https://orcid.org/0000-0002-9729-7052","affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058003256","display_name":"Diego P. Morales","orcid":"https://orcid.org/0000-0002-3294-8934"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Diego P. Morales","raw_affiliation_strings":["Department of Electronics and Computer Technology, University of Granada, Granada, Spain"],"raw_orcid":"https://orcid.org/0000-0002-3294-8934","affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Technology, University of Granada, Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081322050","display_name":"Encarnaci\u00f3n Castillo","orcid":"https://orcid.org/0000-0001-6476-8105"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Encarnacion Castillo","raw_affiliation_strings":["Department of Electronics and Computer Technology, University of Granada, Granada, Spain"],"raw_orcid":"https://orcid.org/0000-0001-6476-8105","affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Technology, University of Granada, Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006605677","display_name":"Noel Rodr\u00edguez","orcid":"https://orcid.org/0000-0002-6032-6921"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Noel Rodriguez","raw_affiliation_strings":["Department of Electronics and Computer Technology, University of Granada, Granada, Spain"],"raw_orcid":"https://orcid.org/0000-0002-6032-6921","affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Technology, University of Granada, Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7363,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.68870822,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"11","issue":null,"first_page":"1732","last_page":"1741"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.9025314450263977},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.7449637651443481},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6637874841690063},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6046251058578491},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.477827787399292},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4651181995868683},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4479489028453827},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3852956295013428},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3528158664703369},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23603957891464233},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2040558159351349},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1845182478427887},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14313387870788574},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.12905922532081604},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.09314239025115967}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.9025314450263977},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.7449637651443481},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6637874841690063},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6046251058578491},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.477827787399292},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4651181995868683},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4479489028453827},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3852956295013428},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3528158664703369},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23603957891464233},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2040558159351349},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1845182478427887},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14313387870788574},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12905922532081604},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.09314239025115967},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2022.3233812","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3233812","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10005109.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:digibug.ugr.es:10481/79822","is_oa":true,"landing_page_url":"https://hdl.handle.net/10481/79822","pdf_url":"https://digibug.ugr.es/bitstream/10481/79822/1/Rule-Based_Design.pdf","source":{"id":"https://openalex.org/S4306400567","display_name":"Institutional Repository of the University of Granada (University of Granada)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I173304897","host_organization_name":"Universidad de Granada","host_organization_lineage":["https://openalex.org/I173304897"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:a90355cff9a44b3d9a2706a4eff1e9b7","is_oa":true,"landing_page_url":"https://doaj.org/article/a90355cff9a44b3d9a2706a4eff1e9b7","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 1732-1741 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3233812","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3233812","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10005109.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1643949827","display_name":null,"funder_award_id":"AEI/10.13039/501100011033","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G2262748287","display_name":null,"funder_award_id":"501100011033","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G300979063","display_name":null,"funder_award_id":"10.13039/501100011033","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G3219925899","display_name":null,"funder_award_id":"MCIN/AEI/10.13039/501100011033","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G3480869486","display_name":null,"funder_award_id":"13039","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G5080475149","display_name":null,"funder_award_id":"10.13039","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G586857820","display_name":null,"funder_award_id":"501100011033/FEDER","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G6071709581","display_name":null,"funder_award_id":"13039/501100011033/","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G6231620680","display_name":null,"funder_award_id":"MCIN/AEI/10.13039/501100011033/","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G7084143925","display_name":null,"funder_award_id":"AEI/10","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G7177346398","display_name":null,"funder_award_id":"MCIN/AEI/10.13039/501100011033/FEDER","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G7266728691","display_name":null,"funder_award_id":"13039/501100011033","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"},{"id":"https://openalex.org/G7535663061","display_name":null,"funder_award_id":"AEI/10.","funder_id":"https://openalex.org/F4320335598","funder_display_name":"Agencia Estatal de Investigaci\u00f3n"}],"funders":[{"id":"https://openalex.org/F4320335598","display_name":"Agencia Estatal de Investigaci\u00f3n","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4313527271.pdf","grobid_xml":"https://content.openalex.org/works/W4313527271.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1659671481","https://openalex.org/W1968055202","https://openalex.org/W1969390180","https://openalex.org/W1971440286","https://openalex.org/W1980433502","https://openalex.org/W2011297622","https://openalex.org/W2012947974","https://openalex.org/W2015524290","https://openalex.org/W2050431855","https://openalex.org/W2167839483","https://openalex.org/W2293212301","https://openalex.org/W2344743430","https://openalex.org/W2443429837","https://openalex.org/W2558527383","https://openalex.org/W2574088239","https://openalex.org/W2769731910","https://openalex.org/W2770533820","https://openalex.org/W2790072224","https://openalex.org/W2808868355","https://openalex.org/W2894760885","https://openalex.org/W2896064880","https://openalex.org/W2908633424","https://openalex.org/W2980034044","https://openalex.org/W2997361554","https://openalex.org/W3008392074","https://openalex.org/W3046446688","https://openalex.org/W3091404708","https://openalex.org/W3165578950","https://openalex.org/W3193856086","https://openalex.org/W3198848954","https://openalex.org/W3205431322","https://openalex.org/W4290703547"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W1523508240","https://openalex.org/W2086616086","https://openalex.org/W2622269177","https://openalex.org/W2978528242","https://openalex.org/W2165400042","https://openalex.org/W2160088500","https://openalex.org/W2081303028","https://openalex.org/W3208260600","https://openalex.org/W2012451149"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,29,67,76,94],"low-cost,":[4],"self-recoverable,":[5],"double-node":[6,71,78,116],"upset":[7,72,79],"tolerant":[8,73,81,136],"latch":[9,74,82,138,148],"aiming":[10],"at":[11],"nourishing":[12],"the":[13,19,22,87,104,120,124,128,133,144,150],"lack":[14],"of":[15,21,123,127],"these":[16],"devices":[17],"in":[18,56],"state":[20],"art,":[23],"especially":[24],"featuring":[25],"self-recoverability":[26,88],"while":[27],"maintaining":[28],"low-cost":[30,68,134],"profile.":[31],"Thus,":[32],"this":[33,109],"D-latch":[34,62,111],"may":[35],"be":[36],"useful":[37],"for":[38,132],"high":[39,99],"reliability":[40],"and":[41,49,75,98,106],"high-performance":[42],"safety-critical":[43],"applications":[44],"as":[45],"it":[46,85],"can":[47],"detect":[48],"recover":[50],"faults":[51],"happening":[52],"during":[53],"holding":[54],"time":[55],"harsh":[57],"radiation":[58],"environments.":[59],"The":[60],"proposed":[61,129],"design":[63,131],"is":[64,112,140],"based":[65],"on":[66,149],"single":[69],"event":[70],"rule-based":[77,130],"(DNU)":[80],"which":[83],"provides":[84],"with":[86,93,143],"against":[89,115],"DNU,":[90],"but":[91],"paired":[92],"low":[95],"transistor":[96],"count":[97],"performance.":[100],"Simulation":[101],"waveforms":[102],"support":[103],"achievements":[105],"demonstrate":[107],"that":[108],"new":[110],"fully":[113],"self-recoverable":[114,137,147],"upset.":[117],"In":[118],"addition,":[119],"minimum":[121],"improvement":[122],"delay-power-area":[125],"product":[126],"DNU":[135,146],"(RB-LDNUR)":[139],"59%,":[141],"compared":[142],"latest":[145],"literature.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}