{"id":"https://openalex.org/W4213041979","doi":"https://doi.org/10.1109/access.2022.3152202","title":"Reduced Resolution Redundancy: A Novel Approximate Error Mitigation Technique","display_name":"Reduced Resolution Redundancy: A Novel Approximate Error Mitigation Technique","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4213041979","doi":"https://doi.org/10.1109/access.2022.3152202"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3152202","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3152202","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09715068.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09715068.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082150628","display_name":"Luis A. Garc\u00eda-Astudillo","orcid":"https://orcid.org/0000-0001-7287-4477"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Luis A. Garcia-Astudillo","raw_affiliation_strings":["Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0001-7287-4477","affiliations":[{"raw_affiliation_string":"Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022411878","display_name":"Luis Entrena","orcid":"https://orcid.org/0000-0001-6021-165X"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Luis Entrena","raw_affiliation_strings":["Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0001-6021-165X","affiliations":[{"raw_affiliation_string":"Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073896117","display_name":"Almudena Lindoso","orcid":"https://orcid.org/0000-0001-5870-6493"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Almudena Lindoso","raw_affiliation_strings":["Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0001-5870-6493","affiliations":[{"raw_affiliation_string":"Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088736485","display_name":"Honorio Mart\u00edn","orcid":"https://orcid.org/0000-0002-8720-406X"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Honorio Martin","raw_affiliation_strings":["Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0002-8720-406X","affiliations":[{"raw_affiliation_string":"Department of Electronic Technology, Universidad Carlos III de Madrid, Leganés, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.554,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.62614664,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"10","issue":null,"first_page":"20643","last_page":"20651"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8976974487304688},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8156214952468872},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7403877973556519},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5644330978393555},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.554142951965332},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4962158799171448},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.46362781524658203},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43113645911216736},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.33422988653182983},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32775259017944336},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.11915594339370728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06805729866027832}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8976974487304688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8156214952468872},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7403877973556519},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5644330978393555},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.554142951965332},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4962158799171448},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.46362781524658203},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43113645911216736},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.33422988653182983},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32775259017944336},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.11915594339370728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06805729866027832},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2022.3152202","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3152202","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09715068.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:e-archivo.uc3m.es:10016/37122","is_oa":true,"landing_page_url":"http://hdl.handle.net/10016/37122","pdf_url":"https://e-archivo.uc3m.es/bitstreams/45fc6438-f079-4dab-9f3e-02324f8cc414/download","source":{"id":"https://openalex.org/S4306400817","display_name":"e-Archivo (Carlos III University of Madrid)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I50357001","host_organization_name":"Universidad Carlos III de Madrid","host_organization_lineage":["https://openalex.org/I50357001"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:0b5f66f2009040ad84b71ad3101b7b81","is_oa":true,"landing_page_url":"https://doaj.org/article/0b5f66f2009040ad84b71ad3101b7b81","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 20643-20651 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3152202","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3152202","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09715068.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.47999998927116394}],"awards":[{"id":"https://openalex.org/G290231844","display_name":null,"funder_award_id":"49.520608.9.18","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"},{"id":"https://openalex.org/G3690828678","display_name":null,"funder_award_id":"PID2019","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"},{"id":"https://openalex.org/G4529340259","display_name":null,"funder_award_id":"PID2019-106455GB-C21","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"},{"id":"https://openalex.org/G8424053550","display_name":null,"funder_award_id":"49.520608.9.18","funder_id":"https://openalex.org/F4320313831","funder_display_name":"Comunidad de Madrid"}],"funders":[{"id":"https://openalex.org/F4320313831","display_name":"Comunidad de Madrid","ror":null},{"id":"https://openalex.org/F4320322930","display_name":"Ministerio de Ciencia e Innovaci\u00f3n","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4213041979.pdf","grobid_xml":"https://content.openalex.org/works/W4213041979.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W611078108","https://openalex.org/W1900969659","https://openalex.org/W1987060010","https://openalex.org/W2002442027","https://openalex.org/W2053850205","https://openalex.org/W2076602574","https://openalex.org/W2107740459","https://openalex.org/W2116473596","https://openalex.org/W2153079001","https://openalex.org/W2160451204","https://openalex.org/W2524860678","https://openalex.org/W2980921307","https://openalex.org/W3140688654","https://openalex.org/W3207617813","https://openalex.org/W4213370401","https://openalex.org/W6676503097","https://openalex.org/W6732797307"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W2797678940","https://openalex.org/W3008821054","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2000379092","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W1836055744"],"abstract_inverted_index":{"Error":[0],"mitigation":[1,30,85],"techniques,":[2],"such":[3],"as":[4],"Triple":[5],"Modular":[6],"Redundancy,":[7],"introduce":[8],"very":[9],"large":[10],"overheads.":[11],"To":[12],"alleviate":[13],"this":[14,22],"overhead,":[15],"approximate":[16,28],"techniques":[17],"can":[18,75],"be":[19],"used.":[20],"In":[21],"work":[23],"we":[24],"propose":[25],"a":[26,41,50,88],"novel":[27],"error":[29,84],"technique":[31],"based":[32],"on":[33],"using":[34],"redundant":[35],"circuits":[36],"with":[37],"lower":[38],"resolution.":[39],"As":[40],"representative":[42],"case":[43],"study,":[44],"the":[45,78],"approach":[46,62],"is":[47,59,63],"demonstrated":[48],"for":[49,54],"Fast":[51],"Fourier":[52],"Transform,":[53],"which":[55],"an":[56,82],"optimized":[57],"architecture":[58],"proposed.":[60],"The":[61],"validated":[64],"through":[65],"fault":[66],"injection.":[67],"Experimental":[68],"results":[69],"show":[70],"that":[71],"Reduced":[72],"Resolution":[73],"Redundancy":[74],"significantly":[76],"reduce":[77],"overhead":[79],"and":[80,87],"achieve":[81],"excellent":[83],"performance":[86],"low":[89],"sensitivity":[90],"to":[91],"uncorrectable":[92],"errors.":[93]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}