{"id":"https://openalex.org/W4285232636","doi":"https://doi.org/10.1109/access.2022.3175460","title":"Breakdown of Synthetic Air Under Nanosecond Pulsed Voltages in Quasi-Uniform Electric Fields","display_name":"Breakdown of Synthetic Air Under Nanosecond Pulsed Voltages in Quasi-Uniform Electric Fields","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285232636","doi":"https://doi.org/10.1109/access.2022.3175460"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3175460","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3175460","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09775667.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","datacite","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09775667.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015602523","display_name":"Michelangelo Balmelli","orcid":"https://orcid.org/0000-0001-7787-3748"},"institutions":[{"id":"https://openalex.org/I71824836","display_name":"Swiss Federal Laboratories for Materials Science and Technology","ror":"https://ror.org/02x681a42","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I71824836"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Michelangelo Balmelli","raw_affiliation_strings":["Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland"],"raw_orcid":"https://orcid.org/0000-0001-7787-3748","affiliations":[{"raw_affiliation_string":"Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland","institution_ids":["https://openalex.org/I71824836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060475107","display_name":"Yang Lu","orcid":"https://orcid.org/0000-0002-8909-7827"},"institutions":[{"id":"https://openalex.org/I71824836","display_name":"Swiss Federal Laboratories for Materials Science and Technology","ror":"https://ror.org/02x681a42","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I71824836"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Yang Lu","raw_affiliation_strings":["Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland"],"raw_orcid":"https://orcid.org/0000-0002-8909-7827","affiliations":[{"raw_affiliation_string":"Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland","institution_ids":["https://openalex.org/I71824836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111012014","display_name":"Raphael F\u00e4rber","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Raphael Farber","raw_affiliation_strings":["High Voltage Laboratory, ETH Z&#x00F6;rich, Z&#x00F6;rich, Switzerland"],"raw_orcid":"https://orcid.org/0000-0001-8511-8670","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, ETH Z&#x00F6;rich, Z&#x00F6;rich, Switzerland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013717910","display_name":"L. Merotto","orcid":"https://orcid.org/0000-0002-7552-0321"},"institutions":[{"id":"https://openalex.org/I71824836","display_name":"Swiss Federal Laboratories for Materials Science and Technology","ror":"https://ror.org/02x681a42","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I71824836"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Laura Merotto","raw_affiliation_strings":["Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland"],"raw_orcid":"https://orcid.org/0000-0002-7552-0321","affiliations":[{"raw_affiliation_string":"Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland","institution_ids":["https://openalex.org/I71824836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058973480","display_name":"Patrik Soltic","orcid":"https://orcid.org/0000-0003-2289-7608"},"institutions":[{"id":"https://openalex.org/I71824836","display_name":"Swiss Federal Laboratories for Materials Science and Technology","ror":"https://ror.org/02x681a42","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I71824836"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Patrik Soltic","raw_affiliation_strings":["Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland"],"raw_orcid":"https://orcid.org/0000-0003-2289-7608","affiliations":[{"raw_affiliation_string":"Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland","institution_ids":["https://openalex.org/I71824836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006480202","display_name":"Davide Bleiner","orcid":"https://orcid.org/0000-0003-4773-0046"},"institutions":[{"id":"https://openalex.org/I71824836","display_name":"Swiss Federal Laboratories for Materials Science and Technology","ror":"https://ror.org/02x681a42","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I71824836"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Davide Bleiner","raw_affiliation_strings":["Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Empa, Swiss Federal Laboratories for Materials Science and Technology, D&#x00F6;bendorf, Switzerland","institution_ids":["https://openalex.org/I71824836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043876843","display_name":"J. Biela","orcid":"https://orcid.org/0000-0001-9099-6486"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jurgen