{"id":"https://openalex.org/W4226307203","doi":"https://doi.org/10.1109/access.2022.3165050","title":"Joint Maintenance Decision Based on Remaining Useful Lifetime Prediction Using Accelerated Degradation Data","display_name":"Joint Maintenance Decision Based on Remaining Useful Lifetime Prediction Using Accelerated Degradation Data","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4226307203","doi":"https://doi.org/10.1109/access.2022.3165050"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3165050","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3165050","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09749273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09749273.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067794400","display_name":"Dingyuan Xue","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104252","display_name":"Air Force Engineering University","ror":"https://ror.org/00seraz22","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]},{"id":"https://openalex.org/I4210162457","display_name":"Fujian Institute of Oceanography","ror":"https://ror.org/059qzzv16","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210162457"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dingyuan Xue","raw_affiliation_strings":["Equipment Management & UAV Engineering College, Air Force Engineering University, Xi’an, China","China Coast Gurad 3rd Bureauo, Qionghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Equipment Management & UAV Engineering College, Air Force Engineering University, Xi’an, China","institution_ids":["https://openalex.org/I4210104252"]},{"raw_affiliation_string":"China Coast Gurad 3rd Bureauo, Qionghai, China","institution_ids":["https://openalex.org/I4210162457"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101939274","display_name":"Zezhou Wang","orcid":"https://orcid.org/0000-0003-4148-0496"},"institutions":[{"id":"https://openalex.org/I4210138647","display_name":"Hanzhong People's Hospital","ror":"https://ror.org/02zq48n91","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210138647"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zezhou Wang","raw_affiliation_strings":["No. 93920 Unit of PLA, Hanzhong, China"],"raw_orcid":"https://orcid.org/0000-0003-4148-0496","affiliations":[{"raw_affiliation_string":"No. 93920 Unit of PLA, Hanzhong, China","institution_ids":["https://openalex.org/I4210138647"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100612937","display_name":"Yu Chen","orcid":"https://orcid.org/0000-0001-9459-9349"},"institutions":[{"id":"https://openalex.org/I4210104252","display_name":"Air Force Engineering University","ror":"https://ror.org/00seraz22","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunxiang Chen","raw_affiliation_strings":["Equipment Management & UAV Engineering College, Air Force Engineering University, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Equipment Management & UAV Engineering College, Air Force Engineering University, Xi’an, China","institution_ids":["https://openalex.org/I4210104252"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6215,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.64173228,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"10","issue":null,"first_page":"38650","last_page":"38663"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.8709077835083008},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6589736342430115},{"id":"https://openalex.org/keywords/joint","display_name":"Joint (building)","score":0.643561840057373},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6191405057907104},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5602827072143555},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.545276939868927},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43670931458473206},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4334174394607544},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.43334415555000305},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19494429230690002},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10258796811103821},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.08339691162109375}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.8709077835083008},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6589736342430115},{"id":"https://openalex.org/C18555067","wikidata":"https://www.wikidata.org/wiki/Q8375051","display_name":"Joint (building)","level":2,"score":0.643561840057373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6191405057907104},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5602827072143555},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.545276939868927},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43670931458473206},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4334174394607544},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.43334415555000305},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19494429230690002},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10258796811103821},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.08339691162109375},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3165050","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3165050","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09749273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6ec09fec37b14a38a23088362446afa2","is_oa":true,"landing_page_url":"https://doaj.org/article/6ec09fec37b14a38a23088362446afa2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 38650-38663 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3165050","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3165050","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09749273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1219923732","display_name":"\u590d\u6742\u975e\u7ebf\u6027\u76d1\u6d4b\u6570\u636e\u9a71\u52a8\u7684\u673a\u8f7d\u7535\u5b50\u8bbe\u5907\u5269\u4f59\u5bff\u547d\u9884\u6d4b\u65b9\u6cd5\u7814\u7a76","funder_award_id":"71901216","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4226307203.pdf","grobid_xml":"https://content.openalex.org/works/W4226307203.grobid-xml"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W1968453130","https://openalex.org/W1982328533","https://openalex.org/W2000500586","https://openalex.org/W2006287597","https://openalex.org/W2092384586","https://openalex.org/W2107940281","https://openalex.org/W2110007571","https://openalex.org/W2119865312","https://openalex.org/W2123924019","https://openalex.org/W2170884511","https://openalex.org/W2323725072","https://openalex.org/W2782127857","https://openalex.org/W2809096770","https://openalex.org/W2924907380","https://openalex.org/W2930906122","https://openalex.org/W2943938514","https://openalex.org/W2997458289","https://openalex.org/W4388998567","https://openalex.org/W6730306680"],"related_works":["https://openalex.org/W2376859990","https://openalex.org/W2912704652","https://openalex.org/W2381161177","https://openalex.org/W2319226115","https://openalex.org/W830772239","https://openalex.org/W2970750595","https://openalex.org/W2366601680","https://openalex.org/W4295074292","https://openalex.org/W2392193501","https://openalex.org/W2738649048"],"abstract_inverted_index":{"Existing":[0],"joint":[1,19,104,143],"maintenance":[2,20],"decision":[3,21],"research":[4],"typically":[5],"ignores":[6],"remaining":[7],"useful":[8],"lifetime":[9],"(RUL)":[10],"predictions":[11],"for":[12,23,38,107,146],"the":[13,24,57,61,68,74,85,91,99,108,124,132,138,142],"accelerated":[14,35,51,79],"degradation":[15,36,80],"of":[16,76,84,134,141],"equipment.":[17],"A":[18],"method":[22,126],"replacement":[25,109,148],"and":[26,64,110,119,137,149],"spare-parts":[27,111],"ordering":[28,112],"strategy":[29,113],"based":[30,72,97],"on":[31,73,98],"RUL":[32,47,100,135],"prediction":[33,48,101,136],"using":[34],"data":[37,83],"equipment":[39,86,147],"is":[40,53,114,127,153],"proposed":[41,125],"in":[42,67],"this":[43],"paper.":[44],"First,":[45],"an":[46],"model":[49,106],"under":[50],"stress":[52],"built":[54],"by":[55],"considering":[56],"proportional":[58],"relationship":[59],"between":[60],"drift":[62],"coefficient":[63,66],"diffusion":[65],"Wiener":[69],"process.":[70],"Second,":[71],"principle":[75],"step-by-step":[77],"estimation,":[78],"test":[81],"(ADT)":[82],"are":[87],"used":[88],"to":[89,129,155],"estimate":[90],"a":[92,103],"priori":[93],"unknown":[94],"parameters.":[95],"Finally,":[96],"results,":[102],"optimization":[105,144],"developed.":[115],"Through":[116],"example":[117],"verification":[118],"cost":[120],"parameter":[121],"sensitivity":[122],"analysis,":[123],"shown":[128],"effectively":[130],"improve":[131],"accuracy":[133],"scientific":[139],"value":[140],"plan":[145],"spare-part":[150],"ordering,":[151],"which":[152],"important":[154],"many":[156],"engineering":[157],"applications.":[158]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}