{"id":"https://openalex.org/W4213423210","doi":"https://doi.org/10.1109/access.2022.3154410","title":"Bearing Fault Detection in ASD-Powered Induction Machine Using MODWT and Image Edge Detection","display_name":"Bearing Fault Detection in ASD-Powered Induction Machine Using MODWT and Image Edge Detection","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4213423210","doi":"https://doi.org/10.1109/access.2022.3154410"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3154410","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3154410","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09721248.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09721248.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038218503","display_name":"Victor Avi\u00f1a-Corral","orcid":"https://orcid.org/0000-0002-3537-8295"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Avina-Corral","raw_affiliation_strings":["Digital Systems Group, Electronics Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital Systems Group, Electronics Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010423760","display_name":"Jose Rangel\u2010Magdaleno","orcid":"https://orcid.org/0000-0003-2785-5060"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Jose de Jesus Rangel-Magdaleno","raw_affiliation_strings":["Digital Systems Group, Electronics Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico"],"raw_orcid":"https://orcid.org/0000-0003-2785-5060","affiliations":[{"raw_affiliation_string":"Digital Systems Group, Electronics Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032036781","display_name":"Hayde Peregrina\u2010Barreto","orcid":"https://orcid.org/0000-0002-8623-091X"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Hayde Peregrina-Barreto","raw_affiliation_strings":["Computer Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084917273","display_name":"Juan Manuel Ram\u00edrez-Cort\u00e9s","orcid":"https://orcid.org/0000-0002-8515-2489"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Juan Manuel Ramirez-Cortes","raw_affiliation_strings":["Digital Systems Group, Electronics Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico"],"raw_orcid":"https://orcid.org/0000-0002-8515-2489","affiliations":[{"raw_affiliation_string":"Digital Systems Group, Electronics Department, Instituto Nacional de Astrof&#x00ED;sica &#x00D3;ptica y Electr&#x00F3;nica, Puebla, Mexico","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.6682,"has_fulltext":true,"cited_by_count":20,"citation_normalized_percentile":{"value":0.82290816,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"10","issue":null,"first_page":"24181","last_page":"24193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11201","display_name":"Metallurgy and Material Forming","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discrete-wavelet-transform","display_name":"Discrete wavelet transform","score":0.6372770667076111},{"id":"https://openalex.org/keywords/stator","display_name":"Stator","score":0.6332859992980957},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6129734516143799},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5764697790145874},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5137492418289185},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.508344829082489},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.49902772903442383},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.4797966778278351},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.47554752230644226},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.47521573305130005},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46951884031295776},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43942171335220337},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.4300849437713623},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4248684346675873},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.371926486492157},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3715253472328186},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3095552921295166},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.27008751034736633},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1688399314880371}],"concepts":[{"id":"https://openalex.org/C46286280","wikidata":"https://www.wikidata.org/wiki/Q2414958","display_name":"Discrete wavelet transform","level":4,"score":0.6372770667076111},{"id":"https://openalex.org/C2776529397","wikidata":"https://www.wikidata.org/wiki/Q190312","display_name":"Stator","level":2,"score":0.6332859992980957},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6129734516143799},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5764697790145874},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5137492418289185},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.508344829082489},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.49902772903442383},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4797966778278351},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.47554752230644226},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.47521573305130005},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46951884031295776},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43942171335220337},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.4300849437713623},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4248684346675873},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.371926486492157},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3715253472328186},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3095552921295166},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.27008751034736633},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1688399314880371},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3154410","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3154410","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09721248.