{"id":"https://openalex.org/W3201354864","doi":"https://doi.org/10.1109/access.2021.3114408","title":"Breaking the Limits in Ternary Logic: An Ultra-Efficient Auto-Backup/Restore Nonvolatile Ternary Flip-Flop Using Negative Capacitance CNTFET Technology","display_name":"Breaking the Limits in Ternary Logic: An Ultra-Efficient Auto-Backup/Restore Nonvolatile Ternary Flip-Flop Using Negative Capacitance CNTFET Technology","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3201354864","doi":"https://doi.org/10.1109/access.2021.3114408","mag":"3201354864"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3114408","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3114408","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09543648.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09543648.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002663856","display_name":"Mohammad Hossein Moaiyeri","orcid":"https://orcid.org/0000-0001-9711-7923"},"institutions":[{"id":"https://openalex.org/I48379061","display_name":"Shahid Beheshti University","ror":"https://ror.org/0091vmj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I48379061"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Mohammad Hossein Moaiyeri","raw_affiliation_strings":["Faculty of Electrical Engineering, Shahid Beheshti University, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0001-9711-7923","affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Shahid Beheshti University, Tehran, Iran","institution_ids":["https://openalex.org/I48379061"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007231589","display_name":"Mohammad Khaleqi Qaleh Jooq","orcid":"https://orcid.org/0000-0002-8537-3521"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mohammad Khaleqi Qaleh Jooq","raw_affiliation_strings":["Nanotechnology and Quantum Computing Lab, Shahid Beheshti Univeristy, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0002-8537-3521","affiliations":[{"raw_affiliation_string":"Nanotechnology and Quantum Computing Lab, Shahid Beheshti Univeristy, Tehran, Iran","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047862892","display_name":"AlaaDdin Al-Shidaifat","orcid":"https://orcid.org/0000-0003-4406-4543"},"institutions":[{"id":"https://openalex.org/I104338594","display_name":"Inje University","ror":"https://ror.org/04xqwq985","country_code":"KR","type":"education","lineage":["https://openalex.org/I104338594"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Alaaddin Al-Shidaifat","raw_affiliation_strings":["Department of Nanoscience and Engineering, Centre for Nano Manufacturing, Inje University, Gimhae 50834, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4406-4543","affiliations":[{"raw_affiliation_string":"Department of Nanoscience and Engineering, Centre for Nano Manufacturing, Inje University, Gimhae 50834, South Korea","institution_ids":["https://openalex.org/I104338594"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064542939","display_name":"Hanjung Song","orcid":"https://orcid.org/0000-0001-5911-4529"},"institutions":[{"id":"https://openalex.org/I104338594","display_name":"Inje University","ror":"https://ror.org/04xqwq985","country_code":"KR","type":"education","lineage":["https://openalex.org/I104338594"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hanjung Song","raw_affiliation_strings":["Department of Nanoscience and Engineering, Centre for Nano Manufacturing, Inje University, Gimhae 50834, South Korea. (e-mail: hjsong@inje.ac.kr)","Department of Nanoscience and Engineering, Centre for Nano Manufacturing, Inje University, Gimhae 50834, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5911-4529","affiliations":[{"raw_affiliation_string":"Department of Nanoscience and Engineering, Centre for Nano Manufacturing, Inje University, Gimhae 50834, South Korea. (e-mail: hjsong@inje.ac.kr)","institution_ids":["https://openalex.org/I104338594"]},{"raw_affiliation_string":"Department of Nanoscience and Engineering, Centre for Nano Manufacturing, Inje University, Gimhae 50834, South Korea","institution_ids":["https://openalex.org/I104338594"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5002663856"],"corresponding_institution_ids":["https://openalex.org/I48379061"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.3219,"has_fulltext":true,"cited_by_count":22,"citation_normalized_percentile":{"value":0.80354123,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"9","issue":null,"first_page":"132641","last_page":"132651"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ternary-operation","display_name":"Ternary operation","score":0.7464696168899536},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6052042245864868},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5638414621353149},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5321924686431885},{"id":"https://openalex.org/keywords/backup","display_name":"Backup","score":0.4749167859554291},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.4517672061920166},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.44176754355430603},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43340927362442017},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3216767907142639},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2784822881221771},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.16810235381126404},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.11149027943611145},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11027905344963074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10904738306999207}],"concepts":[{"id":"https://openalex.org/C64452783","wikidata":"https://www.wikidata.org/wiki/Q1524945","display_name":"Ternary operation","level":2,"score":0.7464696168899536},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6052042245864868},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5638414621353149},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5321924686431885},{"id":"https://openalex.org/C2780945871","wikidata":"https://www.wikidata.org/wiki/Q194274","display_name":"Backup","level":2,"score":0.4749167859554291},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.4517672061920166},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.44176754355430603},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43340927362442017},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3216767907142639},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2784822881221771},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16810235381126404},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.11149027943611145},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11027905344963074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10904738306999207},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3114408","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3114408","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09543648.