{"id":"https://openalex.org/W4312607989","doi":"https://doi.org/10.1109/access.2022.3222860","title":"A Review: Application of Terahertz Nondestructive Testing Technology in Electrical Insulation Materials","display_name":"A Review: Application of Terahertz Nondestructive Testing Technology in Electrical Insulation Materials","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4312607989","doi":"https://doi.org/10.1109/access.2022.3222860"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3222860","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3222860","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09954006.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09954006.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085615818","display_name":"Chenjun Guo","orcid":"https://orcid.org/0000-0003-4084-3611"},"institutions":[{"id":"https://openalex.org/I1335486098","display_name":"Electric Power Research Institute","ror":"https://ror.org/02dqztz06","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I1335486098"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chenjun Guo","raw_affiliation_strings":["Electric Power Research Institute, Kunming, China","The Electric Power Research Institute, Kunming, China"],"raw_orcid":"https://orcid.org/0000-0003-4084-3611","affiliations":[{"raw_affiliation_string":"Electric Power Research Institute, Kunming, China","institution_ids":["https://openalex.org/I1335486098"]},{"raw_affiliation_string":"The Electric Power Research Institute, Kunming, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010622981","display_name":"Wenlong Xu","orcid":"https://orcid.org/0000-0001-5505-4776"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wenlong Xu","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025147699","display_name":"Mingming Cai","orcid":"https://orcid.org/0009-0007-0174-2566"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mingming Cai","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028703171","display_name":"Shufan Duan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shufan Duan","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055821820","display_name":"Jianbiao Fu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jianbiao Fu","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070260273","display_name":"Xinlong Zhang","orcid":"https://orcid.org/0000-0003-1150-248X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xinlong Zhang","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0003-1150-248X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.7699,"has_fulltext":true,"cited_by_count":34,"citation_normalized_percentile":{"value":0.9092617,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"10","issue":null,"first_page":"121547","last_page":"121560"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10666","display_name":"Photonic Crystals and Applications","score":0.9685999751091003,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.609221339225769},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.5433838963508606},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.5337809920310974},{"id":"https://openalex.org/keywords/structural-material","display_name":"Structural material","score":0.49744561314582825},{"id":"https://openalex.org/keywords/electrical-treeing","display_name":"Electrical treeing","score":0.46076416969299316},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.45978856086730957},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.4383313059806824},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.4381333887577057},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.41186952590942383},{"id":"https://openalex.org/keywords/forensic-engineering","display_name":"Forensic engineering","score":0.40860050916671753},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3895767033100128},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.37549489736557007},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.3262683153152466},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.3247818648815155},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29979199171066284},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2842429578304291},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1783723533153534},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15407371520996094}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.609221339225769},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.5433838963508606},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.5337809920310974},{"id":"https://openalex.org/C200070095","wikidata":"https://www.wikidata.org/wiki/Q1297687","display_name":"Structural material","level":2,"score":0.49744561314582825},{"id":"https://openalex.org/C175395656","wikidata":"https://www.wikidata.org/wiki/Q4384289","display_name":"Electrical treeing","level":4,"score":0.46076416969299316},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.45978856086730957},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.4383313059806824},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.4381333887577057},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.41186952590942383},{"id":"https://openalex.org/C77595967","wikidata":"https://www.wikidata.org/wiki/Q3151013","display_name":"Forensic engineering","level":1,"score":0.40860050916671753},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3895767033100128},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.37549489736557007},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.3262683153152466},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3247818648815155},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29979199171066284},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2842429578304291},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1783723533153534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15407371520996094},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3222860","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3222860","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09954006.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:83c1da3349ea4758b2139272574554f2","is_oa":true,"landing_page_url":"https://doaj.org/article/83c1da3349ea4758b2139272574554f2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 121547-121560 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3222860","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3222860","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09954006.