{"id":"https://openalex.org/W4295956177","doi":"https://doi.org/10.1109/access.2022.3206547","title":"A Novel Series Arc Fault Detection Method Based on Mel-Frequency Cepstral Coefficients and Fully Connected Neural Network","display_name":"A Novel Series Arc Fault Detection Method Based on Mel-Frequency Cepstral Coefficients and Fully Connected Neural Network","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4295956177","doi":"https://doi.org/10.1109/access.2022.3206547"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3206547","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3206547","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09889731.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09889731.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088272430","display_name":"Yao Wang","orcid":"https://orcid.org/0009-0008-4407-9159"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yao Wang","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Technology, Tianjin, China","Yangtze Delta Region Center of Electrical Engineer Innovation, Wenzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"Yangtze Delta Region Center of Electrical Engineer Innovation, Wenzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013693624","display_name":"Dejie Sheng","orcid":"https://orcid.org/0000-0002-2647-9027"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dejie Sheng","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016702439","display_name":"Haiqing Hu","orcid":"https://orcid.org/0000-0002-3965-2300"},"institutions":[{"id":"https://openalex.org/I4210158295","display_name":"Wenzhou Institute of Technology Testing & Calibration","ror":"https://ror.org/04xxxza58","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210158295"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiqing Hu","raw_affiliation_strings":["National Low Voltage Electrical Apparatus Quality Supervision and Inspection Center, Wenzhou, China"],"affiliations":[{"raw_affiliation_string":"National Low Voltage Electrical Apparatus Quality Supervision and Inspection Center, Wenzhou, China","institution_ids":["https://openalex.org/I4210158295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049977705","display_name":"Kefan Han","orcid":"https://orcid.org/0000-0002-5123-0784"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kefan Han","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024233965","display_name":"Jiawang Zhou","orcid":"https://orcid.org/0000-0001-7434-8470"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawang Zhou","raw_affiliation_strings":["School of Electrical Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049198886","display_name":"Linming Hou","orcid":"https://orcid.org/0000-0003-0350-4928"},"institutions":[{"id":"https://openalex.org/I4210115152","display_name":"Zhejiang Institute of Special Equipment Inspection","ror":"https://ror.org/01jb3sz14","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210115152"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linming Hou","raw_affiliation_strings":["Zhejiang Testing and Inspection Institute for Mechanical and Electrical Products Quality Company Ltd., Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Zhejiang Testing and Inspection Institute for Mechanical and Electrical Products Quality Company Ltd., Hangzhou, China","institution_ids":["https://openalex.org/I4210115152"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5088272430"],"corresponding_institution_ids":["https://openalex.org/I184843921"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.4727,"has_fulltext":true,"cited_by_count":17,"citation_normalized_percentile":{"value":0.8154436,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"10","issue":null,"first_page":"97983","last_page":"97994"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9761999845504761,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mel-frequency-cepstrum","display_name":"Mel-frequency cepstrum","score":0.7958774566650391},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7101662158966064},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5936906933784485},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.5001659393310547},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.49671584367752075},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.4804812967777252},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.43428391218185425},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41338488459587097},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.3766134977340698},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.3703806400299072},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3544151782989502},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20062190294265747},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.11411124467849731},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1075977087020874},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.07186105847358704}],"concepts":[{"id":"https://openalex.org/C151989614","wikidata":"https://www.wikidata.org/wiki/Q440370","display_name":"Mel-frequency