{"id":"https://openalex.org/W4312254296","doi":"https://doi.org/10.1109/access.2022.3213690","title":"Numerical and Experimental Investigations on Influence of Internal Defect Parameters on Partial Discharge Induced UHF Signals in Gas Insulated Switchgear","display_name":"Numerical and Experimental Investigations on Influence of Internal Defect Parameters on Partial Discharge Induced UHF Signals in Gas Insulated Switchgear","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4312254296","doi":"https://doi.org/10.1109/access.2022.3213690"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3213690","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3213690","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09915603.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09915603.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036535508","display_name":"Yugandhara Rao Yadam","orcid":"https://orcid.org/0000-0002-4169-7057"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Yugandhara Rao Yadam","raw_affiliation_strings":["Department of Engineering Design, Indian Institute of Technology Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0002-4169-7057","affiliations":[{"raw_affiliation_string":"Department of Engineering Design, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043130075","display_name":"R. Sarathi","orcid":"https://orcid.org/0000-0002-1353-9588"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ramanujam Sarathi","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0002-1353-9588","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051247522","display_name":"Kavitha Arunachalam","orcid":"https://orcid.org/0000-0002-9532-5259"},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Kavitha Arunachalam","raw_affiliation_strings":["Department of Engineering Design, Indian Institute of Technology Madras, Chennai, India"],"raw_orcid":"https://orcid.org/0000-0002-9532-5259","affiliations":[{"raw_affiliation_string":"Department of Engineering Design, Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5051247522"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8292,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.6842864,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"10","issue":null,"first_page":"110785","last_page":"110795"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switchgear","display_name":"Switchgear","score":0.9326049089431763},{"id":"https://openalex.org/keywords/ultra-high-frequency","display_name":"Ultra high frequency","score":0.8919628858566284},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8645386695861816},{"id":"https://openalex.org/keywords/disconnector","display_name":"Disconnector","score":0.6479750871658325},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.570052981376648},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.5656617283821106},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.507555365562439},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33203601837158203},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2833983302116394},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2760552167892456},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16243800520896912},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1282658874988556},{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.07789036631584167}],"concepts":[{"id":"https://openalex.org/C93893174","wikidata":"https://www.wikidata.org/wiki/Q1273786","display_name":"Switchgear","level":2,"score":0.9326049089431763},{"id":"https://openalex.org/C96122199","wikidata":"https://www.wikidata.org/wiki/Q628096","display_name":"Ultra high frequency","level":2,"score":0.8919628858566284},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8645386695861816},{"id":"https://openalex.org/C66325886","wikidata":"https://www.wikidata.org/wiki/Q10860300","display_name":"Disconnector","level":3,"score":0.6479750871658325},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.570052981376648},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.5656617283821106},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.507555365562439},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33203601837158203},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2833983302116394},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2760552167892456},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16243800520896912},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1282658874988556},{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.07789036631584167}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3213690","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3213690","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09915603.