{"id":"https://openalex.org/W4226329760","doi":"https://doi.org/10.1109/access.2022.3160179","title":"An EfficientNet-Based Weighted Ensemble Model for Industrial Machine Malfunction Detection Using Acoustic Signals","display_name":"An EfficientNet-Based Weighted Ensemble Model for Industrial Machine Malfunction Detection Using Acoustic Signals","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4226329760","doi":"https://doi.org/10.1109/access.2022.3160179"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3160179","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3160179","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09737110.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09737110.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014306565","display_name":"Bayu Adhi Tama","orcid":"https://orcid.org/0000-0002-1821-6438"},"institutions":[{"id":"https://openalex.org/I4210104335","display_name":"Institute for Basic Science","ror":"https://ror.org/00y0zf565","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210104335"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bayu Adhi Tama","raw_affiliation_strings":["Center for Mathematical and Computational Sciences, Data Science Group, Institute for Basic Science (IBS), Yuseong-gu, Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-1821-6438","affiliations":[{"raw_affiliation_string":"Center for Mathematical and Computational Sciences, Data Science Group, Institute for Basic Science (IBS), Yuseong-gu, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I4210104335"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010034247","display_name":"Malinda Vania","orcid":"https://orcid.org/0000-0002-1946-0678"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Malinda Vania","raw_affiliation_strings":["Department of Industrial Engineering, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea","Institute for the 4th Industrial Revolution, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-1946-0678","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea","institution_ids":["https://openalex.org/I48566637"]},{"raw_affiliation_string":"Institute for the 4th Industrial Revolution, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072108792","display_name":"Iljung Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Iljung Kim","raw_affiliation_strings":["Manufacturing AI Big Data Centre, Korea Advanced Institute of Science and Technology, Yuseong-gu, Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manufacturing AI Big Data Centre, Korea Advanced Institute of Science and Technology, Yuseong-gu, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049525333","display_name":"Sunghoon Lim","orcid":"https://orcid.org/0000-0001-9534-7397"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sunghoon Lim","raw_affiliation_strings":["Department of Industrial Engineering, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea","Institute for the 4th Industrial Revolution, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-9534-7397","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea","institution_ids":["https://openalex.org/I48566637"]},{"raw_affiliation_string":"Institute for the 4th Industrial Revolution, Ulsan National Institute of Science and Technology, Eonyang-eup, Ulju-gun, Ulsan, Republic of Korea","institution_ids":["https://openalex.org/I48566637"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.0521,"has_fulltext":true,"cited_by_count":23,"citation_normalized_percentile":{"value":0.9232405,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"10","issue":null,"first_page":"34625","last_page":"34636"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.977400004863739,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6997263431549072},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.3829765021800995},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35446232557296753},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3290981352329254}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6997263431549072},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.3829765021800995},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35446232557296753},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3290981352329254}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2022.3160179","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3160179","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09737110.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a4af1eb954e44b838caab905d6d93362","is_oa":false,"landing_page_url":"https://doaj.org/article/a4af1eb954e44b838caab905d6d93362","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 34625-34636 (2022)","raw_type":"article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/57732","is_oa":true,"landing_page_url":"https://ieeexplore.ieee.org/document/9737110/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3160179","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3160179","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09737110.