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:26e938c559b84eddbffcb59a37fb1fca","is_oa":true,"landing_page_url":"https://doaj.org/article/26e938c559b84eddbffcb59a37fb1fca","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 24181-24193 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3154410","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3154410","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09721248.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4213423210.pdf","grobid_xml":"https://content.openalex.org/works/W4213423210.grobid-xml"},"referenced_works_count":44,"referenced_works":["https://openalex.org/W1964671517","https://openalex.org/W1977313763","https://openalex.org/W2057318207","https://openalex.org/W2074349894","https://openalex.org/W2117582079","https://openalex.org/W2125849121","https://openalex.org/W2147027366","https://openalex.org/W2162903549","https://openalex.org/W2230524333","https://openalex.org/W2263083964","https://openalex.org/W2302880132","https://openalex.org/W2313615391","https://openalex.org/W2406655805","https://openalex.org/W2590444036","https://openalex.org/W2592896886","https://openalex.org/W2622758971","https://openalex.org/W2736225434","https://openalex.org/W2753297335","https://openalex.org/W2799501716","https://openalex.org/W2802885470","https://openalex.org/W2820290399","https://openalex.org/W2891321154","https://openalex.org/W2918880240","https://openalex.org/W2922367511","https://openalex.org/W2947645980","https://openalex.org/W2955535881","https://openalex.org/W2994887188","https://openalex.org/W3000357022","https://openalex.org/W3015737837","https://openalex.org/W3034139912","https://openalex.org/W3038356857","https://openalex.org/W3045546070","https://openalex.org/W3094254175","https://openalex.org/W3123380226","https://openalex.org/W3127815279","https://openalex.org/W3128862510","https://openalex.org/W3130195902","https://openalex.org/W3132695373","https://openalex.org/W3132883488","https://openalex.org/W3138116568","https://openalex.org/W3184703656","https://openalex.org/W3189111616","https://openalex.org/W3197324956","https://openalex.org/W4312499228"],"related_works":["https://openalex.org/W2763966779","https://openalex.org/W1577789985","https://openalex.org/W2739734757","https://openalex.org/W2174290408","https://openalex.org/W2792520941","https://openalex.org/W2047056993","https://openalex.org/W2112061901","https://openalex.org/W2390482320","https://openalex.org/W1994967090","https://openalex.org/W57803080"],"abstract_inverted_index":{"Today":[0],"the":[1,32,36,49,85,124,128,131,134,153,158,161,178,191,195],"industry":[2],"depends":[3],"on":[4,61],"various":[5],"types":[6,77],"of":[7,35,53,78,97,127,133,155,194,201],"three-phase":[8],"induction":[9],"machines,":[10],"requiring":[11],"operating":[12,92],"at":[13,157,198],"variable":[14],"speeds":[15],"to":[16,25,30,123,171,177],"perform":[17,39],"more":[18],"complex":[19],"processes.":[20],"Therefore,":[21],"it":[22],"is":[23,117,137,143,184],"vital":[24],"monitor":[26],"their":[27],"operation":[28],"conditions":[29,93],"maintain":[31],"optimal":[33],"efficiency":[34],"processes":[37],"they":[38],"and":[40,51,67,106,145,173,203],"avoid":[41],"significant":[42],"economic":[43],"losses.":[44],"The":[45,82,111],"proposed":[46],"work":[47],"presents":[48],"design":[50],"development":[52],"a":[54,102,139,149,167],"method":[55],"for":[56,70,84,94],"bearing":[57],"damage":[58,79,202],"detection":[59,180],"based":[60],"Maximal":[62,112],"Overlap":[63,113],"Discrete":[64,114],"Wavelet":[65,115],"Transform":[66,116],"image":[68],"processing":[69],"edge":[71],"detection.":[72],"Accuracies":[73],"achieved":[74],"with":[75,119,166],"three":[76,125,196],"exceed":[80],"90%.":[81],"signals":[83,136],"test":[86],"are":[87,164],"acquired":[88],"from":[89,101,190],"seven":[90],"different":[91,120,199],"each":[95],"type":[96],"damage.":[98],"Supply":[99],"comes":[100],"power":[103],"grid":[104],"source":[105],"an":[107],"adjustable":[108],"speed":[109],"drive.":[110],"applied":[118],"filtering":[121],"levels":[122],"phases":[126,197],"stator":[129],"current,":[130],"magnitude":[132,193],"filtered":[135],"acquired,":[138],"periodic":[140],"two-dimensional":[141],"array":[142],"generated":[144],"further":[146],"smoothed":[147],"by":[148],"Gaussian":[150],"filter":[151],"allowing":[152],"observation":[154],"patterns":[156,175],"edges.":[159],"Finally,":[160],"obtained":[162,189],"images":[163],"scanned":[165],"2-D":[168],"mask":[169],"aiming":[170],"detect":[172],"count":[174],"associated":[176],"fault":[179],"process.":[181],"Statistical":[182],"analysis":[183],"performed":[185],"over":[186],"characteristic":[187],"signatures":[188],"current":[192],"classes":[200],"several":[204],"mechanical":[205],"load":[206],"conditions.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}