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6bb4b3fbd45345638aee98fa7725892e","is_oa":true,"landing_page_url":"https://doaj.org/article/6bb4b3fbd45345638aee98fa7725892e","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 110785-110795 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3213690","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3213690","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09915603.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5899999737739563,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2718354352","display_name":null,"funder_award_id":"CPRI/R&D/TANS/2019","funder_id":"https://openalex.org/F4320336713","funder_display_name":"Central Power Research Institute"}],"funders":[{"id":"https://openalex.org/F4320336713","display_name":"Central Power Research Institute","ror":"https://ror.org/00d1evr30"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4312254296.pdf","grobid_xml":"https://content.openalex.org/works/W4312254296.grobid-xml"},"referenced_works_count":43,"referenced_works":["https://openalex.org/W1931803241","https://openalex.org/W1970138470","https://openalex.org/W1974390559","https://openalex.org/W2010268626","https://openalex.org/W2020143982","https://openalex.org/W2020865134","https://openalex.org/W2024758560","https://openalex.org/W2039440256","https://openalex.org/W2074550928","https://openalex.org/W2090444805","https://openalex.org/W2106568239","https://openalex.org/W2108929535","https://openalex.org/W2110606923","https://openalex.org/W2137803533","https://openalex.org/W2153470877","https://openalex.org/W2157420050","https://openalex.org/W2162300613","https://openalex.org/W2234076383","https://openalex.org/W2321209532","https://openalex.org/W2339097645","https://openalex.org/W2360984193","https://openalex.org/W2491321102","https://openalex.org/W2548576667","https://openalex.org/W2567400186","https://openalex.org/W2571283887","https://openalex.org/W2591533481","https://openalex.org/W2592932761","https://openalex.org/W2727989621","https://openalex.org/W2760002403","https://openalex.org/W2902973003","https://openalex.org/W2911718776","https://openalex.org/W2921410690","https://openalex.org/W2948247560","https://openalex.org/W2949491127","https://openalex.org/W2975131672","https://openalex.org/W3019943230","https://openalex.org/W3022209462","https://openalex.org/W3094500487","https://openalex.org/W3167869154","https://openalex.org/W3175803940","https://openalex.org/W3213893374","https://openalex.org/W4211106668","https://openalex.org/W4255561274"],"related_works":["https://openalex.org/W2808957303","https://openalex.org/W2907218275","https://openalex.org/W1639246940","https://openalex.org/W3010931597","https://openalex.org/W4200454289","https://openalex.org/W2533213929","https://openalex.org/W2893668454","https://openalex.org/W1970052057","https://openalex.org/W2355778955","https://openalex.org/W2091072720"],"abstract_inverted_index":{"A":[0],"detailed":[1],"study":[2,34],"of":[3,6,24,74,95,118,151],"the":[4,89,100,141,148,166,169],"influence":[5,88],"internal":[7,54,101,184],"defect":[8,40,46,133,161],"parameters":[9,162],"on":[10],"partial":[11],"discharge":[12],"(PD)":[13],"induced":[14,98,153],"ultrahigh":[15],"frequency":[16,92,129],"(UHF)":[17],"signals":[18,97,120],"propagated":[19],"through":[20],"an":[21,51],"L":[22],"section":[23],"metal":[25],"encapsulated":[26],"gas":[27],"insulated":[28],"switchgear":[29],"(GIS)":[30],"is":[31,35,173,180],"presented.":[32],"The":[33,115],"carried":[36],"out":[37],"using":[38,182],"PD":[39,96,119,132,152,176],"model":[41],"with":[42,61,71,104,165],"varying":[43,160],"rise":[44,116],"time,":[45],"size,":[47,134],"location,":[48],"and":[49,56,68,81,91,111,128,136],"orientation,":[50],"ultrawideband":[52,183],"UHF":[53,102,123,144,185],"sensor,":[55],"3":[57],"m":[58],"long":[59],"L-GIS":[60,84,158],"dielectric":[62],"spacers,":[63],"shorting":[64],"plates,":[65],"hand":[66],"holes":[67],"bus":[69],"bar":[70],"disconnector.":[72],"Presence":[73],"higher":[75],"order":[76],"modes,":[77],"multipath":[78],"propagation,":[79],"losses,":[80],"dispersion":[82],"inside":[83,157],"were":[85],"observed":[86],"to":[87,106],"time":[90,117,127],"domain":[93],"characteristics":[94,125],"in":[99,126,163,178],"sensor":[103,145],"0.5":[105],"6.8":[107],"GHz":[108],"operating":[109],"bandwidth":[110],"directional":[112],"radiation":[113],"pattern.":[114],"significantly":[121],"influenced":[122],"signal":[124,142],"domains":[130],"while":[131],"location":[135],"angular":[137],"orientation":[138],"primarily":[139],"affected":[140],"amplitude.":[143],"measurements":[146],"confirmed":[147],"complex":[149,170],"behavior":[150],"electromagnetic":[154],"wave":[155],"propagation":[156],"for":[159],"agreement":[164],"simulations.":[167],"Despite":[168],"behavior,":[171],"it":[172],"concluded":[174],"that":[175],"sensing":[177],"GIS":[179],"possible":[181],"sensor.":[186]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}
