{"id":"https://openalex.org/W3202990103","doi":"https://doi.org/10.1109/access.2021.3116200","title":"Influence of Inhomogeneous Residual Charges on the Stress of Filter Capacitor Components","display_name":"Influence of Inhomogeneous Residual Charges on the Stress of Filter Capacitor Components","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3202990103","doi":"https://doi.org/10.1109/access.2021.3116200","mag":"3202990103"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3116200","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3116200","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551881.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551881.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011535263","display_name":"Pengning Zhang","orcid":"https://orcid.org/0000-0003-1486-3555"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Pengning Zhang","raw_affiliation_strings":["China University of Mining and Technology (Beijing), Beijing, CO 100083, China. (e-mail: zpn2014@163.com)","China University of Mining and Technology (Beijing), Beijing, CO 100083, China"],"affiliations":[{"raw_affiliation_string":"China University of Mining and Technology (Beijing), Beijing, CO 100083, China. (e-mail: zpn2014@163.com)","institution_ids":["https://openalex.org/I25757504"]},{"raw_affiliation_string":"China University of Mining and Technology (Beijing), Beijing, CO 100083, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052500444","display_name":"Bofan Li","orcid":"https://orcid.org/0000-0002-8659-5134"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bofan Li","raw_affiliation_strings":["China University of Mining and Technology (Beijing), Beijing, CO 100083, China"],"affiliations":[{"raw_affiliation_string":"China University of Mining and Technology (Beijing), Beijing, CO 100083, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100613541","display_name":"Wei Li","orcid":"https://orcid.org/0000-0003-0164-7343"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Li","raw_affiliation_strings":["China University of Mining and Technology (Beijing), Beijing, CO 100083, China"],"affiliations":[{"raw_affiliation_string":"China University of Mining and Technology (Beijing), Beijing, CO 100083, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101996950","display_name":"Lin Li","orcid":"https://orcid.org/0000-0002-0298-2867"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Li","raw_affiliation_strings":["State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources (North China Electric Power University), Beijing, CO 102206, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources (North China Electric Power University), Beijing, CO 102206, China","institution_ids":["https://openalex.org/I153473198"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5011535263"],"corresponding_institution_ids":["https://openalex.org/I25757504"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1699,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.45925509,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"9","issue":null,"first_page":"134289","last_page":"134297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10822","display_name":"Acoustic Wave Phenomena Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10822","display_name":"Acoustic Wave Phenomena Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12206","display_name":"Vibration and Dynamic Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11254","display_name":"Fluid Dynamics and Vibration Analysis","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7236290574073792},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.7205935716629028},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7115293741226196},{"id":"https://openalex.org/keywords/residual-stress","display_name":"Residual stress","score":0.6692514419555664},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5754973888397217},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5605101585388184},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.48859626054763794},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.47200724482536316},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4276614189147949},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4154033958911896},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.41140666604042053},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37767916917800903},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.361580491065979},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33302539587020874},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.22803759574890137},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16413390636444092},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15072306990623474},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12084105610847473}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7236290574073792},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7205935716629028},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7115293741226196},{"id":"https://openalex.org/C37292000","wikidata":"https://www.wikidata.org/wiki/Q1257918","display_name":"Residual stress","level":2,"score":0.6692514419555664},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5754973888397217},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5605101585388184},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.48859626054763794},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.47200724482536316},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4276614189147949},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4154033958911896},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.41140666604042053},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37767916917800903},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.361580491065979},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33302539587020874},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.22803759574890137},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16413390636444092},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15072306990623474},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12084105610847473},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3116200","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3116200","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551881.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:66fc765bbc35412c8b6ff466db720724","is_oa":true,"landing_page_url":"https://doaj.org/article/66fc765bbc35412c8b6ff466db720724","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 134289-134297 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3116200","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3116200","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551881.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2376276132","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4812645614","display_name":null,"funder_award_id":"2020XJJD02","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G5011781041","display_name":null,"funder_award_id":"52007192","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8951484681","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3202990103.pdf","grobid_xml":"https://content.openalex.org/works/W3202990103.grobid-xml"},"referenced_works_count":8,"referenced_works":["https://openalex.org/W1972994751","https://openalex.org/W2028213916","https://openalex.org/W2038410099","https://openalex.org/W2115664928","https://openalex.org/W2122377004","https://openalex.org/W2467064899","https://openalex.org/W3048459454","https://openalex.org/W4213262406"],"related_works":["https://openalex.org/W4398198689","https://openalex.org/W2354365353","https://openalex.org/W2560215812","https://openalex.org/W3092159757","https://openalex.org/W1988437325","https://openalex.org/W2811287415","https://openalex.org/W2073261424","https://openalex.org/W2045245345","https://openalex.org/W2354835317","https://openalex.org/W205778126"],"abstract_inverted_index":{"In":[0,61,100],"recent":[1],"years,":[2],"the":[3,16,36,40,45,50,53,57,64,71,75,83,94,104,123,127,143,152,154,157,181],"serious":[4,178],"vibration":[5,41,182],"and":[6,42,82,122,142],"noise":[7,20,43],"problem":[8,18],"of":[9,19,39,44,52,74,97,106,109,130,147,160,183],"high":[10,23],"voltage":[11,24],"filter":[12,46,79,98,161,184],"capacitor":[13,80,185],"has":[14,134,175],"become":[15],"primary":[17],"reduction":[21],"in":[22,78],"direct":[25],"current":[26,31],"(HVDC)":[27],"converter":[28],"station.":[29],"The":[30,163],"research":[32],"mainly":[33],"focuses":[34],"on":[35,56,93,111,138,156,180],"experimental":[37,65],"measurement":[38,84],"capacitor,":[47],"without":[48],"considering":[49],"influence":[51,105,137],"residual":[54,72,91,117,132,148,165],"charge":[55,73,110,118,133,149,166],"dielectric":[58,76,95,112,139,158,171],"interface":[59,113,140,172],"stress.":[60],"this":[62],"paper,":[63],"platform":[66],"is":[67],"built":[68],"for":[69],"measuring":[70],"film":[77],"component,":[81],"results":[85,124],"show":[86,125],"that":[87,126],"there":[88],"are":[89,120],"non-uniform":[90],"charges":[92],"surface":[96,131,159],"capacitor.":[99,162],"order":[101],"to":[102,169],"study":[103],"uneven":[107,128,145],"distribution":[108,129,146],"stress,":[114,141,173],"12":[115],"different":[116],"distributions":[119],"designed,":[121],"a":[135,176],"great":[136],"higher":[144],"can":[150,167],"cause":[151],"larger":[153,170],"stress":[155],"negative":[164],"lead":[168],"which":[174],"more":[177],"impact":[179],"component.":[186]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-04-13T07:58:08.660418","created_date":"2025-10-10T00:00:00"}