{"id":"https://openalex.org/W3217308732","doi":"https://doi.org/10.1109/access.2021.3131494","title":"Bearing Fault Diagnosis Based on State-Space Principal Component Tracking Filter Algorithm","display_name":"Bearing Fault Diagnosis Based on State-Space Principal Component Tracking Filter Algorithm","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3217308732","doi":"https://doi.org/10.1109/access.2021.3131494","mag":"3217308732"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3131494","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3131494","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09628077.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09628077.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035433913","display_name":"Tangshao Duan","orcid":"https://orcid.org/0000-0002-0051-3098"},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tangshao Duan","raw_affiliation_strings":["Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan. (e-mail: dtangshao@gmail.com)","Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan;"],"raw_orcid":"https://orcid.org/0000-0002-0051-3098","affiliations":[{"raw_affiliation_string":"Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan. (e-mail: dtangshao@gmail.com)","institution_ids":["https://openalex.org/I178574317"]},{"raw_affiliation_string":"Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan;","institution_ids":["https://openalex.org/I178574317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050791637","display_name":"Zhiqiang Liao","orcid":"https://orcid.org/0000-0001-5637-486X"},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zhiqiang Liao","raw_affiliation_strings":["Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan"],"raw_orcid":"https://orcid.org/0000-0001-5637-486X","affiliations":[{"raw_affiliation_string":"Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan","institution_ids":["https://openalex.org/I178574317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111934691","display_name":"Taifu Li","orcid":null},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]},{"id":"https://openalex.org/I50632499","display_name":"Chongqing University of Technology","ror":"https://ror.org/04vgbd477","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Taifu Li","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University of Science and Technology,Chongqing, 401331 China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University of Science and Technology,Chongqing, 401331 China","institution_ids":["https://openalex.org/I168337820","https://openalex.org/I50632499"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034857645","display_name":"Haihong Tang","orcid":"https://orcid.org/0000-0002-6809-9508"},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haihong Tang","raw_affiliation_strings":["Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan"],"raw_orcid":"https://orcid.org/0000-0002-6809-9508","affiliations":[{"raw_affiliation_string":"Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan","institution_ids":["https://openalex.org/I178574317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101872345","display_name":"Peng Chen","orcid":"https://orcid.org/0000-0001-6276-1356"},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Peng Chen","raw_affiliation_strings":["Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan"],"raw_orcid":"https://orcid.org/0000-0001-6276-1356","affiliations":[{"raw_affiliation_string":"Graduate School of Environmental Science and Technology, Mie University, Tsu, 514-0001 Japan","institution_ids":["https://openalex.org/I178574317"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.4166,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.62938999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"9","issue":null,"first_page":"158784","last_page":"158795"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9904999732971191,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.7786139845848083},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6181373000144958},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.5941983461380005},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5454188585281372},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.5323963761329651},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5230159163475037},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5192713737487793},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49386459589004517},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4788670241832733},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4737597107887268},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.46715253591537476},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.4294384717941284},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.42301711440086365},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4221068024635315},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.20062953233718872}],"concepts":[{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.7786139845848083},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6181373000144958},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.5941983461380005},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5454188585281372},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.5323963761329651},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5230159163475037},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5192713737487793},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49386459589004517},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4788670241832733},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4737597107887268},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.46715253591537476},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.4294384717941284},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.42301711440086365},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4221068024635315},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.20062953233718872},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3131494","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3131494","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09628077.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:3d472172964742978354f3173ef9143a","is_oa":true,"landing_page_url":"https://doaj.org/article/3d472172964742978354f3173ef9143a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 158784-158795 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3131494","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3131494","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09628077.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3217308732.pdf","grobid_xml":"https://content.openalex.org/works/W3217308732.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W21015766","https://openalex.org/W976992744","https://openalex.org/W1964685771","https://openalex.org/W1965721929","https://openalex.org/W1967352108","https://openalex.org/W1970449222","https://openalex.org/W2015215546","https://openalex.org/W2028119131","https://openalex.org/W2029947930","https://openalex.org/W2050211799","https://openalex.org/W2057094080","https://openalex.org/W2063949206","https://openalex.org/W2140434697","https://openalex.org/W2142724780","https://openalex.org/W2299617127","https://openalex.org/W2311690198","https://openalex.org/W2363608638","https://openalex.org/W2429547162","https://openalex.org/W2606272861","https://openalex.org/W2743116502","https://openalex.org/W2761196906","https://openalex.org/W2765226309","https://openalex.org/W2779615422","https://openalex.org/W2790195878","https://openalex.org/W2803768804","https://openalex.org/W2804096023","https://openalex.org/W2903743164","https://openalex.org/W2905265414","https://openalex.org/W2918880240","https://openalex.org/W2931035581","https://openalex.org/W2945703961","https://openalex.org/W2963381657","https://openalex.org/W3115507218","https://openalex.org/W3118812676","https://openalex.org/W6600854425","https://openalex.org/W6625610302","https://openalex.org/W6641720277","https://openalex.org/W6663375212","https://openalex.org/W6787728785"],"related_works":["https://openalex.org/W1975632186","https://openalex.org/W3027745756","https://openalex.org/W3205213561","https://openalex.org/W2531880140","https://openalex.org/W2126145365","https://openalex.org/W2036609560","https://openalex.org/W346861917","https://openalex.org/W3024018414","https://openalex.org/W385273440","https://openalex.org/W1585144779"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,68,111,137],"obtain":[3],"the":[4,34,38,54,61,85,93,102,105,113,118,127,134],"high-precision":[5,139],"bearing":[6],"fault":[7,29,35,115,128,140],"diagnosis":[8,141],"of":[9,40,98,142,161],"different":[10],"speed":[11],"under":[12],"strong":[13],"background":[14],"noise,":[15],"a":[16,78],"novel":[17],"method":[18,146],"called":[19],"state-space":[20],"principal":[21,86,106],"component":[22,51,87,107],"tracking":[23,80,124],"filtering":[24],"(SPCTF)":[25],"is":[26,66,82,90,109,131,147],"proposed":[27,145],"for":[28,73],"diagnosis,":[30],"which":[31],"can":[32],"recover":[33],"information":[36,120],"through":[37],"sequence":[39],"\"Prediction":[41],"\u2013":[42,44],"Measurement":[43],"Correction":[45],"-":[46,49],"Optimal":[47],"estimation":[48],"Principal":[50],"extraction\"":[52],"from":[53,84,92,117,151],"polluted":[55],"raw":[56],"signals":[57,150,153],"with":[58,133],"noise.":[59],"Firstly,":[60],"switch":[62],"Kalman":[63],"filter":[64,71],"(SKF)":[65],"utilized":[67],"establish":[69],"dynamic":[70],"model":[72],"time-series":[74],"signals.":[75],"And":[76],"then,":[77],"feature":[79,116,123],"matrix":[81,97],"generated":[83,121],"features":[88],"that":[89],"extracted":[91],"optimal":[94],"estimated":[95],"state":[96],"each":[99],"time":[100],"in":[101,122],"model.":[103],"Thirdly,":[104],"analysis":[108],"used":[110],"extract":[112],"effective":[114],"redundant":[119],"matrix.":[125],"Finally,":[126],"characteristic":[129],"frequency":[130],"analyzed":[132],"envelope":[135],"spectrum":[136],"achieve":[138],"bearing.":[143],"The":[144],"demonstrated":[148],"on":[149],"simulation":[152],"and":[154],"laboratory":[155],"tests":[156],"(several":[157],"speeds),":[158],"outperforming":[159],"those":[160],"traditional":[162],"methods.":[163]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}