{"id":"https://openalex.org/W3188606965","doi":"https://doi.org/10.1109/access.2021.3103884","title":"Fabrication and Characterization of a Quantum Voltage Noise Source Chip for a Johnson Noise Thermometer","display_name":"Fabrication and Characterization of a Quantum Voltage Noise Source Chip for a Johnson Noise Thermometer","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3188606965","doi":"https://doi.org/10.1109/access.2021.3103884","mag":"3188606965"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3103884","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3103884","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09509531.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09509531.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080648585","display_name":"Yuan Zhong","orcid":"https://orcid.org/0000-0003-2581-4839"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuan Zhong","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103123640","display_name":"Kunli Zhou","orcid":"https://orcid.org/0000-0003-0312-5127"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kunli Zhou","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100657121","display_name":"Jinjin Li","orcid":"https://orcid.org/0000-0003-1465-1501"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinjin Li","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103077484","display_name":"Jifeng Qu","orcid":"https://orcid.org/0000-0002-2026-9184"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jifeng Qu","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060507450","display_name":"Wenhui Cao","orcid":"https://orcid.org/0000-0002-6240-2174"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhui Cao","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016001726","display_name":"Xueshen Wang","orcid":"https://orcid.org/0000-0001-7638-7000"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xueshen Wang","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081127676","display_name":"Zegang Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zegang Ni","raw_affiliation_strings":["College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060296437","display_name":"Qina Han","orcid":"https://orcid.org/0000-0002-5965-0564"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qina Han","raw_affiliation_strings":["School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100394526","display_name":"Mingyu Zhang","orcid":"https://orcid.org/0009-0004-6197-2353"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingyu Zhang","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091423434","display_name":"Qing Zhong","orcid":"https://orcid.org/0000-0001-8514-9581"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Zhong","raw_affiliation_strings":["Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Measurement Science, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5080648585"],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1011,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42785622,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"9","issue":null,"first_page":"113239","last_page":"113245"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10029","display_name":"Climate variability and models","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2306","display_name":"Global and Planetary Change"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.6038930416107178},{"id":"https://openalex.org/keywords/josephson-effect","display_name":"Josephson effect","score":0.5170943737030029},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.470891535282135},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.46598854660987854},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4375542998313904},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4331498146057129},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.42871496081352234},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.428203284740448},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4225632846355438},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4139365553855896},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3856276869773865},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36016416549682617},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34630680084228516},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.30643099546432495},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.260636568069458},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.23345094919204712},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.20434173941612244},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.19947436451911926},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16959062218666077},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1041315495967865}],"concepts":[{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.6038930416107178},{"id":"https://openalex.org/C12038964","wikidata":"https://www.wikidata.org/wiki/Q764228","display_name":"Josephson effect","level":3,"score":0.5170943737030029},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.470891535282135},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.46598854660987854},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4375542998313904},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4331498146057129},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.42871496081352234},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.428203284740448},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4225632846355438},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4139365553855896},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3856276869773865},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36016416549682617},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34630680084228516},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.30643099546432495},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.260636568069458},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.23345094919204712},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.20434173941612244},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.19947436451911926},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16959062218666077},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1041315495967865},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C54101563","wikidata":"https://www.wikidata.org/wiki/Q124131","display_name":"Superconductivity","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3103884","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3103884","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09509531.