{"id":"https://openalex.org/W3197819342","doi":"https://doi.org/10.1109/access.2021.3109561","title":"A Reference-Free Image Index to Simultaneously Quantify Infrared-Imaging Fixed-Pattern-Noise and Blur Artifacts","display_name":"A Reference-Free Image Index to Simultaneously Quantify Infrared-Imaging Fixed-Pattern-Noise and Blur Artifacts","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3197819342","doi":"https://doi.org/10.1109/access.2021.3109561","mag":"3197819342"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3109561","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3109561","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09527210.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09527210.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006551324","display_name":"Anselmo Jara","orcid":null},"institutions":[{"id":"https://openalex.org/I3124150290","display_name":"San Sebasti\u00e1n University","ror":"https://ror.org/04jrwm652","country_code":"CL","type":"education","lineage":["https://openalex.org/I3124150290"]}],"countries":["CL"],"is_corresponding":true,"raw_author_name":"Anselmo Jara","raw_affiliation_strings":["Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile. (e-mail: anselmo.pers1@gmail.com)","Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile"],"raw_orcid":"https://orcid.org/0000-0001-6076-5986","affiliations":[{"raw_affiliation_string":"Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile. (e-mail: anselmo.pers1@gmail.com)","institution_ids":["https://openalex.org/I3124150290"]},{"raw_affiliation_string":"Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile","institution_ids":["https://openalex.org/I3124150290"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005687938","display_name":"Guillermo Machuca","orcid":null},"institutions":[{"id":"https://openalex.org/I3124150290","display_name":"San Sebasti\u00e1n University","ror":"https://ror.org/04jrwm652","country_code":"CL","type":"education","lineage":["https://openalex.org/I3124150290"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Guillermo Machuca","raw_affiliation_strings":["Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile"],"raw_orcid":"https://orcid.org/0000-0002-6977-3453","affiliations":[{"raw_affiliation_string":"Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile","institution_ids":["https://openalex.org/I3124150290"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071248940","display_name":"Sergio Torres","orcid":"https://orcid.org/0000-0002-6193-9949"},"institutions":[{"id":"https://openalex.org/I172787465","display_name":"University of Concepci\u00f3n","ror":"https://ror.org/0460jpj73","country_code":"CL","type":"education","lineage":["https://openalex.org/I172787465"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Sergio N. Torres","raw_affiliation_strings":["Departamento de Ingenier\u00eda El\u00e9ctrica, Universidad de Concepci\u00f3n, Casilla, 160-C, Concepci\u00f3n, Chile"],"raw_orcid":"https://orcid.org/0000-0002-6193-9949","affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00eda El\u00e9ctrica, Universidad de Concepci\u00f3n, Casilla, 160-C, Concepci\u00f3n, Chile","institution_ids":["https://openalex.org/I172787465"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011712054","display_name":"Pablo Coelho","orcid":"https://orcid.org/0000-0002-7501-7785"},"institutions":[{"id":"https://openalex.org/I3124150290","display_name":"San Sebasti\u00e1n University","ror":"https://ror.org/04jrwm652","country_code":"CL","type":"education","lineage":["https://openalex.org/I3124150290"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Pablo A. Coelho","raw_affiliation_strings":["Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Facultad de Ingenier\u00eda y Tecnolog\u00eda, Universidad San Sebasti\u00e1n, Lientur 1457, 4080871 Concepci\u00f3n, Chile","institution_ids":["https://openalex.org/I3124150290"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028900904","display_name":"Francisco P\u00e9rez","orcid":"https://orcid.org/0000-0002-2390-2133"},"institutions":[{"id":"https://openalex.org/I172787465","display_name":"University of Concepci\u00f3n","ror":"https://ror.org/0460jpj73","country_code":"CL","type":"education","lineage":["https://openalex.org/I172787465"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Francisco Perez","raw_affiliation_strings":["Departamento de Ingenier\u00eda El\u00e9ctrica, Universidad de Concepci\u00f3n, Casilla, 160-C, Concepci\u00f3n, Chile"],"raw_orcid":"https://orcid.org/0000-0002-2390-2133","affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00eda El\u00e9ctrica, Universidad de Concepci\u00f3n, Casilla, 160-C, Concepci\u00f3n, Chile","institution_ids":["https://openalex.org/I172787465"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006551324"],"corresponding_institution_ids":["https://openalex.org/I3124150290"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":6.5687,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.9641844,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"9","issue":null,"first_page":"121593","last_page":"121607"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5879952907562256},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5863593220710754},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5774862766265869},{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"Fixed-pattern