{"id":"https://openalex.org/W4289913054","doi":"https://doi.org/10.1109/access.2022.3196664","title":"Comments on \u201cOn Scale Parameter Monitoring of the Rayleigh Distributed Data Using a New Design\u201d","display_name":"Comments on \u201cOn Scale Parameter Monitoring of the Rayleigh Distributed Data Using a New Design\u201d","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4289913054","doi":"https://doi.org/10.1109/access.2022.3196664"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3196664","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3196664","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09851442.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09851442.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029810000","display_name":"Philipp Wittenberg","orcid":"https://orcid.org/0000-0001-7151-8243"},"institutions":[{"id":"https://openalex.org/I190134885","display_name":"Helmut Schmidt University","ror":"https://ror.org/04e8jbs38","country_code":"DE","type":"education","lineage":["https://openalex.org/I190134885"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Philipp Wittenberg","raw_affiliation_strings":["Department of Mathematics and Statistics, Helmut Schmidt University, Hamburg, Germany","Department of Mathematics and Statistics, Helmut Schmidt University, Holstenhofweg 85, Hamburg, Germany"],"raw_orcid":"https://orcid.org/0000-0001-7151-8243","affiliations":[{"raw_affiliation_string":"Department of Mathematics and Statistics, Helmut Schmidt University, Hamburg, Germany","institution_ids":["https://openalex.org/I190134885"]},{"raw_affiliation_string":"Department of Mathematics and Statistics, Helmut Schmidt University, Holstenhofweg 85, Hamburg, Germany","institution_ids":["https://openalex.org/I190134885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073222369","display_name":"Manuel Cabral Morais","orcid":"https://orcid.org/0000-0002-2214-2910"},"institutions":[{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]},{"id":"https://openalex.org/I203847022","display_name":"Instituto Polit\u00e9cnico de Lisboa","ror":"https://ror.org/04ea70f07","country_code":"PT","type":"education","lineage":["https://openalex.org/I203847022"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Manuel Cabral Morais","raw_affiliation_strings":["Department of Mathematics, Instituto Superior Técnico, Universidade de Lisboa, Lisboa, Portugal","cnico, Universidade de Lisboa, Av. Rovisco Pais, Lisboa, Portugal"],"raw_orcid":"https://orcid.org/0000-0002-2214-2910","affiliations":[{"raw_affiliation_string":"Department of Mathematics, Instituto Superior Técnico, Universidade de Lisboa, Lisboa, Portugal","institution_ids":["https://openalex.org/I203847022","https://openalex.org/I141596103"]},{"raw_affiliation_string":"cnico, Universidade de Lisboa, Av. Rovisco Pais, Lisboa, Portugal","institution_ids":["https://openalex.org/I141596103"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055123256","display_name":"William H. Woodall","orcid":"https://orcid.org/0000-0002-9962-0001"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William H. Woodall","raw_affiliation_strings":["Department of Statistics, Virginia Tech, Blacksburg, VA, USA"],"raw_orcid":"https://orcid.org/0000-0002-9962-0001","affiliations":[{"raw_affiliation_string":"Department of Statistics, Virginia Tech, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.371,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67391737,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"10","issue":null,"first_page":"84622","last_page":"84625"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.9781000018119812,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9571999907493591,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-chart","display_name":"Control chart","score":0.7210537195205688},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.703111469745636},{"id":"https://openalex.org/keywords/rayleigh-distribution","display_name":"Rayleigh distribution","score":0.6988410949707031},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.6730117797851562},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5558856725692749},{"id":"https://openalex.org/keywords/rayleigh-scattering","display_name":"Rayleigh scattering","score":0.534686803817749},{"id":"https://openalex.org/keywords/scale-parameter","display_name":"Scale parameter","score":0.49135079979896545},{"id":"https://openalex.org/keywords/false-alarm","display_name":"False alarm","score":0.4763524532318115},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3895900845527649},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2772732377052307},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1676175892353058},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14537841081619263},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.12723255157470703}],"concepts":[{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.7210537195205688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.703111469745636},{"id":"https://openalex.org/C40940223","wikidata":"https://www.wikidata.org/wiki/Q637150","display_name":"Rayleigh distribution","level":3,"score":0.6988410949707031},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.6730117797851562},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5558856725692749},{"id":"https://openalex.org/C46244369","wikidata":"https://www.wikidata.org/wiki/Q193709","display_name":"Rayleigh scattering","level":2,"score":0.534686803817749},{"id":"https://openalex.org/C91716921","wikidata":"https://www.wikidata.org/wiki/Q1289366","display_name":"Scale parameter","level":2,"score":0.49135079979896545},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.4763524532318115},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3895900845527649},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2772732377052307},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1676175892353058},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14537841081619263},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.12723255157470703},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3196664","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3196664","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09851442.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:0a3e95cb441842569b1e94e034529434","is_oa":true,"landing_page_url":"https://doaj.org/article/0a3e95cb441842569b1e94e034529434","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 84622-84625 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3196664","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3196664","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09851442.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4289913054.pdf","grobid_xml":"https://content.openalex.org/works/W4289913054.grobid-xml"},"referenced_works_count":7,"referenced_works":["https://openalex.org/W102562848","https://openalex.org/W1970062313","https://openalex.org/W2035692898","https://openalex.org/W2958652438","https://openalex.org/W3000177208","https://openalex.org/W3094627809","https://openalex.org/W6746257145"],"related_works":["https://openalex.org/W2370046228","https://openalex.org/W2535452286","https://openalex.org/W3151654648","https://openalex.org/W1998858566","https://openalex.org/W4389027964","https://openalex.org/W2075877975","https://openalex.org/W4293069626","https://openalex.org/W1990132050","https://openalex.org/W1975760703","https://openalex.org/W2009032864"],"abstract_inverted_index":{"We":[0,31],"provide":[1],"comments":[2],"on":[3,24,36],"a":[4,8,17,52],"research":[5],"paper":[6],"proposing":[7],"control":[9],"chart":[10],"to":[11,50],"monitor":[12],"the":[13],"scale":[14,45],"parameter":[15,46],"of":[16],"Rayleigh":[18],"distribution.":[19],"Our":[20],"primary":[21],"focus":[22],"is":[23],"improving":[25],"its":[26],"average":[27],"run":[28],"length":[29],"profile.":[30],"determine":[32],"limits":[33],"such":[34],"that,":[35],"average,":[37],"one":[38],"can":[39],"detect":[40],"any":[41],"change":[42],"in":[43],"this":[44],"more":[47],"quickly":[48],"than":[49],"trigger":[51],"false":[53],"alarm.":[54]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}