{"id":"https://openalex.org/W3198759790","doi":"https://doi.org/10.1109/access.2021.3108048","title":"An Improved Multiphysics Analysis Model for the Short-Circuit Fault Ride-Through Capability Evaluation of the MMC Submodule Busbar","display_name":"An Improved Multiphysics Analysis Model for the Short-Circuit Fault Ride-Through Capability Evaluation of the MMC Submodule Busbar","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3198759790","doi":"https://doi.org/10.1109/access.2021.3108048","mag":"3198759790"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3108048","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3108048","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09523562.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09523562.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033576538","display_name":"Yang Cai","orcid":"https://orcid.org/0000-0001-8179-9771"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Cai","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8179-9771","affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"raw_affiliation_string":"Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046027742","display_name":"Wenyong Guo","orcid":"https://orcid.org/0000-0002-9461-7620"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenyong Guo","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9461-7620","affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"raw_affiliation_string":"Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054036171","display_name":"Wenju Sang","orcid":"https://orcid.org/0000-0002-4589-586X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenju Sang","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"raw_affiliation_string":"Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068765704","display_name":"Fancheng Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fancheng Guo","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"raw_affiliation_string":"Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110967578","display_name":"Chenyu Tian","orcid":"https://orcid.org/0009-0005-8798-0826"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenyu Tian","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"raw_affiliation_string":"Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108761509","display_name":"Suhang Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Suhang Yu","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"raw_affiliation_string":"Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3212,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.53107776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"9","issue":null,"first_page":"119090","last_page":"119099"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/busbar","display_name":"Busbar","score":0.9792698621749878},{"id":"https://openalex.org/keywords/multiphysics","display_name":"Multiphysics","score":0.8764961957931519},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5627771019935608},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5048011541366577},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4510079622268677},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.413756787776947},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3562226891517639},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32636579871177673},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2855462431907654},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.22178193926811218},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.19386205077171326},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.050089895725250244}],"concepts":[{"id":"https://openalex.org/C192690417","wikidata":"https://www.wikidata.org/wiki/Q1030817","display_name":"Busbar","level":2,"score":0.9792698621749878},{"id":"https://openalex.org/C46435376","wikidata":"https://www.wikidata.org/wiki/Q1829750","display_name":"Multiphysics","level":3,"score":0.8764961957931519},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5627771019935608},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5048011541366577},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4510079622268677},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.413756787776947},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3562226891517639},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32636579871177673},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2855462431907654},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.22178193926811218},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.19386205077171326},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.050089895725250244},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3108048","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3108048","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09523562.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:5acb1c1d573f47da86d77242234b3c82","is_oa":true,"landing_page_url":"https://doaj.org/article/5acb1c1d573f47da86d77242234b3c82","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 119090-119099 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3108048","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3108048","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09523562.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3073125746","display_name":null,"funder_award_id":"2018YFB0905801","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G3409996561","display_name":null,"funder_award_id":"51877206","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3473758766","display_name":null,"funder_award_id":"51721005","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G437493694","display_name":null,"funder_award_id":"51721005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3198759790.pdf","grobid_xml":"https://content.openalex.org/works/W3198759790.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W106389268","https://openalex.org/W1566393002","https://openalex.org/W1915388693","https://openalex.org/W1993263364","https://openalex.org/W2075851946","https://openalex.org/W2088495936","https://openalex.org/W2124498443","https://openalex.org/W2139885352","https://openalex.org/W2149308902","https://openalex.org/W2156481705","https://openalex.org/W2168776123","https://openalex.org/W2261573658","https://openalex.org/W2285120620","https://openalex.org/W2320858657","https://openalex.org/W2506412302","https://openalex.org/W2545715522","https://openalex.org/W2551541858","https://openalex.org/W2572742410","https://openalex.org/W2763451122","https://openalex.org/W2965943172","https://openalex.org/W2981251753","https://openalex.org/W2992705627","https://openalex.org/W3111167067","https://openalex.org/W3164019307"],"related_works":["https://openalex.org/W2084426624","https://openalex.org/W3026055904","https://openalex.org/W2543161328","https://openalex.org/W2152695672","https://openalex.org/W2981251753","https://openalex.org/W2552114966","https://openalex.org/W2150715922","https://openalex.org/W2390746671","https://openalex.org/W2360020075","https://openalex.org/W2973575255"],"abstract_inverted_index":{"The":[0,74,99,133,170,219],"short-circuit":[1,21,104,217,284],"fault":[2,6,22,91,119,220,232],"is":[3,36,43,76,85,109,115,225,248],"the":[4,9,12,20,30,33,40,46,55,63,68,72,77,81,90,95,103,107,111,118,123,126,137,141,147,151,160,165,168,174,178,200,208,211,216,223,231,235,254,266,269,283,287],"severest":[5],"that":[7,110,253,275],"threatens":[8],"reliability":[10,209],"of":[11,62,71,80,94,102,106,125,136,150,159,167,177,210,268,286],"modular":[13],"multilevel":[14],"converter":[15],"(MMC)":[16],"submodule":[17,97,213],"busbar.":[18,31,73,98,288],"When":[19],"occurs,":[23],"a":[24,50,129,154],"huge":[25],"overcurrent":[26],"will":[27,139],"flow":[28],"through":[29,222],"Since":[32],"discharge":[34,41,47],"time":[35],"very":[37,130],"short":[38,131],"and":[39,60,204,260,271],"current":[42,48,145,221,233,259],"too":[44],"large,":[45],"produces":[49],"strong":[51,155],"skin":[52],"effect":[53],"on":[54,173],"busbar,":[56,64],"resulting":[57],"in":[58,128,153,265,282],"overheating":[59],"deformation":[61,124,135,149,166,267],"which":[65,121,197,242],"may":[66],"cause":[67],"permanent":[69],"failure":[70,175],"busbar":[75,108,127,179,214,224,270],"key":[78,100,273],"component":[79],"MMC":[82,96,212],"submodule.":[83],"It":[84],"therefore":[86],"crucial":[87],"to":[88,277],"evaluate":[89],"ride-through":[92],"capability":[93],"feature":[101],"behavior":[105],"large":[112],"electromagnetic":[113,256],"force":[114,143,203,257],"induced":[116,144,258],"by":[117,146,227],"current,":[120],"causes":[122],"transient.":[132],"fast":[134,148],"conductor":[138,152,161],"generate":[140],"electromotive":[142,202],"magnetic":[156],"field.":[157],"Plasticity":[158],"also":[162],"significantly":[163],"influences":[164],"conductor.":[169],"existing":[171],"researches":[172],"mechanism":[176],"did":[180],"not":[181],"take":[182],"these":[183],"two":[184],"important":[185],"factors":[186,274],"into":[187,246,280],"account.":[188],"This":[189],"paper":[190],"proposes":[191],"an":[192,237],"improved":[193,238],"multiphysics":[194,239],"analysis":[195,285],"model":[196],"considers":[198],"both":[199,244],"dynamic":[201,255],"plasticity":[205,261],"for":[206],"analyzing":[207,240],"under":[215],"fault.":[218],"derived":[226],"numerical":[228],"calculation.":[229],"Utilizing":[230],"as":[234],"input,":[236],"model,":[241],"takes":[243],"features":[245],"account":[247,281],"proposed.":[249],"Simulation":[250],"results":[251],"show":[252],"play":[262],"dominant":[263],"roles":[264],"are":[272],"need":[276],"be":[278],"taken":[279]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}