noise","score":0.5770110487937927},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5599526166915894},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.5252689123153687},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5172855854034424},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3400861322879791},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.2581453323364258},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.24579289555549622},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15631961822509766}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5879952907562256},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5863593220710754},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5774862766265869},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.5770110487937927},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5599526166915894},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.5252689123153687},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5172855854034424},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3400861322879791},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.2581453323364258},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.24579289555549622},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15631961822509766}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3109561","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3109561","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09527210.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:3b98d65746bc46db984e62f6294c9c08","is_oa":true,"landing_page_url":"https://doaj.org/article/3b98d65746bc46db984e62f6294c9c08","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 121593-121607 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3109561","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3109561","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09527210.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4996279976","display_name":null,"funder_award_id":"3210436","funder_id":"https://openalex.org/F4320338073","funder_display_name":"Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico"},{"id":"https://openalex.org/G836764214","display_name":null,"funder_award_id":"3200636","funder_id":"https://openalex.org/F4320338073","funder_display_name":"Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico"},{"id":"https://openalex.org/G8755120865","display_name":null,"funder_award_id":"1190241","funder_id":"https://openalex.org/F4320338073","funder_display_name":"Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico"}],"funders":[{"id":"https://openalex.org/F4320338073","display_name":"Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico","ror":"https://ror.org/02ap3w078"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3197819342.pdf","grobid_xml":"https://content.openalex.org/works/W3197819342.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1480525920","https://openalex.org/W1504060658","https://openalex.org/W1973207880","https://openalex.org/W2000764217","https://openalex.org/W2014024561","https://openalex.org/W2020209895","https://openalex.org/W2022371685","https://openalex.org/W2023597557","https://openalex.org/W2027272709","https://openalex.org/W2037243393","https://openalex.org/W2065303840","https://openalex.org/W2069411124","https://openalex.org/W2075488458","https://openalex.org/W2082978702","https://openalex.org/W2101083417","https://openalex.org/W2118526021","https://openalex.org/W2133665775","https://openalex.org/W2136604679","https://openalex.org/W2139597199","https://openalex.org/W2153582625","https://openalex.org/W2343362691","https://openalex.org/W2496284459","https://openalex.org/W2549096365","https://openalex.org/W2764329356","https://openalex.org/W2791713424","https://openalex.org/W2948126853","https://openalex.org/W2971622202","https://openalex.org/W3027290599","https://openalex.org/W3090141791","https://openalex.org/W4248931071"],"related_works":["https://openalex.org/W2092792189","https://openalex.org/W2587464365","https://openalex.org/W2047135621","https://openalex.org/W2989499094","https://openalex.org/W2126967845","https://openalex.org/W2374614594","https://openalex.org/W2781508476","https://openalex.org/W2391549584","https://openalex.org/W2143626203","https://openalex.org/W2177440210"],"abstract_inverted_index":{"A":[0],"reference-free":[1],"image":[2],"index":[3,19,47,79],"to":[4,32,56],"jointly":[5],"assess":[6],"infrared-imaging":[7,37],"fixed-pattern-noise":[8,38,61],"and":[9,39,60,73],"blur":[10,44,118],"artifacts":[11],"is":[12,20,49],"proposed":[13,18],"in":[14],"this":[15],"work.":[16],"The":[17,46,78],"based":[21],"on":[22,84],"tuned-spatial-domain":[23],"filtering,":[24],"which":[25],"works":[26],"by":[27,51],"combining":[28],"two":[29,52],"Laplace":[30],"operators":[31],"simultaneously":[33],"quantify":[34],"the":[35,40,58],"global":[36,41],"or":[42],"local":[43],"artifacts.":[45],"effectiveness":[48],"demonstrated":[50],"task-based":[53],"image-quality":[54],"assessments":[55],"determine":[57],"focused":[59],"free":[62],"images":[63,90,99],"from":[64,105],"sequences":[65],"captured":[66],"with":[67,100,116],"both":[68],"a":[69,74],"mid-wave-infrared":[70],"microscope":[71],"system":[72,124],"long-wave-infrared":[75],"plenoptic":[76],"system.":[77],"quantitative":[80],"limits":[81],"are":[82],"shown":[83],"numerical":[85],"computations":[86],"over":[87],"synthetic":[88],"corrupted":[89],"as":[91,93],"well":[92,107],"real":[94,121],"black-body":[95],"radiator":[96],"calibrated":[97],"infrared":[98,109,122],"representative":[101],"simulated":[102],"fixed-pattern":[103],"noise,":[104],"six":[106],"known":[108],"focal":[110],"plane":[111],"arrays":[112],"transducer":[113],"technologies,":[114],"along":[115],"artificial":[117],"added":[119],"using":[120],"imaging":[123],"point":[125],"spread":[126],"functions.":[127]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}