Biela","raw_affiliation_strings":["Laboratory for High Power Electronic Systems, ETH Z&#x00F6;rich, Z&#x00F6;rich, Switzerland"],"raw_orcid":"https://orcid.org/0000-0001-9099-6486","affiliations":[{"raw_affiliation_string":"Laboratory for High Power Electronic Systems, ETH Z&#x00F6;rich, Z&#x00F6;rich, Switzerland","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042377270","display_name":"Christian M. Franck","orcid":"https://orcid.org/0000-0002-2201-7327"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Christian M. Franck","raw_affiliation_strings":["High Voltage Laboratory, ETH Z&#x00F6;rich, Z&#x00F6;rich, Switzerland"],"raw_orcid":"https://orcid.org/0000-0002-2201-7327","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, ETH Z&#x00F6;rich, Z&#x00F6;rich, Switzerland","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.9718,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.73442947,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"10","issue":null,"first_page":"53454","last_page":"53467"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12776","display_name":"Electrohydrodynamics and Fluid Dynamics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12776","display_name":"Electrohydrodynamics and Fluid Dynamics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10642","display_name":"Plasma Applications and Diagnostics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12163","display_name":"Aerosol Filtration and Electrostatic Precipitation","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanosecond","display_name":"Nanosecond","score":0.849053144454956},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.669793963432312},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.609914243221283},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5775490999221802},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4161713421344757},{"id":"https://openalex.org/keywords/pulsed-power","display_name":"Pulsed power","score":0.4150472581386566},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32791292667388916},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2590157985687256},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2069912552833557},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10999837517738342}],"concepts":[{"id":"https://openalex.org/C51141536","wikidata":"https://www.wikidata.org/wiki/Q838801","display_name":"Nanosecond","level":3,"score":0.849053144454956},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.669793963432312},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.609914243221283},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5775490999221802},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4161713421344757},{"id":"https://openalex.org/C97039730","wikidata":"https://www.wikidata.org/wiki/Q552565","display_name":"Pulsed power","level":3,"score":0.4150472581386566},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32791292667388916},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2590157985687256},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2069912552833557},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10999837517738342},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/access.2022.3175460","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3175460","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09775667.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:42f13a1e2f6c4facba8ba16f35d09e47","is_oa":false,"landing_page_url":"https://doaj.org/article/42f13a1e2f6c4facba8ba16f35d09e47","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 53454-53467 (2022)","raw_type":"article"},{"id":"pmh:oai:dora:empa_29399","is_oa":true,"landing_page_url":"https://www.dora.lib4ri.ch/empa/islandora/object/empa%3A29399","pdf_url":null,"source":{"id":"https://openalex.org/S4306401298","display_name":"DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I71824836","host_organization_name":"Swiss Federal Laboratories for Materials Science and Technology","host_organization_lineage":["https://openalex.org/I71824836"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:www.research-collection.ethz.ch:20.500.11850/547810","is_oa":true,"landing_page_url":"http://hdl.handle.net/20.500.11850/547810","pdf_url":null,"source":{"id":"https://openalex.org/S4306402302","display_name":"Repository for Publications and Research Data (ETH Zurich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I35440088","host_organization_name":"ETH Zurich","host_organization_lineage":["https://openalex.org/I35440088"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, 10","raw_type":"info:eu-repo/semantics/article"},{"id":"doi:10.3929/ethz-b-000547810","is_oa":true,"landing_page_url":"https://doi.org/10.3929/ethz-b-000547810","pdf_url":null,"source":{"id":"https://openalex.org/S7407051236","display_name":"ETH Z\u00fcrich Research Collection","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article-journal"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3175460","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3175460","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09775667.