{"id":"https://openalex.org/W4289656532","doi":"https://doi.org/10.1109/access.2022.3196001","title":"Automatic Parametric Modeling Technique for Structural Design Standardization","display_name":"Automatic Parametric Modeling Technique for Structural Design Standardization","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4289656532","doi":"https://doi.org/10.1109/access.2022.3196001"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3196001","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3196001","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09848460.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09848460.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069164787","display_name":"Noriyasu Aso","orcid":"https://orcid.org/0000-0001-9340-3877"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriyasu Aso","raw_affiliation_strings":["Fujitsu Research, Fujitsu Ltd., Kawasaki, Kanagawa, Japan","Fujitsu Research, Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9340-3877","affiliations":[{"raw_affiliation_string":"Fujitsu Research, Fujitsu Ltd., Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"Fujitsu Research, Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060203734","display_name":"Hitoshi Yanami","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hitoshi Yanami","raw_affiliation_strings":["Fujitsu Research, Fujitsu Ltd., Kawasaki, Kanagawa, Japan","Fujitsu Research, Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Research, Fujitsu Ltd., Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"Fujitsu Research, Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027891005","display_name":"Masatoshi Ogawa","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masatoshi Ogawa","raw_affiliation_strings":["Fujitsu Research, Fujitsu Ltd., Kawasaki, Kanagawa, Japan","Fujitsu Research, Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Research, Fujitsu Ltd., Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"Fujitsu Research, Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.9076,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77780857,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"10","issue":null,"first_page":"81031","last_page":"81041"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10719","display_name":"3D Shape Modeling and Analysis","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.8483656644821167},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7933239936828613},{"id":"https://openalex.org/keywords/parametric-model","display_name":"Parametric model","score":0.6410248279571533},{"id":"https://openalex.org/keywords/parametric-design","display_name":"Parametric design","score":0.5941070318222046},{"id":"https://openalex.org/keywords/active-shape-model","display_name":"Active shape model","score":0.5223718285560608},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5042084455490112},{"id":"https://openalex.org/keywords/shape-analysis","display_name":"Shape analysis (program analysis)","score":0.4449147582054138},{"id":"https://openalex.org/keywords/solid-modeling","display_name":"Solid modeling","score":0.4158884286880493},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.38760295510292053},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1228233277797699}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.8483656644821167},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7933239936828613},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.6410248279571533},{"id":"https://openalex.org/C2778370241","wikidata":"https://www.wikidata.org/wiki/Q18386598","display_name":"Parametric design","level":3,"score":0.5941070318222046},{"id":"https://openalex.org/C129641003","wikidata":"https://www.wikidata.org/wiki/Q267189","display_name":"Active shape model","level":3,"score":0.5223718285560608},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5042084455490112},{"id":"https://openalex.org/C112604564","wikidata":"https://www.wikidata.org/wiki/Q7489226","display_name":"Shape analysis (program analysis)","level":3,"score":0.4449147582054138},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.4158884286880493},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.38760295510292053},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1228233277797699},{"id":"https://openalex.org/C97686452","wikidata":"https://www.wikidata.org/wiki/Q7604153","display_name":"Static analysis","level":2,"score":0.0},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3196001","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3196001","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09848460.