{"id":"https://openalex.org/W3214380982","doi":"https://doi.org/10.1109/access.2021.3124034","title":"Corrections to \u201cComplex Permittivity of NaOH Solutions Used in Liquid-Metal Circuits\u201d","display_name":"Corrections to \u201cComplex Permittivity of NaOH Solutions Used in Liquid-Metal Circuits\u201d","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3214380982","doi":"https://doi.org/10.1109/access.2021.3124034","mag":"3214380982"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3124034","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3124034","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2021.3124034","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085986774","display_name":"Kareem S. Elassy","orcid":"https://orcid.org/0000-0001-7368-6267"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]},{"id":"https://openalex.org/I59272784","display_name":"Arab Academy for Science, Technology, and Maritime Transport","ror":"https://ror.org/0004vyj87","country_code":"EG","type":"education","lineage":["https://openalex.org/I59272784"]}],"countries":["EG","US"],"is_corresponding":true,"raw_author_name":"Kareem S. Elassy","raw_affiliation_strings":["Center of Excellence, Arab Academy for Science, Technology and Maritime Transport, Cairo, Egypt","University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","University of Hawai'i at M\u0101noa, Honolulu, HI, USA"],"raw_orcid":"https://orcid.org/0000-0001-7368-6267","affiliations":[{"raw_affiliation_string":"Center of Excellence, Arab Academy for Science, Technology and Maritime Transport, Cairo, Egypt","institution_ids":["https://openalex.org/I59272784"]},{"raw_affiliation_string":"University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]},{"raw_affiliation_string":"University of Hawai'i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100639561","display_name":"Mohammad Arifur Rahman","orcid":"https://orcid.org/0000-0003-2618-1404"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Arifur Rahman","raw_affiliation_strings":["University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","University of Hawai'i at M\u0101noa, Honolulu, HI, USA"],"raw_orcid":"https://orcid.org/0000-0003-2618-1404","affiliations":[{"raw_affiliation_string":"University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]},{"raw_affiliation_string":"University of Hawai'i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042564293","display_name":"Nicholas Yama","orcid":"https://orcid.org/0000-0002-6123-3313"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicholas S. Yama","raw_affiliation_strings":["University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","University of Hawai'i at M\u0101noa, Honolulu, HI, USA"],"raw_orcid":"https://orcid.org/0000-0002-6123-3313","affiliations":[{"raw_affiliation_string":"University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]},{"raw_affiliation_string":"University of Hawai'i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078109674","display_name":"Wayne A. Shiroma","orcid":"https://orcid.org/0000-0002-1294-2703"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wayne A. Shiroma","raw_affiliation_strings":["University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","University of Hawai'i at M\u0101noa, Honolulu, HI, USA"],"raw_orcid":"https://orcid.org/0000-0002-1294-2703","affiliations":[{"raw_affiliation_string":"University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]},{"raw_affiliation_string":"University of Hawai'i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068511935","display_name":"Aaron T. Ohta","orcid":"https://orcid.org/0000-0003-3789-897X"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aaron T. Ohta","raw_affiliation_strings":["University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","University of Hawai'i at M\u0101noa, Honolulu, HI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Hawai\u2018i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]},{"raw_affiliation_string":"University of Hawai'i at M\u0101noa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5085986774"],"corresponding_institution_ids":["https://openalex.org/I117965899","https://openalex.org/I59272784"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.19087287,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"9","issue":null,"first_page":"149398","last_page":"149398"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.755570650100708},{"id":"https://openalex.org/keywords/type","display_name":"Type (biology)","score":0.48986169695854187},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.4261455237865448},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3696790337562561},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.33361536264419556},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3241591453552246},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24304470419883728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21388742327690125},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.15954500436782837},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.11668717861175537},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.07809215784072876}],"concepts":[{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.755570650100708},{"id":"https://openalex.org/C2777299769","wikidata":"https://www.wikidata.org/wiki/Q3707858","display_name":"Type (biology)","level":2,"score":0.48986169695854187},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.4261455237865448},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3696790337562561},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.33361536264419556},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3241591453552246},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24304470419883728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21388742327690125},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.15954500436782837},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.11668717861175537},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.07809215784072876},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3124034","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3124034","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b5b47da017bb424c978ee5f9cc584eec","is_oa":true,"landing_page_url":"https://doaj.org/article/b5b47da017bb424c978ee5f9cc584eec","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 149398-149398 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3124034","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3124034","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7911021985","display_name":null,"funder_award_id":"ECCS-1807896","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2979595276"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W2051487156","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W2142036596","https://openalex.org/W2072657027","https://openalex.org/W2962838298"],"abstract_inverted_index":{"In":[0],"the":[1,27],"above":[2],"article":[3,36],"<xref":[4,10],"ref-type=\"bibr\"":[5],"rid=\"ref1\"":[6],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7,13],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">[1]</xref>":[8],",":[9,16],"ref-type=\"table\"":[11],"rid=\"table1\"":[12],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">Table":[14],"1</xref>":[15],"Figs.":[17],"4":[18],"and":[19,21,24],"5,":[20],"Appendices":[22],"A":[23],"B":[25],"of":[26],"associated":[28],"supplementary":[29],"materials":[30],"unfortunately":[31],"contain":[32],"minor":[33],"errors.":[34,41],"This":[35],"serves":[37],"to":[38],"correct":[39],"those":[40]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2021-11-22T00:00:00"}