{"id":"https://openalex.org/W3209724998","doi":"https://doi.org/10.1109/access.2021.3123421","title":"Extraction of Flux Leakage and Eddy Current Signals Induced by Submillimeter Backside Slits on Carbon Steel Plate Using a Low-Field AMR Differential Magnetic Probe","display_name":"Extraction of Flux Leakage and Eddy Current Signals Induced by Submillimeter Backside Slits on Carbon Steel Plate Using a Low-Field AMR Differential Magnetic Probe","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3209724998","doi":"https://doi.org/10.1109/access.2021.3123421","mag":"3209724998"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3123421","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3123421","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09590504.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09590504.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026534809","display_name":"Mohd Aufa Hadi Putera Zaini","orcid":"https://orcid.org/0000-0001-6497-2739"},"institutions":[{"id":"https://openalex.org/I102913810","display_name":"Universiti Malaysia Pahang Al-Sultan Abdullah","ror":"https://ror.org/01704wp68","country_code":"MY","type":"education","lineage":["https://openalex.org/I102913810"]}],"countries":["MY"],"is_corresponding":true,"raw_author_name":"Mohd Aufa Hadi Putera Zaini","raw_affiliation_strings":["Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia. (e-mail: mek18006@stdmail.ump.edu.my)","Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-6497-2739","affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia. (e-mail: mek18006@stdmail.ump.edu.my)","institution_ids":["https://openalex.org/I102913810"]},{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia","institution_ids":["https://openalex.org/I102913810"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040207369","display_name":"Mohd Mawardi Saari","orcid":"https://orcid.org/0000-0002-3049-5548"},"institutions":[{"id":"https://openalex.org/I102913810","display_name":"Universiti Malaysia Pahang Al-Sultan Abdullah","ror":"https://ror.org/01704wp68","country_code":"MY","type":"education","lineage":["https://openalex.org/I102913810"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Mohd Mawardi Saari","raw_affiliation_strings":["Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia and Centre for Sensor Technology, Universiti Malaysia Pahang, Pekan 26600, Malaysia","Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia"],"raw_orcid":"https://orcid.org/0000-0002-3049-5548","affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia and Centre for Sensor Technology, Universiti Malaysia Pahang, Pekan 26600, Malaysia","institution_ids":["https://openalex.org/I102913810"]},{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia","institution_ids":["https://openalex.org/I102913810"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012386685","display_name":"Nurul A\u2019in Nadzri","orcid":"https://orcid.org/0000-0003-3317-0236"},"institutions":[{"id":"https://openalex.org/I102913810","display_name":"Universiti Malaysia Pahang Al-Sultan Abdullah","ror":"https://ror.org/01704wp68","country_code":"MY","type":"education","lineage":["https://openalex.org/I102913810"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nurul A'In Nadzri","raw_affiliation_strings":["Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia","Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia"],"raw_orcid":"https://orcid.org/0000-0003-3317-0236","affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia","institution_ids":["https://openalex.org/I102913810"]},{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia","institution_ids":["https://openalex.org/I102913810"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028101442","display_name":"Zulkifly Aziz","orcid":"https://orcid.org/0000-0003-0646-0473"},"institutions":[{"id":"https://openalex.org/I102913810","display_name":"Universiti Malaysia Pahang Al-Sultan Abdullah","ror":"https://ror.org/01704wp68","country_code":"MY","type":"education","lineage":["https://openalex.org/I102913810"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Zulkifly Aziz","raw_affiliation_strings":["Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia","Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia"],"raw_orcid":"https://orcid.org/0000-0003-0646-0473","affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan 26600, Malaysia","institution_ids":["https://openalex.org/I102913810"]},{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering Technology, Universiti Malaysia Pahang, Pekan Campus, Pekan, Malaysia","institution_ids":["https://openalex.org/I102913810"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084467394","display_name":"Nur Huda Ramlan","orcid":null},"institutions":[{"id":"https://openalex.org/I102913810","display_name":"Universiti Malaysia Pahang Al-Sultan Abdullah","ror":"https://ror.org/01704wp68","country_code":"MY","type":"education","lineage":["https://openalex.org/I102913810"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nur