{"id":"https://openalex.org/W3167237120","doi":"https://doi.org/10.1109/access.2021.3086852","title":"Modelling of Transmission Lines Inside Modern Integrated Semiconductor and Test Boards","display_name":"Modelling of Transmission Lines Inside Modern Integrated Semiconductor and Test Boards","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3167237120","doi":"https://doi.org/10.1109/access.2021.3086852","mag":"3167237120"},"language":"en","primary_location":{"id":"doi:10.1109/access.2021.3086852","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3086852","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09447718.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09447718.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090748942","display_name":"Mariusz Zubert","orcid":"https://orcid.org/0000-0001-7924-7724"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Mariusz Zubert","raw_affiliation_strings":["Lodz University of Technology, Lodz, Poland"],"raw_orcid":"https://orcid.org/0000-0001-7924-7724","affiliations":[{"raw_affiliation_string":"Lodz University of Technology, Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026728623","display_name":"Mariusz Jankowski","orcid":"https://orcid.org/0000-0002-6050-3975"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Mariusz Jankowski","raw_affiliation_strings":["Lodz University of Technology, Lodz, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lodz University of Technology, Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084804749","display_name":"Zbigniew Kulesza","orcid":"https://orcid.org/0000-0002-9521-0056"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Zbigniew Kulesza","raw_affiliation_strings":["Lodz University of Technology, Lodz, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lodz University of Technology, Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085564117","display_name":"Andrzej Napieralski","orcid":"https://orcid.org/0000-0002-3844-3435"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Andrzej Napieralski","raw_affiliation_strings":["Lodz University of Technology, Lodz, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lodz University of Technology, Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090748942"],"corresponding_institution_ids":["https://openalex.org/I188884621"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2034,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.50037407,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"9","issue":null,"first_page":"87182","last_page":"87195"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.7764576077461243},{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.726871132850647},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5722522139549255},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5588008165359497},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5271682143211365},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.49764493107795715},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.49665290117263794},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.49291396141052246},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.4717983603477478},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.4563170373439789},{"id":"https://openalex.org/keywords/data-transmission","display_name":"Data transmission","score":0.4312761127948761},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.349270224571228},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26760998368263245},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.17552399635314941},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12943923473358154},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.10113891959190369}],"concepts":[{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.7764576077461243},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.726871132850647},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5722522139549255},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5588008165359497},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5271682143211365},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.49764493107795715},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.49665290117263794},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.49291396141052246},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4717983603477478},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.4563170373439789},{"id":"https://openalex.org/C557945733","wikidata":"https://www.wikidata.org/wiki/Q389772","display_name":"Data transmission","level":2,"score":0.4312761127948761},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.349270224571228},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26760998368263245},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.17552399635314941},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12943923473358154},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.10113891959190369},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2021.3086852","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3086852","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09447718.