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:04c785b36b56402eb8ee551a0328b1eb","is_oa":true,"landing_page_url":"https://doaj.org/article/04c785b36b56402eb8ee551a0328b1eb","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 132641-132651 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3114408","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3114408","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09543648.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1196742322","display_name":null,"funder_award_id":"NRF-2019R1F1A1056937","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G7316579372","display_name":null,"funder_award_id":"NRF-2019R1F1A1056937","funder_id":"https://openalex.org/F4320322349","funder_display_name":"Ministry of Education, Science and Technology"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322349","display_name":"Ministry of Education, Science and Technology","ror":"https://ror.org/01p262204"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3201354864.pdf","grobid_xml":"https://content.openalex.org/works/W3201354864.grobid-xml"},"referenced_works_count":46,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1628672899","https://openalex.org/W2026804797","https://openalex.org/W2064535872","https://openalex.org/W2158012362","https://openalex.org/W2337712486","https://openalex.org/W2342750693","https://openalex.org/W2362493683","https://openalex.org/W2606867011","https://openalex.org/W2620977911","https://openalex.org/W2621205796","https://openalex.org/W2730326864","https://openalex.org/W2730425383","https://openalex.org/W2775382360","https://openalex.org/W2790390406","https://openalex.org/W2799745003","https://openalex.org/W2802361217","https://openalex.org/W2885743408","https://openalex.org/W2889470051","https://openalex.org/W2892868997","https://openalex.org/W2917031116","https://openalex.org/W2944277299","https://openalex.org/W2946765146","https://openalex.org/W2947141094","https://openalex.org/W2958071401","https://openalex.org/W2967022770","https://openalex.org/W2983292364","https://openalex.org/W2997089893","https://openalex.org/W2999719674","https://openalex.org/W3004931069","https://openalex.org/W3010986276","https://openalex.org/W3025571000","https://openalex.org/W3033545840","https://openalex.org/W3082793985","https://openalex.org/W3093672519","https://openalex.org/W3094204829","https://openalex.org/W3094483268","https://openalex.org/W3095380563","https://openalex.org/W3098560727","https://openalex.org/W3108766514","https://openalex.org/W3115650748","https://openalex.org/W3130733418","https://openalex.org/W3132591204","https://openalex.org/W3154835647","https://openalex.org/W3160218610","https://openalex.org/W6795221167"],"related_works":["https://openalex.org/W2955195711","https://openalex.org/W2354454611","https://openalex.org/W2993266126","https://openalex.org/W2392283887","https://openalex.org/W2351388597","https://openalex.org/W2939925694","https://openalex.org/W2829881200","https://openalex.org/W4241986464","https://openalex.org/W2184647741","https://openalex.org/W1985525502"],"abstract_inverted_index":{"Despite":[0],"the":[1,37,44,56,73,108,111,126,170,182],"advantages":[2],"of":[3,58,129],"ternary":[4,23,75,132,167,186,198],"logic,":[5],"it":[6],"has":[7],"suffered":[8],"from":[9,78],"excessive":[10],"transistor":[11,151],"count":[12],"and":[13,60,133,144,158,166,185,200],"limited":[14],"noise":[15,122,127,179],"margin.":[16],"This":[17,92],"work":[18],"proposes":[19],"an":[20,79,119],"ultra-efficient":[21,196],"nonvolatile":[22,87,104,197],"flip-flop":[24],"(FF)":[25],"based":[26],"on":[27],"negative":[28,38],"capacitance":[29],"carbon":[30],"nanotube":[31],"field-effect":[32],"transistors":[33,59],"(NC-CNTFETs).":[34],"By":[35],"harnessing":[36],"differential":[39],"resistance":[40],"effect":[41],"in":[42,102,150,155,161,194,202],"NC-CNTFETs,":[43],"proposed":[45,74,171,189],"design":[46,172],"is":[47,99],"similar":[48],"to":[49,94],"a":[50,64,69,100,174],"conventional":[51,131,183],"volatile":[52],"binary":[53,134,165,184],"FF":[54,76],"regarding":[55],"number":[57],"control":[61,90],"signals.":[62,91],"During":[63],"scheduled":[65],"power":[66,71,156],"gating":[67],"or":[68,89],"sudden":[70],"outage,":[72],"benefits":[77],"auto-backup/auto-restore":[80],"capability":[81],"without":[82],"employing":[83],"any":[84],"additional":[85,142],"transistors,":[86],"devices,":[88],"leads":[93],"zero":[95],"device":[96],"overhead,":[97],"which":[98],"breakthrough":[101],"designing":[103],"memory":[105],"circuits.":[106],"On":[107],"other":[109],"hand,":[110],"back-to-":[112],"back":[113],"slave":[114],"latch\u00e2\u0102\u0179s":[115],"hysteretic":[116],"behavior":[117],"provides":[118,147],"extraordinary":[120],"static":[121,178],"margin":[123,128,180],"that":[124,140],"transcends":[125],"both":[130],"latches.":[135],"The":[136],"simulation":[137],"results":[138],"indicate":[139],"eliminating":[141],"backup":[143],"restore":[145],"circuitries":[146],"43%":[148],"improvements":[149,154,160],"count,":[152],"59%":[153],"saving":[157],"98%":[159],"energy-saving":[162],"than":[163,181],"state-of-the-art":[164],"FFs.":[168,187],"Moreover,":[169],"presents":[173],"1.5":[175],"times":[176],"higher":[177],"Our":[188],"approach":[190],"opens":[191],"new":[192],"doors":[193],"realizing":[195],"circuits":[199],"systems":[201],"neuromorphic":[203],"applications":[204],"using":[205],"ferroelectric-based":[206],"transistors.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}
