{"id":"https://openalex.org/W4312636794","doi":"https://doi.org/10.1109/access.2022.3231181","title":"Research on Reliability Growth of Chain Transmission System in Rapid Secure Device of Shipborne Helicopter","display_name":"Research on Reliability Growth of Chain Transmission System in Rapid Secure Device of Shipborne Helicopter","publication_year":2022,"publication_date":"2022-12-20","ids":{"openalex":"https://openalex.org/W4312636794","doi":"https://doi.org/10.1109/access.2022.3231181"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3231181","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3231181","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/09994703.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/09994703.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032035060","display_name":"Zhuxin Zhang","orcid":"https://orcid.org/0000-0001-6048-6610"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhuxin Zhang","raw_affiliation_strings":["Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","School of Vehicle and Energy, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"School of Vehicle and Energy, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100675607","display_name":"Weijian Li","orcid":null},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weijian Li","raw_affiliation_strings":["Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","School of Mechanical Engineering, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"School of Mechanical Engineering, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100647535","display_name":"Dingxuan Zhao","orcid":"https://orcid.org/0000-0002-9412-5298"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dingxuan Zhao","raw_affiliation_strings":["Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","School of Mechanical Engineering, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"School of Mechanical Engineering, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100382568","display_name":"Bing Wang","orcid":"https://orcid.org/0000-0003-4945-7725"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Wang","raw_affiliation_strings":["Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","School of Vehicle and Energy, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"School of Vehicle and Energy, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100633679","display_name":"Tao Ni","orcid":"https://orcid.org/0000-0001-6402-0199"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Ni","raw_affiliation_strings":["Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","School of Vehicle and Energy, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"School of Vehicle and Energy, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091459989","display_name":"Tuo Jia","orcid":null},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tuo Jia","raw_affiliation_strings":["Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","School of Vehicle and Energy, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Hebei Key Laboratory of Special Delivery Equipment, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]},{"raw_affiliation_string":"School of Vehicle and Energy, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5032035060"],"corresponding_institution_ids":["https://openalex.org/I39333907"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3044,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56417501,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"11","issue":null,"first_page":"3198","last_page":"3207"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9452000260353088,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9452000260353088,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9352999925613403,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9282000064849854,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7528340220451355},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.6930379271507263},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6386693716049194},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.6348648071289062},{"id":"https://openalex.org/keywords/transmission-system","display_name":"Transmission system","score":0.6320546269416809},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.6029820442199707},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5584001541137695},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46196410059928894},{"id":"https://openalex.org/keywords/chain","display_name":"Chain (unit)","score":0.42990541458129883},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30914002656936646},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.22681325674057007},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10262468457221985},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08743923902511597},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06675252318382263}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7528340220451355},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.6930379271507263},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6386693716049194},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.6348648071289062},{"id":"https://openalex.org/C113608303","wikidata":"https://www.wikidata.org/wiki/Q1056835","display_name":"Transmission system","level":3,"score":0.6320546269416809},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.6029820442199707},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5584001541137695},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46196410059928894},{"id":"https://openalex.org/C199185054","wikidata":"https://www.wikidata.org/wiki/Q552299","display_name":"Chain (unit)","level":2,"score":0.42990541458129883},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30914002656936646},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.22681325674057007},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10262468457221985},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08743923902511597},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06675252318382263},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3231181","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3231181","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/09994703.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6f50a1c7085440f4b5446a1b4fa7157a","is_oa":true,"landing_page_url":"https://doaj.org/article/6f50a1c7085440f4b5446a1b4fa7157a","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 3198-3207 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3231181","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3231181","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/09994703.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3770329291","display_name":null,"funder_award_id":"21351802D","funder_id":"https://openalex.org/F4320328876","funder_display_name":"Hebei Provincial Key Research Projects"},{"id":"https://openalex.org/G3922098671","display_name":null,"funder_award_id":"22357601D","funder_id":"https://openalex.org/F4320328876","funder_display_name":"Hebei Provincial Key Research Projects"},{"id":"https://openalex.org/G5303448080","display_name":null,"funder_award_id":"20353501D","funder_id":"https://openalex.org/F4320328876","funder_display_name":"Hebei Provincial Key Research Projects"}],"funders":[{"id":"https://openalex.org/F4320328876","display_name":"Hebei Provincial Key Research Projects","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4312636794.pdf","grobid_xml":"https://content.openalex.org/works/W4312636794.grobid-xml"},"referenced_works_count":3,"referenced_works":["https://openalex.org/W1548340427","https://openalex.org/W2079433789","https://openalex.org/W4238453328"],"related_works":["https://openalex.org/W1983353130","https://openalex.org/W2039436097","https://openalex.org/W2937114138","https://openalex.org/W2013600424","https://openalex.org/W2141976250","https://openalex.org/W2117380554","https://openalex.org/W1493389067","https://openalex.org/W2013801244","https://openalex.org/W3006667577","https://openalex.org/W4312636794"],"abstract_inverted_index":{"Aiming":[0],"the":[1,6,19,25,32,35,51,62,65,72,75,81,88,91,96,104,117,124,130,134,140,148,154,159,166,176,181,189,196,200,204,212,216,220,223,231,236,244,249],"chain":[2,20,52,73,82,97,118,141,160,190,205],"transmission":[3,53,98,119,142,161,191,206],"system":[4,26,54,99,120,143,162,192,207],"in":[5,55,74],"rapid":[7],"secure":[8],"device":[9],"(RSD)":[10],"of":[11,64,71,95,139,153,158,180,188,199,203,215,222,248],"shipborne":[12],"helicopter,":[13],"an":[14,28],"individual":[15],"fault":[16,66],"was":[17,21,41,67,78,100,108,121,163,193,208,226],"that":[18,230],"broken,":[22],"and":[23,103,146,211,239],"then":[24,147],"gave":[27],"alarm.":[29],"According":[30,86],"to":[31,43,87,228],"above":[33],"question,":[34],"RSD":[36,58,251],"reliability":[37,46,92,112,131,149,201,232,245],"growth":[38,47,113,132,150,202,246],"test":[39,48,59,76,84,89,114,156,198,224],"bench":[40],"built":[42],"conduct":[44],"a":[45,56,69,241],"study":[49],"on":[50],"single":[57],"prototype.":[60],"After":[61],"cause":[63],"found,":[68],"part":[70],"prototype":[77],"tested":[79],"by":[80],"pulling":[83],"machine.":[85],"results,":[90],"optimization":[93,105,233],"design":[94,106,234],"carried":[101,194,209],"out,":[102,195,210],"scheme":[107],"determined.":[109],"A":[110],"suitable":[111],"plan":[115],"for":[116,243],"formulated":[122],"using":[123],"Duane":[125,151],"model":[126,152,173],"analysis":[127,170,174],"method.":[128],"Through":[129],"test,":[133],"Class":[135],"B":[136],"failure":[137],"statistics":[138],"were":[144],"obtained,":[145],"total":[155],"time":[157,184,225],"established.":[164],"Using":[165],"army":[167],"materiel":[168],"systems":[169],"activity":[171],"(AMSAA)":[172],"method,":[175],"approximate":[177],"unbiased":[178],"estimation":[179],"instantaneous":[182,217],"mean":[183],"between":[185],"failures":[186],"(MTBF)":[187],"trend":[197],"confidence":[213],"interval":[214],"MTBF":[218],"at":[219],"end":[221],"obtained":[227],"verify":[229],"meets":[235],"planning":[237],"requirements":[238],"provide":[240],"reference":[242],"research":[247],"whole":[250],"equipment.":[252]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}