{"id":"https://openalex.org/W3201865557","doi":"https://doi.org/10.1109/access.2021.3116144","title":"Impact of Window Penetration Loss on Building Entry Loss From 3.5 to 24 GHz","display_name":"Impact of Window Penetration Loss on Building Entry Loss From 3.5 to 24 GHz","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3201865557","doi":"https://doi.org/10.1109/access.2021.3116144","mag":"3201865557"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3116144","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3116144","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09552001.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09552001.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065738464","display_name":"Young Chul Lee","orcid":"https://orcid.org/0000-0002-6570-5357"},"institutions":[{"id":"https://openalex.org/I185573737","display_name":"Mokpo National Maritime University","ror":"https://ror.org/023jsyh61","country_code":"KR","type":"education","lineage":["https://openalex.org/I185573737"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Young Chul Lee","raw_affiliation_strings":["Division of Marine Mechatronics, Mokpo National Maritime University (MMU), Mokpo, Rep. of Korea. (e-mail: rfleeyc@gmail.com)","Division of Marine Mechatronics, Mokpo National Maritime University (MMU), Mokpo, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Division of Marine Mechatronics, Mokpo National Maritime University (MMU), Mokpo, Rep. of Korea. (e-mail: rfleeyc@gmail.com)","institution_ids":["https://openalex.org/I185573737"]},{"raw_affiliation_string":"Division of Marine Mechatronics, Mokpo National Maritime University (MMU), Mokpo, Rep. of Korea","institution_ids":["https://openalex.org/I185573737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048532210","display_name":"Soon\u2010Soo Oh","orcid":"https://orcid.org/0000-0003-2913-4654"},"institutions":[{"id":"https://openalex.org/I199143407","display_name":"Sunchon National University","ror":"https://ror.org/043jqrs76","country_code":"KR","type":"education","lineage":["https://openalex.org/I199143407"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soon-Soo Oh","raw_affiliation_strings":["Division of Electrical and Electronics Engineering, Sunchon National University, Sunchon, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Division of Electrical and Electronics Engineering, Sunchon National University, Sunchon, Rep. of Korea","institution_ids":["https://openalex.org/I199143407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052258710","display_name":"Chul Woo Byeon","orcid":"https://orcid.org/0000-0002-1961-9861"},"institutions":[{"id":"https://openalex.org/I77079311","display_name":"Wonkwang University","ror":"https://ror.org/006776986","country_code":"KR","type":"education","lineage":["https://openalex.org/I77079311"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chul Woo Byeon","raw_affiliation_strings":["Department of Electronic Engineering, Wonkwang University, Iksan, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Wonkwang University, Iksan, Rep. of Korea","institution_ids":["https://openalex.org/I77079311"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008074651","display_name":"Khairunnisa Aziding","orcid":"https://orcid.org/0000-0003-2758-3528"},"institutions":[{"id":"https://openalex.org/I185573737","display_name":"Mokpo National Maritime University","ror":"https://ror.org/023jsyh61","country_code":"KR","type":"education","lineage":["https://openalex.org/I185573737"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Khairunnisa Aziding","raw_affiliation_strings":["Division of Marine Mechatronics, Mokpo National Maritime University (MMU), Mokpo, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Division of Marine Mechatronics, Mokpo National Maritime University (MMU), Mokpo, Rep. of Korea","institution_ids":["https://openalex.org/I185573737"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053249562","display_name":"Byung\u2010Lok Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I152238500","display_name":"Chosun University","ror":"https://ror.org/01zt9a375","country_code":"KR","type":"education","lineage":["https://openalex.org/I152238500"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byung-Lok Cho","raw_affiliation_strings":["Department of Electronic Engineering, Chosun University, Gwangju, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Chosun University, Gwangju, Rep. of Korea","institution_ids":["https://openalex.org/I152238500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5065738464"],"corresponding_institution_ids":["https://openalex.org/I185573737"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.1122,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.77519903,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"9","issue":null,"first_page":"138571","last_page":"138579"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10936","display_name":"Millimeter-Wave Propagation and Modeling","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10936","display_name":"Millimeter-Wave Propagation and Modeling","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12146","display_name":"Power Line Communications and Noise","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10148","display_name":"Advanced MIMO Systems Optimization","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/facade","display_name":"Facade","score":0.7355928421020508},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.6694551706314087},{"id":"https://openalex.org/keywords/penetration","display_name":"Penetration (warfare)","score":0.6567522287368774},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5964586138725281},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5109447836875916},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5019748210906982},{"id":"https://openalex.org/keywords/dielectric-loss","display_name":"Dielectric loss","score":0.47534748911857605},{"id":"https://openalex.org/keywords/frequency-dependence","display_name":"Frequency dependence","score":0.47294044494628906},{"id":"https://openalex.org/keywords/oscillation","display_name":"Oscillation (cell