{"id":"https://openalex.org/W4206913228","doi":"https://doi.org/10.1109/access.2022.3145974","title":"Transient Electromagnetic Weak Signal Extraction Method Based on Multi-Scale Combined Difference Product Morphological Filtering","display_name":"Transient Electromagnetic Weak Signal Extraction Method Based on Multi-Scale Combined Difference Product Morphological Filtering","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4206913228","doi":"https://doi.org/10.1109/access.2022.3145974"},"language":"en","primary_location":{"id":"doi:10.1109/access.2022.3145974","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3145974","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09690888.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09690888.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012941225","display_name":"Jiansheng Bai","orcid":"https://orcid.org/0000-0001-8715-3939"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiansheng Bai","raw_affiliation_strings":["School of Information and Communication Engineering, North University of China, Taiyuan, China","State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100680075","display_name":"Jinjie Yao","orcid":"https://orcid.org/0009-0002-8442-8284"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinjie Yao","raw_affiliation_strings":["School of Information and Communication Engineering, North University of China, Taiyuan, China","State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100778016","display_name":"Zhiliang Yang","orcid":"https://orcid.org/0000-0002-5029-6239"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Yang","raw_affiliation_strings":["School of Information and Communication Engineering, North University of China, Taiyuan, China","State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072250089","display_name":"Yurong Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yurong Guo","raw_affiliation_strings":["School of Information and Communication Engineering, North University of China, Taiyuan, China","State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100665083","display_name":"Liming Wang","orcid":"https://orcid.org/0000-0002-3128-2747"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liming Wang","raw_affiliation_strings":["School of Information and Communication Engineering, North University of China, Taiyuan, China","State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5012941225"],"corresponding_institution_ids":["https://openalex.org/I135714990"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.1684,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.75537308,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":97},"biblio":{"volume":"10","issue":null,"first_page":"22140","last_page":"22149"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11698","display_name":"Underwater Acoustics Research","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1910","display_name":"Oceanography"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11698","display_name":"Underwater Acoustics Research","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1910","display_name":"Oceanography"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/kurtosis","display_name":"Kurtosis","score":0.5936853885650635},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5907695293426514},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5860486626625061},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.56415194272995},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5516112446784973},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5234469771385193},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4989206790924072},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4788739085197449},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4677439033985138},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.3467942476272583},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2781338691711426},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.16317802667617798},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15957418084144592},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14395684003829956},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12162938714027405},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.11623618006706238},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.08423838019371033}],"concepts":[{"id":"https://openalex.org/C166963901","wikidata":"https://www.wikidata.org/wiki/Q287251","display_name":"Kurtosis","level":2,"score":0.5936853885650635},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5907695293426514},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5860486626625061},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.56415194272995},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5516112446784973},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5234469771385193},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4989206790924072},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4788739085197449},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4677439033985138},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.3467942476272583},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2781338691711426},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.16317802667617798},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15957418084144592},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14395684003829956},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12162938714027405},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.11623618006706238},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.08423838019371033},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2022.3145974","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3145974","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09690888.