{"id":"https://openalex.org/W4225624948","doi":"https://doi.org/10.1109/access.2022.3168861","title":"LPViT: A Transformer Based Model for PCB Image Classification and Defect Detection","display_name":"LPViT: A Transformer Based Model for PCB Image Classification and Defect Detection","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4225624948","doi":"https://doi.org/10.1109/access.2022.3168861"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3168861","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3168861","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09760408.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09760408.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012793332","display_name":"Kang An","orcid":"https://orcid.org/0000-0002-9498-5044"},"institutions":[{"id":"https://openalex.org/I163151501","display_name":"Hangzhou Normal University","ror":"https://ror.org/014v1mr15","country_code":"CN","type":"education","lineage":["https://openalex.org/I163151501"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kang An","raw_affiliation_strings":["Qianjiang College, Hangzhou Normal University, Hangzhou, China","ORCiD"],"raw_orcid":"https://orcid.org/0000-0002-9498-5044","affiliations":[{"raw_affiliation_string":"Qianjiang College, Hangzhou Normal University, Hangzhou, China","institution_ids":["https://openalex.org/I163151501"]},{"raw_affiliation_string":"ORCiD","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100430705","display_name":"Yanping Zhang","orcid":"https://orcid.org/0000-0002-5678-3038"},"institutions":[{"id":"https://openalex.org/I119888943","display_name":"Gonzaga University","ror":"https://ror.org/03ze70h02","country_code":"US","type":"education","lineage":["https://openalex.org/I119888943"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yanping Zhang","raw_affiliation_strings":["Department of Computer Science, Gonzaga University, Spokane, WA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Gonzaga University, Spokane, WA, USA","institution_ids":["https://openalex.org/I119888943"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5012793332"],"corresponding_institution_ids":["https://openalex.org/I163151501"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":10.0312,"has_fulltext":true,"cited_by_count":85,"citation_normalized_percentile":{"value":0.98436464,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"10","issue":null,"first_page":"42542","last_page":"42553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.549708366394043},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.4734344482421875},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45390287041664124},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.426043838262558},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4119134545326233},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14763233065605164},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1392505168914795},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11698469519615173}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.549708366394043},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4734344482421875},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45390287041664124},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.426043838262558},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4119134545326233},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14763233065605164},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1392505168914795},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11698469519615173}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3168861","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3168861","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09760408.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a1238ba84f5f4a59a3e39078e4e4ca4f","is_oa":true,"landing_page_url":"https://doaj.org/article/a1238ba84f5f4a59a3e39078e4e4ca4f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 42542-42553 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3168861","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3168861","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09760408.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1731340591","display_name":null,"funder_award_id":"2022QJJL08","funder_id":"https://openalex.org/F4320324716","funder_display_name":"Hangzhou Normal University"}],"funders":[{"id":"https://openalex.org/F4320324716","display_name":"Hangzhou Normal University","ror":"https://ror.org/014v1mr15"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4225624948.pdf","grobid_xml":"https://content.openalex.org/works/W4225624948.grobid-xml"},"referenced_works_count":42,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1522301498","https://openalex.org/W1940872118","https://openalex.org/W1945616565","https://openalex.org/W2108598243","https://openalex.org/W2132346196","https://openalex.org/W2132971773","https://openalex.org/W2157331557","https://openalex.org/W2180612164","https://openalex.org/W2194775991","https://openalex.org/W2243397390","https://openalex.org/W2896457183","https://openalex.org/W2914154500","https://openalex.org/W2953356739","https://openalex.org/W2963389226","https://openalex.org/W2963855133","https://openalex.org/W2965373594","https://openalex.org/W2970546341","https://openalex.org/W2975244163","https://openalex.org/W2996428491","https://openalex.org/W2997200074","https://openalex.org/W3096609285","https://openalex.org/W3101310341","https://openalex.org/W3109915642","https://openalex.org/W3118710621","https://openalex.org/W3135799552","https://openalex.org/W3170841864","https://openalex.org/W3170874841","https://openalex.org/W3171162369","https://openalex.org/W3186516637","https://openalex.org/W3194737599","https://openalex.org/W3204240075","https://openalex.org/W6631190155","https://openalex.org/W6640362995","https://openalex.org/W6640425456","https://openalex.org/W6729756640","https://openalex.org/W6739901393","https://openalex.org/W6755207826","https://openalex.org/W6759044181","https://openalex.org/W6766673545","https://openalex.org/W6768021236","https://openalex.org/W6788135285"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"PCB":[0,132],"(printed":[1],"circuit":[2],"board)":[3],"is":[4,155],"an":[5],"extremely":[6],"important":[7],"component":[8],"of":[9,21,30,38,48,53,56,81,85,97,113,127,131,141,149,168,196],"all":[10],"electronic":[11,49,145],"products,":[12,50,146],"which":[13,32,125,158,192],"has":[14],"greatly":[15,172],"facilitated":[16],"human":[17],"life.":[18],"Meanwhile,":[19],"tons":[20],"PCBs":[22,39,154,170],"in":[23,40,211],"the":[24,34,44,51,63,79,92,117,122,174,181],"waste":[25,29],"streams":[26],"become":[27],"a":[28,104,147,185],"resources,":[31],"puts":[33],"recycling":[35,47,140,175],"and":[36,46,58,69,73,95,111,139,152,166,176,200,214],"reuse":[37,177],"urgent":[41],"need.":[42],"In":[43,99],"manufacturing":[45,138],"classification":[52,70,112,165,182,213],"PCBs,":[54],"recognition":[55,96,167],"sub-components,":[57],"defect":[59,109,118,215],"detection":[60,68,94,110,119,135,216],"have":[61,88],"been":[62,89],"key":[64],"technology.":[65],"Traditional":[66],"manual":[67],"are":[71,159],"subjective":[72],"rely":[74],"on":[75,121,184],"individuals\u2019":[76],"experience.":[77],"With":[78],"development":[80],"artificial":[82],"intelligence,":[83],"lots":[84],"research":[86],"efforts":[87],"dedicated":[90],"to":[91,161],"automated":[93],"PCBs.":[98,114,142,202],"this":[100],"paper,":[101],"we":[102],"propose":[103],"transformer-based":[105],"model,":[106],"LPViT,":[107],"for":[108],"We":[115,179],"conduct":[116,180],"task":[120,183],"dataset":[123,186],"DeepPCB,":[124],"consists":[126],"six":[128],"different":[129],"types":[130,195],"defects.":[133],"Defect":[134],"benefits":[136],"both":[137,212],"Among":[143],"many":[144],"group":[148],"affordable,":[150,199],"general-purpose,":[151,198],"small-size":[153],"very":[156],"popular,":[157,197],"referred":[160],"as":[162],"micro-PCBs.":[163],"The":[164],"those":[169],"will":[171],"facilitate":[173],"process.":[178],"called":[187],"<bold":[188],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[189],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">micro-PCB</b>":[190],",":[191],"includes":[193],"12":[194],"small":[201],"Through":[203],"comparative":[204],"experiments,":[205],"our":[206],"system":[207],"demonstrates":[208],"its":[209],"advantage":[210],"tasks.":[217]},"counts_by_year":[{"year":2026,"cited_by_count":11},{"year":2025,"cited_by_count":36},{"year":2024,"cited_by_count":21},{"year":2023,"cited_by_count":12},{"year":2022,"cited_by_count":5}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}