signaling)","score":0.4646771550178528},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.41953951120376587},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.25470662117004395},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.23078429698944092},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21920573711395264},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18590068817138672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1642369031906128},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1572757065296173},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.07626166939735413}],"concepts":[{"id":"https://openalex.org/C2780113678","wikidata":"https://www.wikidata.org/wiki/Q183061","display_name":"Facade","level":2,"score":0.7355928421020508},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.6694551706314087},{"id":"https://openalex.org/C80107235","wikidata":"https://www.wikidata.org/wiki/Q7162625","display_name":"Penetration (warfare)","level":2,"score":0.6567522287368774},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5964586138725281},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5109447836875916},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5019748210906982},{"id":"https://openalex.org/C91066073","wikidata":"https://www.wikidata.org/wiki/Q1417868","display_name":"Dielectric loss","level":3,"score":0.47534748911857605},{"id":"https://openalex.org/C3018695096","wikidata":"https://www.wikidata.org/wiki/Q11652","display_name":"Frequency dependence","level":2,"score":0.47294044494628906},{"id":"https://openalex.org/C2778439541","wikidata":"https://www.wikidata.org/wiki/Q7106412","display_name":"Oscillation (cell signaling)","level":2,"score":0.4646771550178528},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.41953951120376587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25470662117004395},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.23078429698944092},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21920573711395264},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18590068817138672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1642369031906128},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1572757065296173},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.07626166939735413},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3116144","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3116144","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09552001.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:aab0d11877774290ad5e9bc91e30d1cb","is_oa":true,"landing_page_url":"https://doaj.org/article/aab0d11877774290ad5e9bc91e30d1cb","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 138571-138579 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3116144","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3116144","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09552001.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.8199999928474426}],"awards":[{"id":"https://openalex.org/G520216706","display_name":null,"funder_award_id":"2018-0-01439","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"},{"id":"https://openalex.org/G5844839368","display_name":null,"funder_award_id":"2018-0-01439","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"}],"funders":[{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3201865557.pdf","grobid_xml":"https://content.openalex.org/works/W3201865557.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1502512540","https://openalex.org/W1520363192","https://openalex.org/W1977481147","https://openalex.org/W2023452992","https://openalex.org/W2065563536","https://openalex.org/W2077836130","https://openalex.org/W2108125356","https://openalex.org/W2108437897","https://openalex.org/W2119108698","https://openalex.org/W2127923284","https://openalex.org/W2557773670","https://openalex.org/W2580323374","https://openalex.org/W2586087788","https://openalex.org/W2727455986","https://openalex.org/W2900810752","https://openalex.org/W2963894564","https://openalex.org/W2973031077","https://openalex.org/W6629938737","https://openalex.org/W6732556802","https://openalex.org/W6768365003"],"related_works":["https://openalex.org/W194964019","https://openalex.org/W2027448362","https://openalex.org/W2261089677","https://openalex.org/W2101010475","https://openalex.org/W2096843629","https://openalex.org/W1943978607","https://openalex.org/W2186886946","https://openalex.org/W2187581520","https://openalex.org/W59371441","https://openalex.org/W2027711067"],"abstract_inverted_index":{"We":[0],"investigated":[1],"the":[2,10,47,54,61,65,78,96,100,111,114,117,136,155,159,163,172],"impact":[3],"of":[4,13,26,64,81,113,154,162,175],"window":[5,35,166],"penetration":[6],"loss":[7,16],"(WinPL)":[8],"on":[9],"frequency":[11,55,79,173],"dependence":[12,80,174],"building":[14,87,115],"entry":[15],"(BEL)":[17],"from":[18,110,144],"3.5":[19],"to":[20,53,60,76,92,116,135,171],"24":[21],"GHz.":[22],"The":[23],"WinPL":[24,98,160],"characteristics":[25,50,161],"an":[27],"ideal":[28],"double-glazed":[29,34,89,165],"glass":[30],"and":[31,38,42,121,123],"a":[32,84,103,124,168],"real":[33],"were":[36,74,167],"simulated":[37],"measured":[39],"on-site,":[40],"respectively,":[41],"both":[43],"results":[44],"showed":[45,149],"almost":[46],"same":[48],"oscillatory":[49],"with":[51,88],"respect":[52],"changes":[56],"that":[57],"occurred":[58],"due":[59],"impedance":[62],"oscillation":[63],"double":[66],"glass-like":[67],"multilayer":[68],"dielectrics.":[69],"Two":[70,138],"BEL":[71,82,148],"measurement":[72,145],"scenarios":[73],"performed":[75],"analyze":[77],"in":[83,95],"traditional":[85],"office":[86],"windows":[90,120,133],"identical":[91],"those":[93],"analyzed":[94],"on-site":[97],"measurements;":[99],"experiments":[101],"included":[102],"complex":[104],"propagation":[105,126,156],"route":[106,127],"(the":[107,128],"first":[108],"scenario)":[109,130],"facade":[112],"corridors":[118],"through":[119,131],"offices":[122],"simple":[125],"second":[129],"only":[132],"lateral":[134],"building.":[137],"main":[139,169],"aspects":[140],"can":[141],"be":[142],"observed":[143],"results.":[146],"First,":[147],"strong":[150],"frequency-dependent":[151],"behavior":[152],"regardless":[153],"route.":[157],"Second,":[158],"outer":[164],"contributor":[170],"BEL.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":9},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-14T08:43:22.919905","created_date":"2025-10-10T00:00:00"}