{"id":"https://openalex.org/W3204138030","doi":"https://doi.org/10.1109/access.2021.3115512","title":"Series DC Arc Fault Detection Using Machine Learning Algorithms","display_name":"Series DC Arc Fault Detection Using Machine Learning Algorithms","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3204138030","doi":"https://doi.org/10.1109/access.2021.3115512","mag":"3204138030"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3115512","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3115512","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09548085.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09548085.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006237142","display_name":"Hoang-Long Dang","orcid":"https://orcid.org/0000-0002-1957-7307"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoang-Long Dang","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea"],"raw_orcid":"https://orcid.org/0000-0002-1957-7307","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101575271","display_name":"Jae-Chang Kim","orcid":"https://orcid.org/0000-0002-0645-1414"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaechang Kim","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea"],"raw_orcid":"https://orcid.org/0000-0002-0645-1414","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028771646","display_name":"Sangshin Kwak","orcid":"https://orcid.org/0000-0002-2890-906X"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sangshin Kwak","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea. (e-mail: sskwak@cau.ac.kr)","Department of Electrical and Computer Engineering, Mississipi State University, MS 39762, US","School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea"],"raw_orcid":"https://orcid.org/0000-0002-2890-906X","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea. (e-mail: sskwak@cau.ac.kr)","institution_ids":["https://openalex.org/I67900169"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Mississipi State University, MS 39762, US","institution_ids":[]},{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul, Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054845392","display_name":"Seungdeog Choi","orcid":"https://orcid.org/0000-0002-7549-6093"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Seungdeog Choi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Mississipi State University, MS 39762, US"],"raw_orcid":"https://orcid.org/0000-0002-7549-6093","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Mississipi State University, MS 39762, US","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5028771646"],"corresponding_institution_ids":["https://openalex.org/I67900169"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":4.7801,"has_fulltext":true,"cited_by_count":75,"citation_normalized_percentile":{"value":0.95692555,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"9","issue":null,"first_page":"133346","last_page":"133364"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10809","display_name":"Occupational Health and Safety Research","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.7087739109992981},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.6502215266227722},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6388838887214661},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.6251384615898132},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6226117014884949},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6202840805053711},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5445429086685181},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5171815156936646},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.4737837314605713},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.33128345012664795},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.28212761878967285},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24380189180374146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19534125924110413},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19042286276817322},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18873366713523865},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.1065329909324646}],"concepts":[{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.7087739109992981},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.6502215266227722},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6388838887214661},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.6251384615898132},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6226117014884949},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6202840805053711},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5445429086685181},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5171815156936646},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.4737837314605713},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.33128345012664795},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.28212761878967285},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24380189180374146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19534125924110413},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19042286276817322},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18873366713523865},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.1065329909324646},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3115512","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3115512","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09548085.