{"id":"https://openalex.org/W4288783927","doi":"https://doi.org/10.1109/access.2022.3194848","title":"A Feature Extraction Algorithm for Rolling Bearing Faults and Its Application","display_name":"A Feature Extraction Algorithm for Rolling Bearing Faults and Its Application","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4288783927","doi":"https://doi.org/10.1109/access.2022.3194848"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3194848","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3194848","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09844733.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09844733.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100390156","display_name":"Zhen Zhang","orcid":"https://orcid.org/0000-0002-0165-0721"},"institutions":[{"id":"https://openalex.org/I36152291","display_name":"Henan University of Technology","ror":"https://ror.org/05sbgwt55","country_code":"CN","type":"education","lineage":["https://openalex.org/I36152291"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Zhang","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Henan University of Technology, Zhengzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-0165-0721","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Henan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I36152291"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023173745","display_name":"Baoguo Liu","orcid":"https://orcid.org/0000-0002-0928-7023"},"institutions":[{"id":"https://openalex.org/I36152291","display_name":"Henan University of Technology","ror":"https://ror.org/05sbgwt55","country_code":"CN","type":"education","lineage":["https://openalex.org/I36152291"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baoguo Liu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Henan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Henan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I36152291"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011958175","display_name":"Wenliao Du","orcid":"https://orcid.org/0000-0001-7490-1133"},"institutions":[{"id":"https://openalex.org/I23171815","display_name":"Zhengzhou University of Light Industry","ror":"https://ror.org/05fwr8z16","country_code":"CN","type":"education","lineage":["https://openalex.org/I23171815"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenliao Du","raw_affiliation_strings":["School of Mechanical and Electronic Engineering, Zhengzhou University of Light Industry, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electronic Engineering, Zhengzhou University of Light Industry, Zhengzhou, China","institution_ids":["https://openalex.org/I23171815"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036194995","display_name":"Wei Feng","orcid":"https://orcid.org/0000-0003-3115-8292"},"institutions":[{"id":"https://openalex.org/I36152291","display_name":"Henan University of Technology","ror":"https://ror.org/05sbgwt55","country_code":"CN","type":"education","lineage":["https://openalex.org/I36152291"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Feng","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Henan University of Technology, Zhengzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Henan University of Technology, Zhengzhou, China","institution_ids":["https://openalex.org/I36152291"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8129,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76707696,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"10","issue":null,"first_page":"83498","last_page":"83506"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6822343468666077},{"id":"https://openalex.org/keywords/singular-value-decomposition","display_name":"Singular value decomposition","score":0.6567186713218689},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6060677170753479},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5968309044837952},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.5764087438583374},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5512776970863342},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.5236765742301941},{"id":"https://openalex.org/keywords/envelope","display_name":"Envelope (radar)","score":0.5149960517883301},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.44337305426597595},{"id":"https://openalex.org/keywords/lubrication","display_name":"Lubrication","score":0.4431009888648987},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.41001877188682556},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4000130295753479},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3009275197982788},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1467338502407074},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.1310230791568756}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6822343468666077},{"id":"https://openalex.org/C22789450","wikidata":"https://www.wikidata.org/wiki/Q420904","display_name":"Singular value