{"id":"https://openalex.org/W3214996183","doi":"https://doi.org/10.1109/access.2021.3131190","title":"Bayesian Estimation of Model Parameters of Equivalent Circuit Model for Detecting Degradation Parts of Lithium-Ion Battery","display_name":"Bayesian Estimation of Model Parameters of Equivalent Circuit Model for Detecting Degradation Parts of Lithium-Ion Battery","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3214996183","doi":"https://doi.org/10.1109/access.2021.3131190","mag":"3214996183"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3131190","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3131190","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627915.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627915.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103116783","display_name":"Tamon Miyake","orcid":"https://orcid.org/0000-0003-3367-3896"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tamon Miyake","raw_affiliation_strings":["Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan. (e-mail: tamonmiyake@aoni.waseda.jp)"],"raw_orcid":"https://orcid.org/0000-0003-3367-3896","affiliations":[{"raw_affiliation_string":"Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan. (e-mail: tamonmiyake@aoni.waseda.jp)","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010099815","display_name":"Tomoyuki Suzuki","orcid":"https://orcid.org/0000-0002-9746-8325"},"institutions":[{"id":"https://openalex.org/I4210137110","display_name":"Yazaki (Japan)","ror":"https://ror.org/04dgpsg75","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210137110"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomoyuki Suzuki","raw_affiliation_strings":["Infrastructure Systems Technology RD Center, Yazaki Corporation, Shizuoka 410-1194, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infrastructure Systems Technology RD Center, Yazaki Corporation, Shizuoka 410-1194, Japan","institution_ids":["https://openalex.org/I4210137110"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085522265","display_name":"Satoshi Funabashi","orcid":"https://orcid.org/0000-0002-6381-3522"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Funabashi","raw_affiliation_strings":["Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan"],"raw_orcid":"https://orcid.org/0000-0002-6381-3522","affiliations":[{"raw_affiliation_string":"Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066028565","display_name":"Namiko Saito","orcid":"https://orcid.org/0000-0003-4140-7643"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Namiko Saito","raw_affiliation_strings":["Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan"],"raw_orcid":"https://orcid.org/0000-0003-4140-7643","affiliations":[{"raw_affiliation_string":"Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001851501","display_name":"Mitsuhiro Kamezaki","orcid":"https://orcid.org/0000-0002-4377-8993"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuhiro Kamezaki","raw_affiliation_strings":["Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan"],"raw_orcid":"https://orcid.org/0000-0002-4377-8993","affiliations":[{"raw_affiliation_string":"Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan","institution_ids":["https://openalex.org/I150744194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051878304","display_name":"Takahiro Shoda","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137110","display_name":"Yazaki (Japan)","ror":"https://ror.org/04dgpsg75","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210137110"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Shoda","raw_affiliation_strings":["Infrastructure Systems Technology RD Center, Yazaki Corporation, Shizuoka 410-1194, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infrastructure Systems Technology RD Center, Yazaki Corporation, Shizuoka 410-1194, Japan","institution_ids":["https://openalex.org/I4210137110"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021167760","display_name":"Tsutomu Saigo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137110","display_name":"Yazaki (Japan)","ror":"https://ror.org/04dgpsg75","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210137110"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tsutomu Saigo","raw_affiliation_strings":["Infrastructure Systems Technology RD Center, Yazaki Corporation, Shizuoka 410-1194, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infrastructure Systems Technology RD Center, Yazaki Corporation, Shizuoka 410-1194, Japan","institution_ids":["https://openalex.org/I4210137110"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080654277","display_name":"Shigeki Sugano","orcid":"https://orcid.org/0000-0002-9331-2446"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigeki Sugano","raw_affiliation_strings":["Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan"],"raw_orcid":"https://orcid.org/0000-0002-9331-2446","affiliations":[{"raw_affiliation_string":"Department