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G4349335482","display_name":null,"funder_award_id":"1.220083","funder_id":"https://openalex.org/F4320321348","funder_display_name":"Ulsan National Institute of Science and Technology"},{"id":"https://openalex.org/G5347508464","display_name":null,"funder_award_id":"2021-0-01139","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G5885902318","display_name":null,"funder_award_id":"IBS-R029-C2","funder_id":"https://openalex.org/F4320326441","funder_display_name":"Institute for Basic Science"},{"id":"https://openalex.org/G7932235374","display_name":null,"funder_award_id":"2021R1F1A1046416","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G8153571473","display_name":null,"funder_award_id":"2021R1F1A1046416","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"},{"id":"https://openalex.org/G8638632877","display_name":null,"funder_award_id":"1.210095","funder_id":"https://openalex.org/F4320321348","funder_display_name":"Ulsan National Institute of Science and Technology"},{"id":"https://openalex.org/G8896287674","display_name":null,"funder_award_id":"IBS-R029-C2-001","funder_id":"https://openalex.org/F4320326441","funder_display_name":"Institute for Basic Science"},{"id":"https://openalex.org/G8947125434","display_name":null,"funder_award_id":"IBS-R029-C2","funder_id":"https://openalex.org/F4320320671","funder_display_name":"National Research Foundation"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321348","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748"},{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320326441","display_name":"Institute for Basic Science","ror":"https://ror.org/00y0zf565"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4226329760.pdf","grobid_xml":"https://content.openalex.org/works/W4226329760.grobid-xml"},"referenced_works_count":54,"referenced_works":["https://openalex.org/W29108580","https://openalex.org/W1981031771","https://openalex.org/W1984672166","https://openalex.org/W1985892116","https://openalex.org/W2033800551","https://openalex.org/W2076063813","https://openalex.org/W2117539524","https://openalex.org/W2150765167","https://openalex.org/W2191779130","https://openalex.org/W2291261022","https://openalex.org/W2292996718","https://openalex.org/W2334484203","https://openalex.org/W2339813126","https://openalex.org/W2513156290","https://openalex.org/W2530232445","https://openalex.org/W2607306668","https://openalex.org/W2771164042","https://openalex.org/W2794937634","https://openalex.org/W2891503716","https://openalex.org/W2900954917","https://openalex.org/W2903557836","https://openalex.org/W2904907152","https://openalex.org/W2919115771","https://openalex.org/W2941606269","https://openalex.org/W2953212265","https://openalex.org/W2969713813","https://openalex.org/W2971330344","https://openalex.org/W2981731882","https://openalex.org/W2982294822","https://openalex.org/W2999309192","https://openalex.org/W3015356122","https://openalex.org/W3015898873","https://openalex.org/W3033798382","https://openalex.org/W3033907960","https://openalex.org/W3042795548","https://openalex.org/W3087644100","https://openalex.org/W3116286104","https://openalex.org/W3130472073","https://openalex.org/W3131491382","https://openalex.org/W3152710014","https://openalex.org/W3169297916","https://openalex.org/W3174540415","https://openalex.org/W3178175559","https://openalex.org/W3197081342","https://openalex.org/W3202911331","https://openalex.org/W3207555018","https://openalex.org/W3214039631","https://openalex.org/W6638214083","https://openalex.org/W6762718338","https://openalex.org/W6779369353","https://openalex.org/W6780257151","https://openalex.org/W6781464548","https://openalex.org/W6786135365","https://openalex.org/W6793775187"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2033914206","https://openalex.org/W2042327336"],"abstract_inverted_index":{"Detecting":[0],"and":[1,20,48,72,88,107,125],"preventing":[2],"industrial":[3,38,60,76],"machine":[4,14,39,61],"failures":[5,15],"are":[6],"significant":[7],"in":[8,43],"the":[9,112],"modern":[10],"manufacturing":[11,21,49],"industry":[12],"because":[13],"substantially":[16],"increase":[17],"both":[18],"maintenance":[19,47],"costs.":[22,50],"Recently,":[23],"state-of-the-art":[24],"deep":[25,58],"learning":[26],"techniques":[27],"that":[28,65,111],"use":[29],"acoustic":[30,67],"signals":[31,68],"have":[32],"been":[33],"widely":[34],"applied":[35],"to":[36,45,69,92],"solve":[37],"malfunction":[40,62],"detection":[41,63],"problems":[42],"order":[44],"reduce":[46],"The":[51],"authors":[52],"of":[53,75],"this":[54],"research":[55],"propose":[56],"a":[57,80],"learning-based":[59],"model":[64,83,117],"uses":[66],"classify":[70],"normal":[71],"abnormal":[73],"conditions":[74],"machines.":[77],"In":[78],"particular,":[79],"weighted":[81,115],"ensemble":[82,116,127],"based":[84],"on":[85],"EfficientNet-B0,":[86],"B5,":[87],"B7":[89],"is":[90],"considered":[91],"improve":[93],"classification":[94,120],"performance.":[95],"Case":[96],"studies":[97],"involving":[98],"an":[99],"open":[100],"dataset":[101],"for":[102],"Malfunctioning":[103],"Industrial":[104],"Machine":[105],"Investigation":[106],"Inspection":[108],"(MIMII)":[109],"validate":[110],"proposed":[113],"EfficientNet-based":[114],"provides":[118],"better":[119],"performance":[121],"than":[122],"individual":[123],"classifiers":[124],"other":[126],"models.":[128]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}