{"id":"https://openalex.org/W3215431294","doi":"https://doi.org/10.1109/access.2021.3118042","title":"Research on Five-Loop Simplified Scaling Model for Dry-Type Air-Core Reactors With Inter-Turn Short Circuit Fault","display_name":"Research on Five-Loop Simplified Scaling Model for Dry-Type Air-Core Reactors With Inter-Turn Short Circuit Fault","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3215431294","doi":"https://doi.org/10.1109/access.2021.3118042","mag":"3215431294"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3118042","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3118042","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627796.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627796.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103223109","display_name":"Yuxin Sun","orcid":"https://orcid.org/0000-0003-1679-3984"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxin Sun","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan 250061, China"],"raw_orcid":"https://orcid.org/0000-0003-1679-3984","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan 250061, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009561746","display_name":"Liang Zou","orcid":"https://orcid.org/0000-0002-9523-3020"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liang Zou","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan 250061, China. (e-mail: zouliang@sdu.edu.cn)","School of Electrical Engineering, Shandong University, Jinan 250061, China"],"raw_orcid":"https://orcid.org/0000-0002-9523-3020","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan 250061, China. (e-mail: zouliang@sdu.edu.cn)","institution_ids":["https://openalex.org/I154099455"]},{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan 250061, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100714473","display_name":"Qingsong Liu","orcid":"https://orcid.org/0000-0002-0862-9116"},"institutions":[{"id":"https://openalex.org/I74872605","display_name":"China Southern Power Grid (China)","ror":"https://ror.org/03hkh9419","country_code":"CN","type":"company","lineage":["https://openalex.org/I74872605"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingsong Liu","raw_affiliation_strings":["Maintenance and test center of China Southern Power Grid Co., Ltd. EHV transmission company, Guangzhou 510663, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Maintenance and test center of China Southern Power Grid Co., Ltd. EHV transmission company, Guangzhou 510663, China","institution_ids":["https://openalex.org/I74872605"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Lingjun Dai","orcid":null},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingjun Dai","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan 250061, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan 250061, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100425606","display_name":"Li Zhang","orcid":"https://orcid.org/0000-0002-5913-2513"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Zhang","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan 250061, China"],"raw_orcid":"https://orcid.org/0000-0002-5913-2513","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan 250061, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100764663","display_name":"Tong Zhao","orcid":"https://orcid.org/0000-0003-0523-4466"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tong Zhao","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan 250061, China"],"raw_orcid":"https://orcid.org/0000-0003-0523-4466","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan 250061, China","institution_ids":["https://openalex.org/I154099455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5009561746"],"corresponding_institution_ids":["https://openalex.org/I154099455"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.259,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.4354444,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"9","issue":null,"first_page":"163707","last_page":"163715"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11126","display_name":"Metallurgical Processes and Thermodynamics","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.8032238483428955},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5801543593406677},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48820430040359497},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.47993117570877075},{"id":"https://openalex.org/keywords/loop","display_name":"Loop (graph theory)","score":0.47988927364349365},{"id":"https://openalex.org/keywords/magnetic-circuit","display_name":"Magnetic circuit","score":0.44801515340805054},{"id":"https://openalex.org/keywords/square","display_name":"Square (algebra)","score":0.4293450117111206},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4245941936969757},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3772614896297455},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3461712598800659},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.3324121832847595},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.31004852056503296},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.221581369638443},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16631647944450378}],"concepts":[{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.8032238483428955},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5801543593406677},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48820430040359497},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.47993117570877075},{"id":"https://openalex.org/C184670325","wikidata":"https://www.wikidata.org/wiki/Q512604","display_name":"Loop (graph theory)","level":2,"score":0.47988927364349365},{"id":"https://openalex.org/C24214142","wikidata":"https://www.wikidata.org/wiki/Q118801","display_name":"Magnetic circuit","level":3,"score":0.44801515340805054},{"id":"https://openalex.org/C135692309","wikidata":"https://www.wikidata.org/wiki/Q111124","display_name":"Square (algebra)","level":2,"score":0.4293450117111206},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4245941936969757},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3772614896297455},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3461712598800659},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.3324121832847595},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.31004852056503296},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.221581369638443},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16631647944450378},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3118042","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3118042","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627796.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b63a77e7793745a7a1b6a46919dbe43c","is_oa":true,"landing_page_url":"https://doaj.org/article/b63a77e7793745a7a1b6a46919dbe43c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 163707-163715 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3118042","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3118042","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09627796.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/6","display_name":"Clean water and sanitation","score":0.4699999988079071}],"awards":[{"id":"https://openalex.org/G4456690955","display_name":null,"funder_award_id":"51977122","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3215431294.pdf","grobid_xml":"https://content.openalex.org/works/W3215431294.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1497374924","https://openalex.org/W1983499586","https://openalex.org/W2015987267","https://openalex.org/W2017967006","https://openalex.org/W2033852381","https://openalex.org/W2107836860","https://openalex.org/W2111794332","https://openalex.org/W2145601950","https://openalex.org/W2149302963","https://openalex.org/W2316514014","https://openalex.org/W2372731486","https://openalex.org/W2611883050","https://openalex.org/W2809755779","https://openalex.org/W2811320014","https://openalex.org/W2889393422","https://openalex.org/W2943033531","https://openalex.org/W3097067643"],"related_works":["https://openalex.org/W24774503","https://openalex.org/W2014821076","https://openalex.org/W141820298","https://openalex.org/W3102623159","https://openalex.org/W4378770497","https://openalex.org/W2049584446","https://openalex.org/W2079781215","https://openalex.org/W2609156628","https://openalex.org/W2306278290","https://openalex.org/W4324027555"],"abstract_inverted_index":{"In":[0],"order":[1,58],"to":[2,59,92,160],"simplify":[3,60],"the":[4,8,20,27,37,52,61,67,75,86,102,109,115,119,124,127,137,143,158,161],"research":[5],"method":[6,110],"of":[7,14,22,29,69,78,111,123,129],"spatial":[9],"magnetic":[10,79],"field":[11],"distribution":[12],"(SMFD)":[13],"dry":[15],"air-core":[16],"reactors":[17],"(DARs)":[18],"in":[19,57,82,126,136],"case":[21,128],"inter-turn":[23,44,130],"short":[24,45,94,131],"circuit":[25,46,95,132],"fault,":[26],"concept":[28],"simplified":[30,39,87,120],"scaling":[31,40,88,121],"model":[32,41,89,117,122],"was":[33,48,105],"put":[34],"forward,":[35],"and":[36,97,101,118,153,168],"optimal":[38,144],"for":[42],"different":[43,93],"fault":[47],"calculated":[49],"by":[50,107,149,164],"using":[51,108],"least":[53],"square":[54],"method.":[55],"Firstly,":[56],"calculation,":[62],"7":[63],"typical":[64],"directions":[65],"describing":[66],"SMFD":[68],"DARs":[70,125],"were":[71,99,133],"determined":[72],"based":[73],"on":[74],"similarity":[76],"degree":[77],"induction":[80],"intensity":[81],"each":[83],"direction.":[84],"Then,":[85],"parameters":[90,162],"corresponding":[91],"positions":[96],"degrees":[98],"studied,":[100],"variation":[103],"rule":[104],"described":[106],"fitting":[112],"function.":[113],"Finally,":[114],"original":[116],"established":[134],"respectively":[135],"laboratory.":[138],"The":[139],"results":[140],"show":[141],"that":[142],"structure":[145],"relative":[146],"height":[147],"obtained":[148,163],"experiment":[150],"is":[151,157],"30%":[152],"20%":[154],"respectively,":[155],"which":[156],"closest":[159],"computer":[165],"simulation,":[166],"i.e.,28%":[167],"20.3%.":[169]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}