Huda Ramlan","raw_affiliation_strings":["College of Engineering, Universiti Malaysia Pahang, Kuantan 26300, Malaysia","College of Engineering Universiti Malaysia Pahang  Kuantan Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Engineering, Universiti Malaysia Pahang, Kuantan 26300, Malaysia","institution_ids":["https://openalex.org/I102913810"]},{"raw_affiliation_string":"College of Engineering Universiti Malaysia Pahang  Kuantan Malaysia","institution_ids":["https://openalex.org/I102913810"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086490371","display_name":"Keiji Tsukada","orcid":"https://orcid.org/0000-0001-8372-6904"},"institutions":[{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiji Tsukada","raw_affiliation_strings":["Graduate School of Interdisciplinary Science and Engineering in Health Systems, Okayama University, Okayama 700-8530, Japan","Graduate School of Interdisciplinary Science and Engineering in Health Systems, Okayama University,Okayama,Japan"],"raw_orcid":"https://orcid.org/0000-0001-8372-6904","affiliations":[{"raw_affiliation_string":"Graduate School of Interdisciplinary Science and Engineering in Health Systems, Okayama University, Okayama 700-8530, Japan","institution_ids":["https://openalex.org/I163770644"]},{"raw_affiliation_string":"Graduate School of Interdisciplinary Science and Engineering in Health Systems, Okayama University,Okayama,Japan","institution_ids":["https://openalex.org/I163770644"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5026534809"],"corresponding_institution_ids":["https://openalex.org/I102913810"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.4649,"has_fulltext":true,"cited_by_count":19,"citation_normalized_percentile":{"value":0.80056083,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"9","issue":null,"first_page":"146755","last_page":"146770"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.8711583614349365},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7242499589920044},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6530763506889343},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.648382842540741},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5870444774627686},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5563788414001465},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.5192792415618896},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5058238506317139},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5047587156295776},{"id":"https://openalex.org/keywords/ferromagnetism","display_name":"Ferromagnetism","score":0.4494851529598236},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.42966657876968384},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.4194732904434204},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23659256100654602},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1695176362991333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.14751428365707397},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.140472412109375}],"concepts":[{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.8711583614349365},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7242499589920044},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6530763506889343},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.648382842540741},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5870444774627686},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5563788414001465},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.5192792415618896},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5058238506317139},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5047587156295776},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.4494851529598236},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.42966657876968384},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.4194732904434204},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23659256100654602},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1695176362991333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.14751428365707397},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.140472412109375},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3123421","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3123421","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09590504.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:5b558e0bf73a4140820bcfafd7499bfb","is_oa":true,"landing_page_url":"https://doaj.org/article/5b558e0bf73a4140820bcfafd7499bfb","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 146755-146770 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3123421","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3123421","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09590504.