of Modern Mechanical Engineering, Waseda University, Tokyo 169-8555, Japan","institution_ids":["https://openalex.org/I150744194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5103116783"],"corresponding_institution_ids":["https://openalex.org/I150744194"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.093,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.43504006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"9","issue":null,"first_page":"159699","last_page":"159713"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9810000061988831,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.958299994468689,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.5854344964027405},{"id":"https://openalex.org/keywords/state-of-charge","display_name":"State of charge","score":0.5850212574005127},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.5814604759216309},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5738412141799927},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5611852407455444},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.559419572353363},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5535076260566711},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4757492244243622},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.45553067326545715},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4133559763431549},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37027478218078613},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.34727853536605835},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.32150745391845703},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2532752752304077},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.23520001769065857},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1995040774345398},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1563650369644165},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.14697805047035217},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13682779669761658},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13386622071266174},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08061888813972473}],"concepts":[{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.5854344964027405},{"id":"https://openalex.org/C2776582896","wikidata":"https://www.wikidata.org/wiki/Q5368536","display_name":"State of charge","level":4,"score":0.5850212574005127},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.5814604759216309},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5738412141799927},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5611852407455444},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.559419572353363},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5535076260566711},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4757492244243622},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.45553067326545715},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4133559763431549},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37027478218078613},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.34727853536605835},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.32150745391845703},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2532752752304077},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.23520001769065857},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1995040774345398},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1563650369644165},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.14697805047035217},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13682779669761658},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13386622071266174},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08061888813972473},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/access.2021.3131190","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3131190","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627915.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:pure.ed.ac.uk:openaire/d0fd2794-c70b-4604-89b9-0bb798c5a70e","is_oa":true,"landing_page_url":"https://www.research.ed.ac.uk/en/publications/d0fd2794-c70b-4604-89b9-0bb798c5a70e","pdf_url":null,"source":{"id":"https://openalex.org/S4406922455","display_name":"Edinburgh Research Explorer","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Miyake, T, Suzuki, T, Funabashi, S, Saito, N, Kamezaki, M, Shoda, T, Saigo, T & Sugano, S 2021, 'Bayesian Estimation of Model Parameters of Equivalent Circuit Model for Detecting Degradation Parts of Lithium-Ion Battery', IEEE Access, vol. 9, pp. 159699-159713. https://doi.org/10.1109/ACCESS.2021.3131190","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:doaj.org/article:1ee4b8c8625041f8baa2be14156474e6","is_oa":true,"landing_page_url":"https://doaj.org/article/1ee4b8c8625041f8baa2be14156474e6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 159699-159713 (2021)","raw_type":"article"},{"id":"pmh:oai:pure.ed.ac.uk:publications/d0fd2794-c70b-4604-89b9-0bb798c5a70e","is_oa":true,"landing_page_url":"https://hdl.handle.net/20.500.11820/d0fd2794-c70b-4604-89b9-0bb798c5a70e","pdf_url":null,"source":{"id":"https://openalex.org/S4406922455","display_name":"Edinburgh Research Explorer","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":{"id":"doi:10.1109/access.2021.3131190","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3131190","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627915.