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5912293950","display_name":null,"funder_award_id":"52077013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321135","display_name":"Chongqing University","ror":"https://ror.org/023rhb549"},{"id":"https://openalex.org/F4320321941","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282"},{"id":"https://openalex.org/F4320323370","display_name":"Hainan University","ror":"https://ror.org/03q648j11"},{"id":"https://openalex.org/F4320327404","display_name":"Dalian Maritime University","ror":"https://ror.org/002b7nr53"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4312607989.pdf","grobid_xml":"https://content.openalex.org/works/W4312607989.grobid-xml"},"referenced_works_count":63,"referenced_works":["https://openalex.org/W252031821","https://openalex.org/W1529039403","https://openalex.org/W1589568119","https://openalex.org/W1994898359","https://openalex.org/W2026624309","https://openalex.org/W2043275334","https://openalex.org/W2056777003","https://openalex.org/W2072464780","https://openalex.org/W2099119681","https://openalex.org/W2109449617","https://openalex.org/W2134735283","https://openalex.org/W2135653230","https://openalex.org/W2153964013","https://openalex.org/W2161621988","https://openalex.org/W2241080627","https://openalex.org/W2510300816","https://openalex.org/W2511127176","https://openalex.org/W2523376019","https://openalex.org/W2533913410","https://openalex.org/W2569862572","https://openalex.org/W2724730420","https://openalex.org/W2727295975","https://openalex.org/W2743591661","https://openalex.org/W2781549786","https://openalex.org/W2804097155","https://openalex.org/W2896359400","https://openalex.org/W2901076539","https://openalex.org/W2903173820","https://openalex.org/W2903439314","https://openalex.org/W2921032698","https://openalex.org/W2964121417","https://openalex.org/W2966721011","https://openalex.org/W2980289712","https://openalex.org/W2998660609","https://openalex.org/W2999995609","https://openalex.org/W3003623279","https://openalex.org/W3008121344","https://openalex.org/W3012467786","https://openalex.org/W3016290115","https://openalex.org/W3032280581","https://openalex.org/W3086760845","https://openalex.org/W3094903675","https://openalex.org/W3114480785","https://openalex.org/W3119408970","https://openalex.org/W3125128586","https://openalex.org/W3139511328","https://openalex.org/W3140258338","https://openalex.org/W3145591241","https://openalex.org/W3146269396","https://openalex.org/W3174655914","https://openalex.org/W3178676144","https://openalex.org/W3193314592","https://openalex.org/W3193489841","https://openalex.org/W3194423361","https://openalex.org/W4200573724","https://openalex.org/W4205747079","https://openalex.org/W4212865802","https://openalex.org/W4225146596","https://openalex.org/W4225357747","https://openalex.org/W4280628814","https://openalex.org/W4290091030","https://openalex.org/W6649087668","https://openalex.org/W6732278689"],"related_works":["https://openalex.org/W2118231321","https://openalex.org/W2801209252","https://openalex.org/W2103991600","https://openalex.org/W2155409284","https://openalex.org/W2612972072","https://openalex.org/W2391132677","https://openalex.org/W2055059664","https://openalex.org/W2100472685","https://openalex.org/W4391560029","https://openalex.org/W4205665115"],"abstract_inverted_index":{"As":[0],"the":[1,5,83,87,92,95,108,116,121,147,173,225,232,251,258,266],"voltage":[2],"level":[3],"of":[4,79,86,91,94,98,111,118,125,132,227,234,253,260,269,284],"grid":[6],"continuously":[7],"rises,":[8],"more":[9,11],"and":[10,71,114,123,129,230,241,272,281,289],"new":[12],"insulating":[13,28,59,133,200,216,261,285],"materials":[14,29,60,81,134,149,217],"with":[15],"better":[16],"performance":[17,110],"are":[18,61,155,160,167,180,293],"put":[19],"into":[20],"use.":[21],"Nevertheless,":[22],"air":[23,40,276],"gaps":[24,41],"often":[25],"appear":[26],"in":[27,50,101,140,151,257,275],"due":[30],"to":[31,64,106,158,163,192,194,198,246],"poor":[32],"material":[33,228],"quality,":[34],"structural":[35,127,144,213],"design":[36],"flaws,":[37],"etc.":[38],"High-field-strength":[39],"will":[42],"produce":[43],"partial":[44],"discharge":[45],"or":[46],"even":[47,231],"breakdown,":[48],"resulting":[49],"electrical":[51,69,99],"equipment":[52,100,113],"failure.":[53],"In":[54,104,185,244],"addition,":[55],"during":[56],"operation,":[57],"organic":[58],"simultaneously":[62],"exposed":[63],"high":[65],"temperatures,":[66],"mechanical":[67],"stress,":[68,70],"moisture.":[72],"Consequently,":[73],"aging":[74,78,130,174,229,282],"is":[75,82],"inevitable.":[76],"The":[77],"insulation":[80,89,96,148],"root":[84],"cause":[85],"reduced":[88],"properties":[90,97],"degradation":[93],"long-term":[102],"operation.":[103],"order":[105,245],"improve":[107],"safety":[109,117],"power":[112,119,152],"assure":[115],"grids,":[120],"detection":[122,271],"identification":[124],"internal":[126],"defects":[128,145,214],"states":[131],"have":[135,190,204],"always":[136],"been":[137],"hot":[138],"issues":[139],"related":[141],"fields.":[142],"However,":[143],"inside":[146,215],"used":[150],"equipment,":[153],"which":[154,236],"tiny":[156],"(microns":[157],"millimeters),":[159],"exceedingly":[161],"challenging":[162],"detect.":[164],"While":[165],"there":[166],"various":[168],"destructive":[169],"methods":[170,179],"for":[171],"detecting":[172],"status,":[175],"non-destructive":[176,222],"in-line":[177],"inspection":[178],"still":[181],"less":[182],"commonly":[183],"reported.":[184],"recent":[186],"years,":[187],"some":[188],"scholars":[189,203],"begun":[191],"try":[193],"use":[195],"terahertz":[196,207,270],"spectroscopy":[197,208],"detect":[199,212,221],"materials.":[201,286],"Numerous":[202],"discovered":[205],"that":[206],"can":[209,219],"not":[210],"only":[211],"but":[218],"also":[220],"testing":[223],"on":[224],"degree":[226],"type":[233],"material,":[235],"has":[237],"excellent":[238],"engineering":[239],"value":[240],"promotion":[242],"prospects.":[243],"help":[247],"relevant":[248],"researchers":[249],"understand":[250],"application":[252],"this":[254,263],"emerging":[255],"technology":[256],"field":[259],"materials,":[262],"paper":[264],"reviews":[265],"basic":[267],"principles":[268],"its":[273],"applications":[274],"gap":[277],"detection,":[278,280],"moisture":[279],"analysis":[283],"Existing":[287],"problems":[288],"future":[290],"development":[291],"directions":[292],"discussed.":[294]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":20},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}