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:188ae96032104a62abbf74cddb762ee5","is_oa":true,"landing_page_url":"https://doaj.org/article/188ae96032104a62abbf74cddb762ee5","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 81031-81041 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3196001","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3196001","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09848460.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4289656532.pdf","grobid_xml":"https://content.openalex.org/works/W4289656532.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W988838202","https://openalex.org/W1557730690","https://openalex.org/W1995617867","https://openalex.org/W2062342108","https://openalex.org/W2085308652","https://openalex.org/W2097117768","https://openalex.org/W2101025736","https://openalex.org/W2101839560","https://openalex.org/W2102872744","https://openalex.org/W2116466193","https://openalex.org/W2119103873","https://openalex.org/W2135306884","https://openalex.org/W2137914836","https://openalex.org/W2143193065","https://openalex.org/W2520019271","https://openalex.org/W2569887714","https://openalex.org/W2600035553","https://openalex.org/W2745149710","https://openalex.org/W2757198495","https://openalex.org/W2940612992","https://openalex.org/W2986519121","https://openalex.org/W2998779006","https://openalex.org/W3034568134","https://openalex.org/W4249976801","https://openalex.org/W6633231685","https://openalex.org/W6684251935"],"related_works":["https://openalex.org/W2501097992","https://openalex.org/W2464585191","https://openalex.org/W1965145450","https://openalex.org/W13786964","https://openalex.org/W2126962853","https://openalex.org/W2144085839","https://openalex.org/W2212089300","https://openalex.org/W2121756800","https://openalex.org/W1973986918","https://openalex.org/W2544339088"],"abstract_inverted_index":{"The":[0,179,245],"challenge":[1],"in":[2,58,209,225],"designing":[3,17],"new":[4,87,126,227],"three-dimensional":[5],"(3D)":[6],"shapes":[7,75,115,143,150,155,165,216,235],"is":[8,13,83,92,185],"that":[9,138,175],"considerable":[10],"manual":[11],"effort":[12],"required":[14,23],"for":[15,40,63],"repeated":[16],"and":[18,26,74,119,217,239],"verification":[19],"to":[20,60,153,223],"satisfy":[21],"the":[22,43,103,106,109,113,135,182,188,197,210,226,230],"specifications.":[24],"Extracting":[25],"standardizing":[27],"parametric":[28,54,77,120,177,205,240],"design":[29,44,56,70,107],"rules":[30],"from":[31,145],"a":[32,49,69,80,86,96,169],"designed":[33],"3D":[34,142,149,189],"shape":[35,82,99,128,190],"dataset":[36,71],"will":[37],"be":[38],"useful":[39],"drastically":[41],"reducing":[42],"time.":[45],"This":[46,90,125],"paper":[47],"describes":[48],"framework":[50,184,249],"of":[51,95,105,141,181,192,200,247],"automatically":[52,117,123,237,243],"generating":[53],"models,":[55],"rules,":[57],"order":[59],"standardize":[61],"designs":[62],"structural":[64,194],"systems.":[65],"In":[66],"this":[67,248],"framework,":[68],"whose":[72],"dimensions":[73],"have":[76],"relationships":[78,206],"with":[79],"target":[81],"extracted":[84,167],"using":[85,168,187,214],"retrieval":[88,100,129,202],"method.":[89,101,228],"method":[91,130,137],"an":[93],"improvement":[94],"conventional":[97,136,211],"similar":[98,127,164,234],"After":[102],"extraction":[104],"dataset,":[108],"corresponding":[110,231],"parts":[111,232],"between":[112,233],"collected":[114],"are":[116,122,151,166],"identified":[118],"models":[121,241],"generated.":[124,244],"has":[131,250],"two":[132],"improvements":[133],"over":[134],"uses":[139],"images":[140],"captured":[144],"multiple":[146],"directions.":[147],"First,":[148],"converted":[152],"unit":[154,215],"by":[156,213],"stretching":[157],"or":[158],"shrinking":[159],"along":[160],"each":[161],"axis.":[162],"Second,":[163],"special":[170,218],"artificial":[171],"intelligence":[172],"(AI)":[173],"model":[174],"learns":[176],"relationships.":[178],"effectiveness":[180,246],"proposed":[183],"evaluated":[186],"data":[191],"various":[193],"shapes.":[195],"Although":[196],"accuracy":[198],"rate":[199],"similar-shape":[201],"based":[203],"on":[204],"was":[207,221],"62%":[208],"method,":[212],"AIs,":[219],"it":[220],"improved":[222],"99%":[224],"Moreover,":[229],"were":[236,242],"identified,":[238],"been":[251],"demonstrated.":[252]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}