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:cdc146478dd847138224a7098dcd6eca","is_oa":true,"landing_page_url":"https://doaj.org/article/cdc146478dd847138224a7098dcd6eca","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 9, Pp 87182-87195 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2021.3086852","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3086852","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09447718.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8096478809","display_name":null,"funder_award_id":"2013/11/B/ST7/01742","funder_id":"https://openalex.org/F4320322511","funder_display_name":"Narodowe Centrum Nauki"}],"funders":[{"id":"https://openalex.org/F4320313559","display_name":"CERN","ror":"https://ror.org/01ggx4157"},{"id":"https://openalex.org/F4320318271","display_name":"Uniwersytet Morski w Gdyni","ror":"https://ror.org/02vscf791"},{"id":"https://openalex.org/F4320322511","display_name":"Narodowe Centrum Nauki","ror":"https://ror.org/03ha2q922"},{"id":"https://openalex.org/F4320322637","display_name":"Politechnika Warszawska","ror":"https://ror.org/00y0xnp53"},{"id":"https://openalex.org/F4320322892","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73"},{"id":"https://openalex.org/F4320323344","display_name":"Uniwersytet \u0141\u00f3dzki","ror":"https://ror.org/05cq64r17"},{"id":"https://openalex.org/F4320323564","display_name":"Politechnika Wroc\u0142awska","ror":"https://ror.org/008fyn775"},{"id":"https://openalex.org/F4320326090","display_name":"Politechnika L\u00f3dzka","ror":"https://ror.org/00s8fpf52"},{"id":"https://openalex.org/F4320334759","display_name":"Deutsches Elektronen-Synchrotron","ror":"https://ror.org/01js2sh04"},{"id":"https://openalex.org/F4320337511","display_name":"High Energy Physics","ror":"https://ror.org/035m6g344"},{"id":"https://openalex.org/F4320338388","display_name":"Eurostars","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3167237120.pdf","grobid_xml":"https://content.openalex.org/works/W3167237120.grobid-xml"},"referenced_works_count":50,"referenced_works":["https://openalex.org/W88464132","https://openalex.org/W265328338","https://openalex.org/W282101752","https://openalex.org/W587166329","https://openalex.org/W587803156","https://openalex.org/W617400320","https://openalex.org/W636570934","https://openalex.org/W1549156645","https://openalex.org/W1551573418","https://openalex.org/W1567405173","https://openalex.org/W1570895503","https://openalex.org/W1573871457","https://openalex.org/W1971874715","https://openalex.org/W1975239984","https://openalex.org/W1990792968","https://openalex.org/W2002437598","https://openalex.org/W2003104867","https://openalex.org/W2026089033","https://openalex.org/W2054996043","https://openalex.org/W2055262629","https://openalex.org/W2074118220","https://openalex.org/W2075786475","https://openalex.org/W2086778233","https://openalex.org/W2090843874","https://openalex.org/W2094240247","https://openalex.org/W2098914003","https://openalex.org/W2102136583","https://openalex.org/W2121050321","https://openalex.org/W2121289955","https://openalex.org/W2130008794","https://openalex.org/W2132810501","https://openalex.org/W2142063750","https://openalex.org/W2143252690","https://openalex.org/W2150812866","https://openalex.org/W2160262052","https://openalex.org/W2166475097","https://openalex.org/W2485459335","https://openalex.org/W2490765418","https://openalex.org/W2494767302","https://openalex.org/W2505955814","https://openalex.org/W2596576789","https://openalex.org/W2903136240","https://openalex.org/W3107498333","https://openalex.org/W3135868493","https://openalex.org/W4212824459","https://openalex.org/W4233663611","https://openalex.org/W4242162644","https://openalex.org/W6609798844","https://openalex.org/W6651039141","https://openalex.org/W6785897820"],"related_works":["https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W4253468152","https://openalex.org/W2389426768","https://openalex.org/W4313519086","https://openalex.org/W2475977221","https://openalex.org/W3147987719","https://openalex.org/W2166691456","https://openalex.org/W2170618786","https://openalex.org/W2152074358"],"abstract_inverted_index":{"The":[0,53,66],"main":[1],"purpose":[2],"of":[3,16,33,88],"this":[4,81],"paper":[5,82],"is":[6,38,78],"to":[7,98],"present":[8],"the":[9,13,31,72,89],"methodology":[10],"for":[11],"calculating":[12],"electromagnetic":[14],"behaviour":[15],"real":[17],"integrated":[18],"circuit":[19],"(IC)":[20],"parts":[21],"using":[22,71],"a":[23,85],"no-mesh":[24],"local":[25],"Finite":[26],"Differential":[27],"Method":[28],"(FDM).":[29],"Furthermore,":[30],"comparison":[32],"computational":[34],"results":[35,55],"and":[36,61,103],"measurements":[37],"presented.":[39],"All":[40],"considerations":[41],"are":[42,69,101],"based":[43,83],"on":[44,84],"typical":[45],"long":[46],"transmission":[47],"lines":[48],"(TLs)":[49],"in":[50,59,80,105],"modern":[51],"ICs.":[52],"obtained":[54],"have":[56],"been":[57],"analysed":[58,104],"detail":[60],"compared":[62],"with":[63],"measured":[64],"values.":[65],"measurement":[67],"data":[68],"de-embedded":[70],"test":[73,93],"board":[74],"model.":[75],"This":[76],"problem":[77],"illustrated":[79],"practical":[86],"example":[87],"Multi-Conductor":[90],"Transmission":[91],"Lines":[92],"structure":[94],"whose":[95],"electrical":[96],"responses":[97],"various":[99],"excitations":[100],"presented":[102],"detail.":[106]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}