cepstrum","level":3,"score":0.7958774566650391},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7101662158966064},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5936906933784485},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.5001659393310547},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.49671584367752075},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.4804812967777252},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.43428391218185425},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41338488459587097},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.3766134977340698},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3703806400299072},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3544151782989502},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20062190294265747},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.11411124467849731},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1075977087020874},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.07186105847358704},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3206547","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3206547","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09889731.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:931550799ec0445d894a3a0346348a71","is_oa":true,"landing_page_url":"https://doaj.org/article/931550799ec0445d894a3a0346348a71","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 97983-97994 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3206547","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3206547","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09889731.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2788776453","display_name":null,"funder_award_id":"LGG20E070002","funder_id":"https://openalex.org/F4320338464","funder_display_name":"Natural Science Foundation of Zhejiang Province"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5939423041","display_name":null,"funder_award_id":"Technology","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6311684539","display_name":null,"funder_award_id":"202204","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6744276534","display_name":null,"funder_award_id":"E2020202204","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322163","display_name":"Natural Science Foundation of Hebei Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320338464","display_name":"Natural Science Foundation of Zhejiang Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4295956177.pdf","grobid_xml":"https://content.openalex.org/works/W4295956177.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W2114407527","https://openalex.org/W2432604435","https://openalex.org/W2542274068","https://openalex.org/W2572569838","https://openalex.org/W2743857156","https://openalex.org/W2798905217","https://openalex.org/W2800598202","https://openalex.org/W2808378779","https://openalex.org/W2900953099","https://openalex.org/W2903145973","https://openalex.org/W2903738303","https://openalex.org/W2903983890","https://openalex.org/W2926172260","https://openalex.org/W2947981924","https://openalex.org/W2996455563","https://openalex.org/W2998423323","https://openalex.org/W3011253169","https://openalex.org/W3090166999","https://openalex.org/W3116488736","https://openalex.org/W3177367985","https://openalex.org/W3204138030","https://openalex.org/W4249689908"],"related_works":["https://openalex.org/W4317383455","https://openalex.org/W2798569283","https://openalex.org/W2137780917","https://openalex.org/W2548511587","https://openalex.org/W4361855252","https://openalex.org/W2422472940","https://openalex.org/W1982460678","https://openalex.org/W2019475500","https://openalex.org/W2357784726","https://openalex.org/W4388647533"],"abstract_inverted_index":{"Arc":[0],"faults":[1],"pose":[2],"challenges":[3],"to":[4,23,75,79,90],"electric":[5],"safety,":[6],"which":[7,106,154],"can":[8,107,126,160],"cause":[9],"serious":[10],"fire":[11],"hazards.":[12],"However,":[13],"the":[14,37,57,77,81,103,109,123,133,157],"commonly":[15],"used":[16],"arc":[17,31,51,69,82,110],"fault":[18,32,111],"detection":[19,33],"method":[20,34,135],"is":[21,73,136],"prone":[22],"nuisance":[24],"tripping.":[25],"This":[26],"paper":[27],"proposed":[28,134],"a":[29,46,85,120],"hybrid":[30],"based":[35],"on":[36],"improved":[38],"Mel-Frequency":[39],"Ceptral":[40],"Coefficients":[41],"(MFCC)":[42],"for":[43,50,65],"preprocessing":[44],"and":[45],"neural":[47,95],"network":[48,96],"model":[49,97],"identification":[52],"called":[53],"ARC_MFCC.":[54],"As":[55,119],"per":[56,152],"IEC":[58,162],"62606,":[59],"twelve":[60],"different":[61,116],"loads/scenarios":[62],"are":[63],"considered":[64],"this":[66],"research.":[67],"An":[68],"tangent-based":[70],"core":[71],"filter":[72],"employed":[74],"improve":[76],"MFCC":[78,125],"enhance":[80],"features":[83],"within":[84],"bandwidth":[86],"of":[87,98,130,149],"3":[88],"kHz":[89],"7":[91],"kHz.":[92],"A":[93],"lightweight":[94],"fully":[99],"connected":[100],"cascaded":[101],"with":[102,112],"MFCC-based":[104],"preprocessing,":[105],"distinguish":[108],"normal":[113],"operation":[114],"under":[115],"test":[117],"conditions.":[118],"verification":[121],"result,":[122],"ARC_":[124],"achieve":[127],"an":[128,145],"accuracy":[129],"99.34%.":[131],"Moreover,":[132],"implemented":[137],"by":[138],"Raspberry":[139],"pie":[140],"4B.":[141],"Test":[142],"results":[143],"show":[144],"average":[146],"running":[147],"time":[148,159],"about":[150],"4.2ms":[151],"sample,":[153],"Ensures":[155],"that":[156],"tripping":[158],"meet":[161],"62606.":[163]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-29T08:15:47.926485","created_date":"2025-10-10T00:00:00"}