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:95a58cf5410746469291043df98e0483","is_oa":true,"landing_page_url":"https://doaj.org/article/95a58cf5410746469291043df98e0483","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 133346-133364 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3115512","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3115512","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09548085.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.4399999976158142}],"awards":[{"id":"https://openalex.org/G3878890785","display_name":null,"funder_award_id":"R21XA01-3","funder_id":"https://openalex.org/F4320326258","funder_display_name":"Korea Electric Power Corporation"},{"id":"https://openalex.org/G7912793175","display_name":null,"funder_award_id":"2020R1A2C1013413","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G8302083958","display_name":null,"funder_award_id":"2020R1A2C1013413","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G8538822549","display_name":null,"funder_award_id":"(2020R1A2C1013413)","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320326258","display_name":"Korea Electric Power Corporation","ror":"https://ror.org/04fperw70"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3204138030.pdf","grobid_xml":"https://content.openalex.org/works/W3204138030.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W1524050595","https://openalex.org/W1594031697","https://openalex.org/W1625504505","https://openalex.org/W1982663385","https://openalex.org/W1987671839","https://openalex.org/W1987860361","https://openalex.org/W1998064754","https://openalex.org/W2004365334","https://openalex.org/W2051193921","https://openalex.org/W2074151585","https://openalex.org/W2087347434","https://openalex.org/W2101746473","https://openalex.org/W2122111042","https://openalex.org/W2134535784","https://openalex.org/W2155198820","https://openalex.org/W2172373769","https://openalex.org/W2323852790","https://openalex.org/W2341973567","https://openalex.org/W2557087646","https://openalex.org/W2557908743","https://openalex.org/W2562762876","https://openalex.org/W2594940494","https://openalex.org/W2745762825","https://openalex.org/W2765462193","https://openalex.org/W2800598202","https://openalex.org/W2894598866","https://openalex.org/W2899914588","https://openalex.org/W2911964244","https://openalex.org/W2926172260","https://openalex.org/W2947181259","https://openalex.org/W2968579687","https://openalex.org/W3003864893","https://openalex.org/W3080240607","https://openalex.org/W3104597256","https://openalex.org/W3115225421","https://openalex.org/W3181770522","https://openalex.org/W6636859864","https://openalex.org/W6685326989","https://openalex.org/W6788197602"],"related_works":["https://openalex.org/W2798569283","https://openalex.org/W2137780917","https://openalex.org/W4361855252","https://openalex.org/W1982460678","https://openalex.org/W2357784726","https://openalex.org/W4388647533","https://openalex.org/W2390695630","https://openalex.org/W2808351707","https://openalex.org/W2320386705","https://openalex.org/W2997575716"],"abstract_inverted_index":{"The":[0],"wide":[1],"variety":[2],"of":[3,48,54,66,90,125,152,164],"arc":[4,14,22,51,84,114,172,182],"faults":[5,23,85,115],"induced":[6],"by":[7],"different":[8,64],"load":[9],"types":[10,65],"renders":[11],"residential":[12],"series":[13,113],"fault":[15,173,183],"detection":[16,110,184,187],"complicated":[17],"and":[18,28,58,69,93,100,122,136,146,148,162,167,185],"challenging.":[19],"Series":[20],"dc":[21],"could":[24,86],"cause":[25,87],"fire":[26],"accidents":[27],"adversely":[29],"affect":[30],"power":[31,40,67,91,141],"systems":[32,92,118],"if":[33],"not":[34,77],"promptly":[35],"detected.":[36],"However,":[37],"in":[38,116],"practical":[39],"systems,":[41],"they":[42,81],"are":[43],"difficult":[44],"to":[45,96,98,107],"detect":[46],"because":[47],"a":[49,55,109],"low":[50],"current,":[52],"absence":[53],"zero-crossing":[56],"period,":[57],"various":[59],"abnormal":[60],"behavior":[61],"based":[62],"on":[63],"loads":[68,138],"controllers.":[70],"In":[71,128],"particular,":[72],"conventional":[73],"protection":[74],"fuses":[75],"may":[76],"be":[78],"activated":[79],"when":[80],"occur.":[82],"Undetected":[83],"false":[88],"operation":[89,124],"potentially":[94],"lead":[95],"damage":[97],"property":[99],"human":[101],"casualties.":[102],"Therefore,":[103],"it":[104],"is":[105],"imperative":[106],"develop":[108],"system":[111],"for":[112,119,171,181],"DC":[117],"the":[120,153,165],"reliable":[121],"efficient":[123],"such":[126,139],"systems.":[127],"this":[129],"study,":[130],"several":[131],"typical":[132],"loads,":[133,143],"especially":[134],"nonlinear":[135],"complex":[137],"as":[140],"electronic":[142],"were":[144,179,189],"chosen":[145,170],"analyzed,":[147],"five":[149],"time-domain":[150],"parameters":[151],"current\u2014average":[154],"value,":[155,157,159,161],"median":[156],"variance":[158],"RMS":[160],"distance":[163],"maximum":[166],"minimum":[168],"values\u2014were":[169],"detection.":[174],"Various":[175],"machine":[176],"learning":[177],"algorithms":[178],"used":[180],"their":[186],"accuracies":[188],"compared.":[190]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":21},{"year":2024,"cited_by_count":18},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":14},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-12T08:23:45.883708","created_date":"2025-10-10T00:00:00"}