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:e031f7e5694d440cb7e68f1a37ff1d0e","is_oa":true,"landing_page_url":"https://doaj.org/article/e031f7e5694d440cb7e68f1a37ff1d0e","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 10, Pp 22140-22149 (2022)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2022.3145974","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2022.3145974","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9668973/09690888.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7803983854","display_name":null,"funder_award_id":"201903D111002","funder_id":"https://openalex.org/F4320336035","funder_display_name":"Shanxi Provincial Key Research and Development Project"}],"funders":[{"id":"https://openalex.org/F4320336035","display_name":"Shanxi Provincial Key Research and Development Project","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4206913228.pdf","grobid_xml":"https://content.openalex.org/works/W4206913228.grobid-xml"},"referenced_works_count":42,"referenced_works":["https://openalex.org/W1966135583","https://openalex.org/W1992260210","https://openalex.org/W2008775610","https://openalex.org/W2009920316","https://openalex.org/W2032950115","https://openalex.org/W2046053092","https://openalex.org/W2106332470","https://openalex.org/W2114926173","https://openalex.org/W2160257946","https://openalex.org/W2162822032","https://openalex.org/W2165427810","https://openalex.org/W2324230675","https://openalex.org/W2390945759","https://openalex.org/W2515930229","https://openalex.org/W2524255982","https://openalex.org/W2563365999","https://openalex.org/W2605854134","https://openalex.org/W2773905811","https://openalex.org/W2783453232","https://openalex.org/W2785756819","https://openalex.org/W2802075561","https://openalex.org/W2907865479","https://openalex.org/W2927400167","https://openalex.org/W2941870486","https://openalex.org/W2969956970","https://openalex.org/W2994592051","https://openalex.org/W3008640474","https://openalex.org/W3048402673","https://openalex.org/W3071917830","https://openalex.org/W3124898479","https://openalex.org/W3139271288","https://openalex.org/W3177031903","https://openalex.org/W3183543820","https://openalex.org/W3185261401","https://openalex.org/W3198038800","https://openalex.org/W3204977905","https://openalex.org/W3205158927","https://openalex.org/W4243296258","https://openalex.org/W4287658166","https://openalex.org/W6745130946","https://openalex.org/W6798694591","https://openalex.org/W6840267288"],"related_works":["https://openalex.org/W4381516319","https://openalex.org/W2037499216","https://openalex.org/W1506384729","https://openalex.org/W4225568567","https://openalex.org/W4286378979","https://openalex.org/W2075698830","https://openalex.org/W3216026256","https://openalex.org/W3127045225","https://openalex.org/W2059891554","https://openalex.org/W2006978486"],"abstract_inverted_index":{"To":[0],"solve":[1],"the":[2,27,39,62,74,86,90,92,105,108,118,123,129,135,149,154,162,167,170,185],"problem":[3],"of":[4,8,41,89,107,122,128,169],"poor":[5],"recognition":[6],"effect":[7],"transient":[9,45,93,171],"signal":[10,96,131],"in":[11,44,197],"low":[12],"Signal-to-Noise":[13],"ratio":[14,121,141],"(SNR)":[15],"and":[16,51,64,125,152,165,181,194,200],"strong":[17],"interference":[18],"electromagnetic":[19,94,172],"environment,":[20],"a":[21,56],"morphological":[22,59,66],"filtering":[23,150],"method":[24,187],"based":[25,116],"on":[26,38,117],"multi-scale":[28,98],"combined":[29],"difference":[30,57],"product":[31,58],"(MCDPMF)":[32],"was":[33],"proposed.":[34],"This":[35],"paper":[36],"concentrates":[37],"issues":[40],"sudden":[42],"changes":[43],"electronic":[46],"signal,":[47],"such":[48],"as":[49],"impulses":[50],"edges.":[52],"Firstly,":[53],"it":[54,159],"provides":[55],"filter.":[60],"Moreover,":[61],"extended":[63],"multi-origin":[65],"Structural":[67],"Elements":[68],"(<i>SEs</i>)":[69],"is":[70,97,145,188],"constructed,":[71],"combining":[72,134],"with":[73],"multi-structural":[75],"layers":[76,88,110],"<inline-formula>":[77,111],"<tex-math":[78,82,112,138],"notation=\"LaTeX\">${a}$":[79,83,113],"</tex-math></inline-formula>":[80,84,114],"(<inline-formula>":[81,137],"indicates":[85],"structural":[87],"MCDPMF),":[91],"weak":[95,173],"filtered.":[99],"They":[100],"are":[101],"used":[102],"to":[103,147,190],"optimize":[104],"number":[106],"structure":[109,163],"adaptively":[115],"amplitude":[119],"characteristic":[120,142],"positive":[124],"negative":[126],"polarity":[127],"filtered":[130],"(HML":[132],"value),":[133],"kurtosis-SNR":[136],"notation=\"LaTeX\">$k_{x}-SNR$":[139],"</tex-math></inline-formula>)":[140],"coefficient.":[143],"MCDPMF":[144],"proposed":[146,186],"enhance":[148],"results":[151,183],"suppress":[153],"noise":[155],"frequency":[156],"points.":[157],"Meanwhile,":[158],"can":[160,176],"extract":[161],"components":[164],"identify":[166],"features":[168],"signal.":[174],"It":[175],"be":[177],"shown":[178],"from":[179],"simulation":[180],"experimental":[182],"that":[184],"superior":[189],"EMD,":[191],"AVG,":[192],"OCCO,":[193],"other":[195],"methods":[196],"subjective":[198],"evaluation":[199],"objective":[201],"indicators.":[202]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}