decomposition","level":2,"score":0.6567186713218689},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6060677170753479},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5968309044837952},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.5764087438583374},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5512776970863342},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.5236765742301941},{"id":"https://openalex.org/C65155139","wikidata":"https://www.wikidata.org/wiki/Q5380912","display_name":"Envelope (radar)","level":3,"score":0.5149960517883301},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.44337305426597595},{"id":"https://openalex.org/C184608416","wikidata":"https://www.wikidata.org/wiki/Q1455803","display_name":"Lubrication","level":2,"score":0.4431009888648987},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.41001877188682556},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4000130295753479},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3009275197982788},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1467338502407074},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.1310230791568756},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3194848","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3194848","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09844733.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7987eda5a71f478fb0b2f07e06e6cfa2","is_oa":true,"landing_page_url":"https://doaj.org/article/7987eda5a71f478fb0b2f07e06e6cfa2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 83498-83506 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3194848","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3194848","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09844733.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4288783927.pdf","grobid_xml":"https://content.openalex.org/works/W4288783927.grobid-xml"},"referenced_works_count":34,"referenced_works":["https://openalex.org/W1481125661","https://openalex.org/W2017855413","https://openalex.org/W2020622020","https://openalex.org/W2030649852","https://openalex.org/W2031282222","https://openalex.org/W2058514560","https://openalex.org/W2066980082","https://openalex.org/W2089700699","https://openalex.org/W2354047540","https://openalex.org/W2509779719","https://openalex.org/W2585416310","https://openalex.org/W2763603848","https://openalex.org/W2791125525","https://openalex.org/W2797657372","https://openalex.org/W2890012636","https://openalex.org/W2904460913","https://openalex.org/W2938300822","https://openalex.org/W3014859875","https://openalex.org/W3015616869","https://openalex.org/W3048349609","https://openalex.org/W3071917830","https://openalex.org/W3086626272","https://openalex.org/W3146667673","https://openalex.org/W3189401844","https://openalex.org/W3197701220","https://openalex.org/W3201410046","https://openalex.org/W3208565045","https://openalex.org/W3214309058","https://openalex.org/W3217476834","https://openalex.org/W4205829078","https://openalex.org/W4205916405","https://openalex.org/W4210843447","https://openalex.org/W4220674695","https://openalex.org/W4225976909"],"related_works":["https://openalex.org/W4375864176","https://openalex.org/W2365326462","https://openalex.org/W2709480652","https://openalex.org/W2524102925","https://openalex.org/W3143848964","https://openalex.org/W2074259782","https://openalex.org/W66955726","https://openalex.org/W2044482983","https://openalex.org/W4226264597","https://openalex.org/W1981799021"],"abstract_inverted_index":{"Focusing":[0],"on":[1,28,66],"the":[2,7,55,67,90],"difficulty":[3],"of":[4,97],"completely":[5],"extracting":[6,19,119],"surface":[8],"damage":[9],"caused":[10],"by":[11],"rolling":[12],"bearing":[13,20],"lubrication":[14,21,104],"failure,":[15],"an":[16],"algorithm":[17,92],"for":[18,58],"fault":[22,99,123,134],"is":[23,26],"proposed,":[24],"which":[25,51],"based":[27],"periodic":[29],"optimum":[30],"singular":[31],"value":[32],"decomposition":[33],"(O-SVD)":[34],"cascaded":[35],"fast":[36],"spectral":[37],"correlation":[38],"(FSC).":[39],"Initially,":[40],"conventional":[41],"T-SVD":[42],"with":[43,75],"energy":[44],"leakage":[45],"defects":[46],"was":[47,52,64],"modified":[48],"into":[49],"O-SVD,":[50],"used":[53],"as":[54],"preprocessing":[56],"unit":[57],"signal":[59],"processing.":[60],"Then,":[61],"FSC":[62],"calculation":[63],"performed":[65],"reconstructed":[68],"signals,":[69],"eventually":[70],"obtaining":[71],"enhanced":[72],"envelope":[73],"spectrum":[74],"obvious":[76],"features":[77,100],"that":[78,89],"could":[79],"well":[80],"preserve":[81],"local":[82,137],"details.":[83],"Simulation":[84],"and":[85,109,114,121,136],"experimental":[86],"results":[87],"show":[88],"proposed":[91],"allows":[93],"rather":[94],"complete":[95],"extraction":[96],"slight":[98],"resulting":[101],"from":[102],"poor":[103],"under":[105],"small":[106],"sampling":[107],"length":[108],"low":[110],"signal-to-noise":[111],"ratio":[112],"(SNR),":[113],"has":[115],"good":[116],"applicability":[117],"in":[118],"compound":[120],"composite":[122],"features.":[124],"The":[125],"extracted":[126],"signals":[127],"have":[128],"advantages":[129],"over":[130],"existing":[131],"algorithms":[132],"regarding":[133],"resolution":[135],"details":[138],"preservation.":[139]},"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}