{"id":"https://openalex.org/W3204996949","doi":"https://doi.org/10.1109/access.2021.3118687","title":"A Deep Transfer Learning Model for Packaged Integrated Circuit Failure Detection by Terahertz Imaging","display_name":"A Deep Transfer Learning Model for Packaged Integrated Circuit Failure Detection by Terahertz Imaging","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3204996949","doi":"https://doi.org/10.1109/access.2021.3118687","mag":"3204996949"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3118687","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3118687","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09564054.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09564054.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101882873","display_name":"Yao Lu","orcid":"https://orcid.org/0000-0002-2962-5886"},"institutions":[{"id":"https://openalex.org/I2799850029","display_name":"Dongguan University of Technology","ror":"https://ror.org/01m8p7q42","country_code":"CN","type":"education","lineage":["https://openalex.org/I2799850029"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Lu","raw_affiliation_strings":["School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China and Faculty of Electronic and Information Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China. (e-mail: rsluyao@126.com)","Faculty of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China","School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China"],"raw_orcid":"https://orcid.org/0000-0002-2962-5886","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China and Faculty of Electronic and Information Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China. (e-mail: rsluyao@126.com)","institution_ids":["https://openalex.org/I2799850029","https://openalex.org/I87445476"]},{"raw_affiliation_string":"Faculty of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China","institution_ids":["https://openalex.org/I2799850029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083282081","display_name":"Qi Mao","orcid":"https://orcid.org/0000-0001-5914-2466"},"institutions":[{"id":"https://openalex.org/I130480701","display_name":"Dongbei University of Finance and Economics","ror":"https://ror.org/05db1pj03","country_code":"CN","type":"education","lineage":["https://openalex.org/I130480701"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Mao","raw_affiliation_strings":["School of Management Science and Engineering, Dongbei University of Finance and Economics, Dalian 116025, China"],"raw_orcid":"https://orcid.org/0000-0001-5914-2466","affiliations":[{"raw_affiliation_string":"School of Management Science and Engineering, Dongbei University of Finance and Economics, Dalian 116025, China","institution_ids":["https://openalex.org/I130480701"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100383881","display_name":"Jingbo Liu","orcid":"https://orcid.org/0000-0003-3675-267X"},"institutions":[{"id":"https://openalex.org/I2799850029","display_name":"Dongguan University of Technology","ror":"https://ror.org/01m8p7q42","country_code":"CN","type":"education","lineage":["https://openalex.org/I2799850029"]},{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingbo Liu","raw_affiliation_strings":["School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China and Faculty of Electronic and Information Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China","School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China and Faculty of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China and Faculty of Electronic and Information Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I2799850029","https://openalex.org/I87445476"]},{"raw_affiliation_string":"School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan 523808, China and Faculty of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China","institution_ids":["https://openalex.org/I2799850029","https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3212,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.5338908,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"9","issue":null,"first_page":"138608","last_page":"138617"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.8338207006454468},{"id":"https://openalex.org/keywords/transfer-of-learning","display_name":"Transfer of learning","score":0.47646331787109375},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4465741515159607},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4239591658115387},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4039769172668457},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38449183106422424},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3213152587413788}],"concepts":[{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8338207006454468},{"id":"https://openalex.org/C150899416","wikidata":"https://www.wikidata.org/wiki/Q1820378","display_name":"Transfer of learning","level":2,"score":0.47646331787109375},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4465741515159607},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4239591658115387},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4039769172668457},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38449183106422424},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3213152587413788}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3118687","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3118687","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09564054.