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.49000000953674316,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G7809114455","display_name":null,"funder_award_id":"SI/501755-01","funder_id":"https://openalex.org/F4320335015","funder_display_name":"Bundesamt f\u00fcr Energie"}],"funders":[{"id":"https://openalex.org/F4320335015","display_name":"Bundesamt f\u00fcr Energie","ror":"https://ror.org/020ddnn22"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4285232636.pdf","grobid_xml":"https://content.openalex.org/works/W4285232636.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W566354625","https://openalex.org/W1158228348","https://openalex.org/W1972978214","https://openalex.org/W1977745620","https://openalex.org/W1984165296","https://openalex.org/W1987237515","https://openalex.org/W2035150111","https://openalex.org/W2037891900","https://openalex.org/W2059787530","https://openalex.org/W2062447547","https://openalex.org/W2147052046","https://openalex.org/W2159472109","https://openalex.org/W2160456562","https://openalex.org/W2161606023","https://openalex.org/W2275697065","https://openalex.org/W2562008253","https://openalex.org/W2615241557","https://openalex.org/W2795515260","https://openalex.org/W2922887988","https://openalex.org/W2996374982","https://openalex.org/W2999381455","https://openalex.org/W3180148339","https://openalex.org/W3188526070","https://openalex.org/W3215264358","https://openalex.org/W3216752615","https://openalex.org/W4200039791","https://openalex.org/W4206340310","https://openalex.org/W4211017979","https://openalex.org/W4243080169","https://openalex.org/W4250338059"],"related_works":["https://openalex.org/W4402771132","https://openalex.org/W2038293740","https://openalex.org/W2143836309","https://openalex.org/W2164943477","https://openalex.org/W1529471147","https://openalex.org/W2009348810","https://openalex.org/W2751749952","https://openalex.org/W2899343546","https://openalex.org/W2155315231","https://openalex.org/W1964308481"],"abstract_inverted_index":{"The":[0,30,51,105,125,177],"electrical":[1],"breakdown":[2,61,66,136,182,193,205],"of":[3,68,107,114,131,146,180,203,225,234],"synthetic":[4],"air":[5],"under":[6,72,137,194],"ultrashort":[7],"high-voltage":[8],"pulses":[9],"(50":[10],"ns":[11],"duration),":[12],"as":[13,15,95],"well":[14],"slowly":[16,195],"increasing":[17,196],"(\"DC\")":[18],"voltages,":[19],"is":[20,33,44,54,80,154,163,230],"experimentally":[21],"studied":[22],"in":[23,102,237],"a":[24,143,150,201],"well-defined":[25],"quasi-uniform":[26],"electrode":[27,31,109],"configuration":[28],"(sphere\u2013plane).":[29],"spacing":[32],"varied":[34,45],"from":[35,46,156,227],"0.1":[36],"to":[37,48,55,59,91,170],"1":[38],"mm,":[39],"and":[40,86,111,122],"the":[41,65,108,112,128,167,172,181,185,204,216,222,228,231],"gas":[42,70],"pressure":[43],"1.5":[47],"8":[49],"bar.":[50],"study\u2019s":[52],"goal":[53],"provide":[56],"experimental":[57],"data":[58],"develop":[60],"models":[62],"that":[63,221],"predict":[64],"probability":[67],"small":[69],"gaps":[71],"arbitrary":[73],"voltage":[74,206],"excitations.":[75],"In":[76],"particular,":[77],"this":[78],"analysis":[79],"intended":[81],"for":[82,119,135,142,192,210],"applications":[83],"where":[84],"statistical":[85],"formative":[87],"time":[88,157],"lags":[89],"need":[90],"be":[92],"considered,":[93],"such":[94],"nanosecond":[96,211],"pulsed":[97,123,212],"ignition":[98],"or":[99],"partial":[100],"discharges":[101],"inverter-fed":[103],"motors.":[104],"influence":[106],"material":[110,187],"presence":[113],"UV":[115],"illumination":[116],"are":[117],"investigated":[118],"both":[120],"DC":[121],"voltages.":[124,140],"results":[126],"highlight":[127],"important":[129],"role":[130],"seed":[132,147,173,235],"electron":[133,174],"provision":[134],"short":[138],"transient":[139],"Evidence":[141],"field-assisted":[144],"emission":[145,224],"electrons":[148,226,236],"with":[149],"pressure-dependent":[151],"onset":[152],"field":[153,223],"found":[155,209],"lag":[158],"measurements.":[159],"An":[160],"empirical":[161],"expression":[162],"derived":[164],"based":[165],"on":[166,184],"Fowler\u2013Nordheim":[168],"formula":[169],"quantify":[171],"generation":[175],"rate.":[176],"expected":[178],"dependence":[179,202],"threshold":[183],"cathode":[186,229,239],"(work":[188],"function)":[189],"was":[190,207],"confirmed":[191],"voltages":[197,213],"(Townsend":[198],"mechanism).":[199,218],"Interestingly,":[200],"also":[208],"(dominated":[214],"by":[215],"streamer":[217],"This":[219],"suggests":[220],"dominant":[232],"source":[233],"large":[238],"electric":[240],"fields.":[241]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