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3214996183.pdf","grobid_xml":"https://content.openalex.org/works/W3214996183.grobid-xml"},"referenced_works_count":38,"referenced_works":["https://openalex.org/W1484301351","https://openalex.org/W1510649093","https://openalex.org/W1665479816","https://openalex.org/W1974592401","https://openalex.org/W1988387263","https://openalex.org/W2006866140","https://openalex.org/W2008306029","https://openalex.org/W2021963392","https://openalex.org/W2037832223","https://openalex.org/W2040327264","https://openalex.org/W2042264587","https://openalex.org/W2056322973","https://openalex.org/W2058795621","https://openalex.org/W2089280577","https://openalex.org/W2140123645","https://openalex.org/W2152458971","https://openalex.org/W2169947556","https://openalex.org/W2339116014","https://openalex.org/W2469605169","https://openalex.org/W2592404563","https://openalex.org/W2621397307","https://openalex.org/W2761945316","https://openalex.org/W2767604027","https://openalex.org/W2792787121","https://openalex.org/W2900354724","https://openalex.org/W2903223816","https://openalex.org/W2910272327","https://openalex.org/W2910462279","https://openalex.org/W2952695732","https://openalex.org/W2964879600","https://openalex.org/W2999803522","https://openalex.org/W3026951609","https://openalex.org/W3080093041","https://openalex.org/W3082697520","https://openalex.org/W3089833703","https://openalex.org/W3095406593","https://openalex.org/W4255975151","https://openalex.org/W6756022225"],"related_works":["https://openalex.org/W1562159987","https://openalex.org/W3190332208","https://openalex.org/W3126531014","https://openalex.org/W2098124661","https://openalex.org/W2519883542","https://openalex.org/W4388623464","https://openalex.org/W3006423619","https://openalex.org/W3169099857","https://openalex.org/W4385625847","https://openalex.org/W2503121603"],"abstract_inverted_index":{"Nowadays,":[0],"the":[1,53,56,73,85,98,108,127,140,145,157,169,174,201,204,210,213,227,235],"use":[2,16],"of":[3,17,33,55,66,75,87,101,126,130,133,139,148,160,183,203,225,243],"electric":[4],"vehicles":[5],"is":[6,42,46,79,219],"increasing":[7],"leading":[8],"to":[9,29,51,83,154,192,199,207,222,233],"a":[10,80,94,116,149,177,241],"growing":[11],"demand":[12],"for":[13,48,96],"more":[14,36,220],"efficient":[15,37],"lithium-ion":[18],"batteries.":[19,34],"The":[20,181],"state-of-charge":[21],"(SOC)":[22],"has":[23],"been":[24],"estimated":[25,153,170],"in":[26,173,212],"previous":[27],"studies":[28],"optimize":[30],"energy":[31],"management":[32],"For":[35],"battery":[38,179],"utilization,":[39],"detecting":[40],"degradation":[41,86],"important.":[43],"However,":[44],"it":[45],"difficult":[47],"conventional":[49],"methods":[50],"distinguish":[52],"effect":[54],"model":[57,64,99,128,146,171,236],"parameters":[58,65,100,129,147,172,205,237],"including":[59],"different":[60,134],"time":[61,135],"constants.":[62,136],"Identifying":[63],"multiple":[67,102],"RC":[68,103],"parallel":[69,104,131],"branches,":[70],"which":[71,123,195],"represent":[72],"impedance":[74,165,184,211],"wider":[76],"frequency":[77],"ranges,":[78],"necessary":[81],"requirement":[82],"detect":[84],"parts.":[88],"In":[89,163],"this":[90],"study,":[91],"we":[92],"present":[93],"method":[95,229],"estimating":[97],"branches.":[105],"We":[106],"designed":[107],"Markov":[109],"Chain":[110],"Monte":[111],"Carlo":[112],"algorithm":[113,141],"by":[114],"setting":[115],"search":[117],"range":[118,159],"limit":[119],"and":[120],"moving":[121],"window,":[122],"enable":[124],"estimation":[125],"branches":[132],"Through":[137],"validation":[138],"based":[142],"on":[143],"simulation,":[144],"third-order":[150],"circuit":[151],"were":[152],"be":[155,231],"within":[156],"error":[158,182],"15.2":[161],"%.":[162],"addition,":[164],"was":[166,185,196],"calculated":[167],"from":[168,190],"test":[175],"using":[176],"real":[178],"dataset.":[180],"less":[186],"than":[187],"10":[188],"%":[189],"0.01":[191],"100":[193],"Hz":[194,218],"sufficiently":[197],"low":[198],"monitor":[200,234],"change":[202,223,239],"owing":[206],"degradation.":[208,244],"As":[209],"high-frequency":[214],"band":[215],"above":[216],"0.1":[217],"likely":[221],"because":[224],"degradation,":[226],"proposed":[228],"can":[230],"used":[232],"that":[238],"as":[240],"result":[242]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}