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3047380193","display_name":null,"funder_award_id":"RDU1903100","funder_id":"https://openalex.org/F4320323310","funder_display_name":"Universiti Malaysia Pahang"},{"id":"https://openalex.org/G6775234407","display_name":null,"funder_award_id":"FRGS/1/2019/TK04/UMP/02/4 (University Reference: RDU1901154)","funder_id":"https://openalex.org/F4320321709","funder_display_name":"Ministry of Higher Education, Malaysia"}],"funders":[{"id":"https://openalex.org/F4320321709","display_name":"Ministry of Higher Education, Malaysia","ror":"https://ror.org/05mcs2t73"},{"id":"https://openalex.org/F4320323310","display_name":"Universiti Malaysia Pahang","ror":"https://ror.org/01704wp68"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3209724998.pdf","grobid_xml":"https://content.openalex.org/works/W3209724998.grobid-xml"},"referenced_works_count":35,"referenced_works":["https://openalex.org/W73509760","https://openalex.org/W1511733781","https://openalex.org/W1976607559","https://openalex.org/W1976853603","https://openalex.org/W1980621217","https://openalex.org/W2006094958","https://openalex.org/W2018656896","https://openalex.org/W2021195116","https://openalex.org/W2021905833","https://openalex.org/W2025755827","https://openalex.org/W2033420568","https://openalex.org/W2052043084","https://openalex.org/W2057959267","https://openalex.org/W2063892929","https://openalex.org/W2071248669","https://openalex.org/W2081119669","https://openalex.org/W2094650561","https://openalex.org/W2099545741","https://openalex.org/W2109577406","https://openalex.org/W2129756534","https://openalex.org/W2166207675","https://openalex.org/W2289500379","https://openalex.org/W2325754821","https://openalex.org/W2401262435","https://openalex.org/W2736225003","https://openalex.org/W2756149852","https://openalex.org/W2809952567","https://openalex.org/W2941826610","https://openalex.org/W2941960458","https://openalex.org/W3012510474","https://openalex.org/W3013713704","https://openalex.org/W3040773582","https://openalex.org/W6603084886","https://openalex.org/W6744869216","https://openalex.org/W6761642519"],"related_works":["https://openalex.org/W2902977491","https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W2333795440","https://openalex.org/W2369672268","https://openalex.org/W1680801918","https://openalex.org/W2102849516","https://openalex.org/W1972402538","https://openalex.org/W4230069654"],"abstract_inverted_index":{"Magnetic":[0],"Flux":[1],"Leakage":[2],"(MFL)":[3],"and":[4,52,62,80,115,119,143,168,188,192,224],"Eddy":[5],"Current":[6],"Testing":[7],"(ECT)":[8],"are":[9,60],"commonly":[10],"employed":[11,112],"as":[12,96],"the":[13,23,37,87,99,117,124,141,174,177,186,189,196,204,209,220],"non-destructive":[14],"evaluation":[15],"(NDE)":[16],"techniques":[17,70],"used":[18],"to":[19,98,113],"detect":[20],"defects":[21,34,243],"within":[22],"steel.":[24],"The":[25,76,128,215],"MFL":[26,51,79,118,142,191,223],"technique":[27,39],"is":[28,71,83,111,183],"advantageous":[29],"in":[30,41,57,173,244],"terms":[31],"of":[32,139,150,176,200,211,222,241],"deep":[33],"detection,":[35],"while":[36],"ECT":[38],"excels":[40],"providing":[42],"dense":[43],"information":[44],"regarding":[45],"defects.":[46],"In":[47],"this":[48],"work,":[49],"artificial":[50,148],"eddy":[53,169],"current":[54,170],"(EC)":[55],"signals":[56,82,121,145,171,194,226],"ferromagnetic":[58,245],"materials":[59],"studied,":[61],"an":[63,232,237],"experimental":[64],"magnetic":[65,126,130,234],"probe":[66,131,235],"that":[67,219],"utilizes":[68],"both":[69],"developed":[72],"for":[73,195,208,236],"signal":[74],"verification.":[75],"separation":[77],"between":[78,185],"EC":[81,120,144,193,225],"achieved":[84],"by":[85,123,147,231],"utilizing":[86],"phase-sensitive":[88],"detection":[89,210,239],"technique,":[90],"implementing":[91],"a":[92,155],"dynamic":[93],"referencing":[94],"method":[95,107],"opposed":[97],"conventional":[100],"static":[101],"phase":[102],"referencing.":[103],"A":[104,180],"finite":[105],"element":[106,161],"(FEM)":[108],"based":[109],"simulation":[110],"study":[114,216],"verify":[116],"measured":[122,190],"proposed":[125,129],"probe.":[127],"features":[132],"highly":[133],"sensitive":[134],"anisotropic":[135],"magneto-resistive":[136],"sensors":[137],"capable":[138],"measuring":[140],"induced":[146],"slits":[149],"varying":[151],"depths":[152],"engraved":[153],"onto":[154],"2-mm":[156],"carbon":[157],"steel":[158],"plate.":[159],"Finite":[160],"simulations":[162],"indicate":[163],"different":[164],"flux":[165],"leakage":[166],"patterns":[167],"detected":[172],"vicinity":[175],"back-side":[178,213,242],"slits.":[179,214],"good":[181],"agreement":[182],"observed":[184],"simulated":[187],"optimized":[197],"frequency":[198],"range":[199],"110-210":[201],"Hz":[202],"with":[203],"corresponding":[205],"Lissajous":[206],"curve":[207],"submillimeter":[212],"has":[217],"shown":[218],"combination":[221],"can":[227],"be":[228],"successfully":[229],"captured":[230],"appropriate":[233],"enhanced":[238],"performance":[240],"materials.":[246]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}