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a06662cf6d24476fac56ae046e429215","is_oa":true,"landing_page_url":"https://doaj.org/article/a06662cf6d24476fac56ae046e429215","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 113239-113245 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3103884","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3103884","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/09509531.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7799999713897705}],"awards":[{"id":"https://openalex.org/G1121271761","display_name":null,"funder_award_id":"Program","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1473626136","display_name":null,"funder_award_id":"61771441","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3085993365","display_name":null,"funder_award_id":"(Grant No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3530197069","display_name":null,"funder_award_id":"61971471","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5249178904","display_name":null,"funder_award_id":"Grant No. 6","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5521034041","display_name":null,"funder_award_id":"2018YFB2003401","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7726157001","display_name":null,"funder_award_id":"Grant No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8178865744","display_name":null,"funder_award_id":"XDC07010100","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"},{"id":"https://openalex.org/G8208342437","display_name":null,"funder_award_id":"1 and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8302317672","display_name":null,"funder_award_id":"6177144","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3188606965.pdf","grobid_xml":"https://content.openalex.org/works/W3188606965.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1609336370","https://openalex.org/W1968778486","https://openalex.org/W2036605565","https://openalex.org/W2038462420","https://openalex.org/W2044835563","https://openalex.org/W2047230044","https://openalex.org/W2050119997","https://openalex.org/W2057893961","https://openalex.org/W2090888886","https://openalex.org/W2129999714","https://openalex.org/W2135637883","https://openalex.org/W2295906197","https://openalex.org/W2621488256","https://openalex.org/W2624196110","https://openalex.org/W2722581998","https://openalex.org/W2731398032","https://openalex.org/W2756695806","https://openalex.org/W2899300695","https://openalex.org/W2905136437","https://openalex.org/W3041527269","https://openalex.org/W3102965169","https://openalex.org/W3108424339","https://openalex.org/W6738454836"],"related_works":["https://openalex.org/W2070810745","https://openalex.org/W2118931924","https://openalex.org/W2095110568","https://openalex.org/W1988257008","https://openalex.org/W4243333603","https://openalex.org/W2132302586","https://openalex.org/W2015133066","https://openalex.org/W4236509694","https://openalex.org/W3021392142","https://openalex.org/W587275553"],"abstract_inverted_index":{"A":[0,128],"Johnson":[1,14],"noise":[2,15,35,44],"thermometer":[3],"(JNT)":[4],"determines":[5],"the":[6,13,25,47,50,58,64,83,88,105,110,122,166,188,191],"thermodynamic":[7],"temperature":[8,199],"through":[9],"cross-correlation":[10,51],"measurement":[11],"of":[12,49,63,109,145,151,193],"in":[16,138,158],"a":[17,31,72,194],"sense":[18],"resistor":[19],"at":[20],"an":[21],"unknown":[22],"temperature.":[23],"In":[24,53],"quantum":[26,33,123],"voltage":[27,34],"calibrated":[28],"JNT":[29,196],"system,":[30],"superconductive":[32],"source":[36],"(QVNS)":[37],"is":[38,78,118,126,133,156,168],"required":[39],"to":[40,45,99,135,175],"produce":[41],"artificial":[42],"pseudo-random":[43],"calibrate":[46],"gain":[48],"electronics.":[52],"this":[54,81,139,159],"paper,":[55],"we":[56],"present":[57],"design,":[59,71],"fabrication,":[60],"and":[61,91,153,179],"characterization":[62],"QVNS":[65,116],"chip.":[66],"Compared":[67],"with":[68,152,182],"our":[69],"previous":[70],"new":[73],"straightforward":[74],"mirror":[75],"symmetric":[76],"layout":[77],"implemented.":[79],"For":[80],"layout,":[82],"coplanar":[84],"waveguides":[85],"(CPWs)":[86],"have":[87],"same":[89,106],"lengths":[90],"transmission":[92],"parameters.":[93],"Equal":[94],"pulse":[95],"magnitudes":[96],"are":[97],"delivered":[98],"each":[100],"Josephson":[101,147],"junction":[102,148],"array":[103],"under":[104],"output":[107],"settings":[108],"bipolar":[111],"pattern":[112],"generator.":[113],"The":[114,141,161,170],"modified":[115],"chip":[117,189],"thereby":[119],"enhanced":[120],"because":[121],"locking":[124],"range":[125],"enlarged.":[127],"copper":[129],"foil":[130],"shielding":[131,155,167],"package":[132],"used":[134],"eliminate":[136],"crosstalk":[137],"design.":[140],"first":[142],"spectral":[143,184],"comparison":[144],"two":[146],"(JJ)":[149],"arrays":[150],"without":[154],"presented":[157],"paper.":[160],"comparative":[162],"results":[163],"demonstrate":[164],"that":[165,187],"effective.":[169],"abovementioned":[171],"improvements":[172],"enable":[173],"us":[174],"synthesize":[176],"both":[177],"single":[178],"multitone":[180],"waveforms":[181],"good":[183],"results,":[185],"such":[186],"satisfies":[190],"requirement":[192],"QVNS-based":[195],"system":[197],"for":[198],"measurements.":[200]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}