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b383d9546a34483798820709fc422812","is_oa":true,"landing_page_url":"https://doaj.org/article/b383d9546a34483798820709fc422812","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 138608-138617 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3118687","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3118687","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09564054.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G6473431081","display_name":null,"funder_award_id":"2020A1515110146","funder_id":"https://openalex.org/F4320337111","funder_display_name":"Basic and Applied Basic Research Foundation of Guangdong Province"},{"id":"https://openalex.org/G684651924","display_name":null,"funder_award_id":"2020A1515110703","funder_id":"https://openalex.org/F4320337111","funder_display_name":"Basic and Applied Basic Research Foundation of Guangdong Province"}],"funders":[{"id":"https://openalex.org/F4320337111","display_name":"Basic and Applied Basic Research Foundation of Guangdong Province","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3204996949.pdf","grobid_xml":"https://content.openalex.org/works/W3204996949.grobid-xml"},"referenced_works_count":64,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W1939735501","https://openalex.org/W1985977725","https://openalex.org/W1987075379","https://openalex.org/W1988948278","https://openalex.org/W2020638776","https://openalex.org/W2022250913","https://openalex.org/W2036940156","https://openalex.org/W2041726653","https://openalex.org/W2073173438","https://openalex.org/W2083358202","https://openalex.org/W2108598243","https://openalex.org/W2112796928","https://openalex.org/W2115275360","https://openalex.org/W2115791615","https://openalex.org/W2129711023","https://openalex.org/W2135653230","https://openalex.org/W2144354855","https://openalex.org/W2147800946","https://openalex.org/W2149933564","https://openalex.org/W2154548089","https://openalex.org/W2155273149","https://openalex.org/W2155541015","https://openalex.org/W2163605009","https://openalex.org/W2165698076","https://openalex.org/W2168117308","https://openalex.org/W2194775991","https://openalex.org/W2240132250","https://openalex.org/W2346062110","https://openalex.org/W2543795867","https://openalex.org/W2612445135","https://openalex.org/W2622826443","https://openalex.org/W2738803669","https://openalex.org/W2756489700","https://openalex.org/W2762502501","https://openalex.org/W2775795276","https://openalex.org/W2783710041","https://openalex.org/W2791957585","https://openalex.org/W2801050875","https://openalex.org/W2810538423","https://openalex.org/W2883102611","https://openalex.org/W2884238566","https://openalex.org/W2887782657","https://openalex.org/W2890157139","https://openalex.org/W2901970165","https://openalex.org/W2917513897","https://openalex.org/W2945913531","https://openalex.org/W2953820545","https://openalex.org/W2963163009","https://openalex.org/W3003882333","https://openalex.org/W3040156639","https://openalex.org/W3093464376","https://openalex.org/W3101127840","https://openalex.org/W3138118097","https://openalex.org/W3156313549","https://openalex.org/W4297775537","https://openalex.org/W6637373629","https://openalex.org/W6677704767","https://openalex.org/W6682132143","https://openalex.org/W6682778277","https://openalex.org/W6684191040","https://openalex.org/W6729272115","https://openalex.org/W6737664043","https://openalex.org/W6747218270"],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W3215138031","https://openalex.org/W3009238340","https://openalex.org/W4360585206","https://openalex.org/W4321369474","https://openalex.org/W4206357785","https://openalex.org/W4281381188","https://openalex.org/W2951211570","https://openalex.org/W3192840557","https://openalex.org/W4285208911"],"abstract_inverted_index":{"Terahertz":[0],"time-domain":[1],"spectroscopy":[2],"imaging":[3],"system":[4],"(THz-TDS)":[5],"is":[6,65],"becoming":[7],"a":[8,83,87,98],"promising":[9],"tool":[10],"for":[11],"packaged":[12],"integrated":[13],"circuit":[14],"(IC)":[15],"failure":[16,56,105],"detection":[17,40,52,57,106],"due":[18],"to":[19,108,119],"its":[20],"nonmetal":[21],"penetrability":[22],"and":[23,67,86,94,141],"low":[24,44],"radiation.":[25],"However,":[26],"two":[27],"major":[28],"obstacles":[29],"are":[30,59],"hindering":[31],"the":[32,36,43,51,55,76,121,124],"industrial":[33],"application":[34],"of":[35,46,78,123],"THz-TDS":[37],"based":[38,104],"IC":[39,79,111,125],"method:":[41],"1)":[42],"resolution":[45],"THz":[47,80],"images":[48,81],"may":[49],"affect":[50],"accuracy;":[53],"2)":[54],"tasks":[58],"always":[60],"carried":[61],"out":[62],"manually,":[63],"which":[64],"inefficient":[66],"inaccurate.":[68],"Thus,":[69],"in":[70],"this":[71],"paper,":[72],"we":[73,96,115],"firstly":[74],"enhanced":[75],"quality":[77],"with":[82],"deconvolution":[84],"algorithm":[85],"mathematically":[88],"simulated":[89],"point":[90],"spread":[91],"function":[92],"(PSF),":[93],"then":[95],"proposed":[97,133],"deep":[99],"convolutional":[100],"neural":[101],"network":[102],"(CNN)":[103],"framework":[107],"achieve":[109],"end-to-end":[110],"inspection":[112],"automatically.":[113],"Besides,":[114],"introduced":[116],"transfer":[117],"learning":[118],"overcome":[120],"limitation":[122],"dataset":[126],"size.":[127],"The":[128],"result":[129],"demonstrated":[130],"that":[131],"our":[132],"method":[134],"achieved":[135],"excellent":[136],"performance":[137],"concerning":[138],"both":[139],"accuracy":[140],"efficiency.":[142]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-25T09:21:30.201066","created_date":"2025-10-10T00:00:00"}